Abstract: A device monitor for RF and DC measurement. The device monitor comprises a plurality of test cells arranged substantially in line. The test cell comprises a device under test, an input pad, an output pad and at least two reference pads. The input pad is electrically connected to an input of the DUT. The output pad is electrically connected to an output of the DUT. At least one of the reference pads is electrically connected to the DUT to provide a reference level. The input pad, the output pad and the reference pads are arranged substantially in line and at least one of the reference pads is located between the input pad and the output pad.

Abstract: A generic embedded device (GED) and a mechanism for retrieving and transmitting information of various intelligent-maintenance (IM) applications are disclosed. The GED is an object-oriented and cross-platform device built in an embedded real-time operating system, and can be installed in various kinds of information equipment, and has a generic application interface for the future development of application modules. The present invention enables all kinds of information equipment to retrieve, collect, manage, and analyze equipment data for IM applications; and further to receive/transmit the IM-related equipment information wired or wireless from/to remote clients via communication agents through Internet/Intranet.