Abstract: A grating structure, a diffraction optical waveguide, and a display device are disclosed. The grating line of the grating structure has a cross-sectional profile with a narrow top and a wide bottom, wherein the cross-sectional profile comprises six feature points, and the six feature points respectively have coordinates (0, 0), (L2, H2), (L3, H3), (L4, H4), (L5, H5) and (L6, 0) in a cross section, and satisfy following relationships: Hdrop=min(H4,H5)?max(H3,H2)>50 nm; 0.1<(L5?L4)/(L3?L2); L3>0.34T; and 0.05T<L5?L4<0.32T. By controlling the parameters of these feature points, the cross-sectional profile can be adjusted, and thus significantly improving the optical effect (comprising diffraction efficiency and uniformity) that the grating structure can achieve, and at the same time increasing degrees of freedom in grating design and optical effect regulation.

Abstract: A diffraction optical waveguide, a grating structure, and a display device are disclosed. An arrangement period of a grating line of the grating structure is T and the grating line has a cross-sectional profile with a narrow top and a wide bottom. The cross-sectional profile includes five feature points, which respectively have coordinates (0, 0), (L2, H2), (L3, H3), (L4, H4), (L5, 0), and satisfy: 0.2T?L2<L3<L4?L5?T; L3?0.8T; L3?L2?0.1T; L4?0.8T; 0?H2??; 0.2??H3??; 0.6??H4?1.8?; max(H2, H3)?H4; ?0.6??H3?H2?0.6?, 0.6??H3+H2?1.8?; 0.5?/T?H3/L3?2?/T, where ? is a wavelength. According to an embodiment of the present disclosure, the cross-sectional profile can be adjusted by controlling parameters of the feature points, the optical effect is improved and degrees of freedom in design and regulation are increased.

Abstract: A rubbing mura detection device is provided, including an infrared imaging unit used to acquire an infrared thermogram of a surface of the substrate, on which the alignment film is provided; and a rubbing mura detection unit used to detect whether or not the alignment film has the rubbing mura in accordance with an infrared radiation brightness temperature distribution in the infrared thermogram.

Abstract: A turnover device, a substrate cell-assembling apparatus and a substrate cell-assembling method are provided. The turnover device comprises: a fixed support and a turnover platform connected with the fixed support by a first rotary shaft, the turnover platform having a first suction surface and a second suction surface which are oppositely arranged and are configured to suction a substrate; a second rotary shaft and a third rotary shaft, configured to respectively drive the first suction surface and the second suction surface to rotate in an in-plane direction, axial directions of the second rotary shaft and the third rotary shaft being basically perpendicular to that of the first rotary shaft. The turnover platform is configured to turn over the first suction surface and the second suction surface by the first rotary shaft.

Abstract: A rubbing mura detection device is provided, including an infrared imaging unit used to acquire an infrared thermogram of a surface of the substrate, on which the alignment film is provided; and a rubbing mura detection unit used to detect whether or not the alignment film has the rubbing mura in accordance with an infrared radiation brightness temperature distribution in the infrared thermogram.

Abstract: A turnover device, a substrate cell-assembling apparatus and a substrate cell-assembling method are provided. The turnover device comprises: a fixed support and a turnover platform connected with the fixed support by a first rotary shaft, the turnover platform having a first suction surface and a second suction surface which are oppositely arranged and are configured to suction a substrate; a second rotary shaft and a third rotary shaft, configured to respectively drive the first suction surface and the second suction surface to rotate in an in-plane direction, axial directions of the second rotary shaft and the third rotary shaft being basically perpendicular to that of the first rotary shaft. The turnover platform is configured to turn over the first suction surface and the second suction surface by the first rotary shaft.