Abstract: The present disclosure provides a positive-pressure-withstanding high-power flat evaporator, processing methods thereof and a flat loop heat pipe including the evaporator. The evaporator includes a housing, and reinforcing ribs and a capillary wick which are positioned inside the housing, and the arrangement of the reinforcing ribs can ensure that the strength of the whole evaporator is capable of withstanding positive pressure. The capillary wick is composed of four parts, namely, an evaporating wick, a heat insulating wick, a sealing wick and a transfer wick. Through the large permeability of the transfer wick, liquid supply with low flow resistance can be realized, the heat transfer capability of the loop heat pipe is greatly improved, and the problems of long liquid supply path and large flow resistance caused by a large-area evaporator are solved.

Abstract: Provided in embodiments of the present application are a method and apparatus for user registration and electronic device. The method includes: after obtaining a wake-up voice of a user each time, extracting and storing a first voiceprint feature corresponding to the wake-up voice; clustering the stored first voiceprint features to divide the stored first voiceprint features into at least one category, wherein, each of the at least one category includes at least one first voiceprint feature which belongs to the same user; assigning one category identifier to each category; storing each category identifier in correspondence to at least one first voiceprint feature corresponding to this category identifier to complete user registration. The embodiments of the present application can simplify the user operation and improve the user experience.

Abstract: A method for conducting optical measurement using a full Mueller matrix ellipsometer, which belongs to the technical field of optical measurements. The optical measurement method comprises: constructing an experimental optical path of a full Mueller matrix ellipsometer; conducting complete regression calibration on the full Mueller matrix ellipsometer; placing a sample to be measured on a sample platform, and obtaining an experimental Fourier coefficient of the sample to be measured; and according to the experimental Fourier coefficient of the sample to be measured, obtaining information about the sample to be measured.

Abstract: A hot-press sintering method to prepare a loop heat pipe evaporator includes: putting a shell of the evaporator into a mould, uniformly and compactly filling corresponding positions in the mould with material powders of an evaporation core, a heat insulation core and a transmission core, applying a pressure high enough to tightly fit the evaporation core and the transmission core to the shell at corresponding sintering temperatures of powder materials for the evaporation core and the transmission core, carrying out hot-press sintering for molding, carrying out cooling after metallurgically bonding the powder materials of the evaporation core and the transmission core, and carrying out demolding to obtain the loop heat pipe evaporator, wherein the mould is provided with corresponding structures shaped like steam channels on positions where the evaporation core is provided with the steam channels.

Abstract: Provided in embodiments of the present application are a method and apparatus for user registration and electronic device. The method includes: after obtaining a wake-up voice of a user each time, extracting and storing a first voiceprint feature corresponding to the wake-up voice; clustering the stored first voiceprint features to divide the stored first voiceprint features into at least one category, wherein, each of the at least one category includes at least one first voiceprint feature which belongs to the same user; assigning one category identifier to each category; storing each category identifier in correspondence to at least one first voiceprint feature corresponding to this category identifier to complete user registration. The embodiments of the present application can simplify the user operation and improve the user experience.

Abstract: The present disclosure provides a positive-pressure-withstanding high-power flat evaporator, processing methods thereof and a flat loop heat pipe including the evaporator. The evaporator includes a housing, and reinforcing ribs and a capillary wick which are positioned inside the housing, and the arrangement of the reinforcing ribs can ensure that the strength of the whole evaporator is capable of withstanding positive pressure. The capillary wick is composed of four parts, namely, an evaporating wick, a heat insulating wick, a sealing wick and a transfer wick. Through the large permeability of the transfer wick, liquid supply with low flow resistance can be realized, the heat transfer capability of the loop heat pipe is greatly improved, and the problems of long liquid supply path and large flow resistance caused by a large-area evaporator are solved.

Abstract: The present disclosure discloses a vapor chamber based on a flat plate loop heat pipe. The flat plate loop heat pipe composed of an evaporator, a reservoir and a gas/liquid line is pre-buried in an aluminum alloy plate, so as to form the vapor chamber based on the flat plate loop heat pipe. The evaporator of the flat plate loop heat pipe is arranged in a region, attached to a biggest heat source of a chip to be subjected to heat dissipation, on the vapor chamber, and the side, provided with a vapor channel, of the evaporator is attached to the biggest heat source.

Abstract: A hot-press sintering method to prepare a loop heat pipe evaporator includes: putting a shell of the evaporator into a mould, uniformly and compactly filling corresponding positions in the mould with material powders of an evaporation core, a heat insulation core and a transmission core, applying a pressure high enough to tightly fit the evaporation core and the transmission core to the shell at corresponding sintering temperatures of powder materials for the evaporation core and the transmission core, carrying out hot-press sintering for molding, carrying out cooling after metallurgically bonding the powder materials of the evaporation core and the transmission core, and carrying out demolding to obtain the loop heat pipe evaporator, wherein the mould is provided with corresponding structures shaped like steam channels on positions where the evaporation core is provided with the steam channels.

Abstract: A method for conducting optical measurement using a full Mueller matrix ellipsometer, which belongs to the technical field of optical measurements. The optical measurement method comprises: constructing an experimental optical path of a full Mueller matrix ellipsometer; conducting complete regression calibration on the full Mueller matrix ellipsometer; placing a sample to be measured on a sample platform, and obtaining an experimental Fourier coefficient of the sample to be measured; and according to the experimental Fourier coefficient of the sample to be measured, obtaining information about the sample to be measured.

Abstract: According to an aspect of an embodiment, a method may include measuring, based on interferometry, a film thickness of a surface film of a semiconductor wafer at a plurality of locations that are along a scanline of the wafer. The method may also include measuring, based on interferometry, a substrate thickness of a substrate of the semiconductor wafer at the plurality of locations. Moreover, the method may include measuring, based on an optical measurement technique, a curvature of the semiconductor wafer along the scanline. In addition, the method may include determining a stress of the surface film along the scanline based on the measured film thickness at the plurality of locations, based on the measured substrate thickness at the plurality of locations, and based on the measured curvature along the scanline.

Abstract: A kind of normal incidence broadband spectroscopic polarimeter which is easy to adjust the focus, has no chromatic aberration, maintains the polarization and has simple structure. The normal incidence broadband spectroscopic polarimeter can make the probe beam normal incidence and focus on the sample surface by using at least one flat reflector element to change propagation direction of the focused beam. Moreover, the normal incidence broadband spectroscopic polarimeter contains at least one polarizer as to measure the anisotropy or non-uniform samples, such as three-dimensional profile and material optical constants of thin films consisting of the periodic structure. An optical measurement system including the normal incidence broadband spectroscopic polarimeter is also provided.

Abstract: Disclosed is a normal-incidence broadband spectroscopic polarimeter containing reference beam, comprising a light source, a first reflecting unit, a first concentrating unit, a second concentrating unit, a polarizer, a first curved mirror, a first planar mirror, a second reflecting unit and a probing unit. Also disclosed is an optical measurement system, comprising the normal-incidence broadband spectroscopic polarimeter containing reference beam. The normal-incidence broadband spectroscopic polarimeter containing reference beam achieves an integral combination of the light beams after splitting, can maintain the polarization state of the light beams while increasing the light transmission efficiency, and has a low complexity.

Abstract: Disclosed is a normal-incidence broadband spectroscopic polarimeter containing reference beam, comprising a light source, a first reflecting unit, a first concentrating unit, a second concentrating unit, a polarizer, a first curved mirror, a first planar mirror, a second reflecting unit and a probing unit. Also disclosed is an optical measurement system, comprising the normal-incidence broadband spectroscopic polarimeter containing reference beam. The normal-incidence broadband spectroscopic polarimeter containing reference beam achieves an integral combination of the light beams after splitting, can maintain the polarization state of the light beams while increasing the light transmission efficiency, and has a low complexity.

Abstract: An oblique incidence broadband spectroscopic polarimeter which is easy to adjust the focus, achromatic, maintains the polarization and has simple structure is provided. It comprise at least one polarizer (P, A), at least one curved reflector element (OAP1, OAP2, OAP3, OAP4) and at least two flat reflector elements (M1, M2). By utilizing the flat reflector element, the oblique incidence broadband spectroscopic polarimeter can change the propagate direction of beam, and compensate the polarization changes caused by the reflective focusing unit, make the polarization of beam passed the polarizer unchanged when obliquely incident and focus on the sample surface. The oblique incidence broadband spectroscopic polarimeter can accurately measure the optical constants of sample material, film thickness, and/or the critical dimension (CD) properties or three-dimensional profile for analyze the periodic structure of the sample.

Abstract: An oblique incidence broadband spectroscopic polarimeter which is easy to adjust the focus, achromatic, maintains the polarization and has simple structure is provided. It comprise at least one polarizer (P, A), at least one curved reflector element (OAP1, OAP2, OAP3, OAP4) and at least two flat reflector elements (M1, M2). By utilizing the flat reflector element, the oblique incidence broadband spectroscopic polarimeter can change the propagate direction of beam, and compensate the polarization changes caused by the reflective focusing unit, make the polarization of beam passed the polarizer unchanged when obliquely incident and focus on the sample surface. The oblique incidence broadband spectroscopic polarimeter can accurately measure the optical constants of sample material, film thickness, and/or the critical dimension (CD) properties or three-dimensional profile for analyze the periodic structure of the sample.

Abstract: A kind of normal incidence broadband spectroscopic polarimeter which is easy to adjust the focus, has no chromatic aberration, maintains the polarization and has simple structure. The normal incidence broadband spectroscopic polarimeter can make the probe beam normal incidence and focus on the sample surface by using at least one flat reflector element to change propagation direction of the focused beam. Moreover, the normal incidence broadband spectroscopic polarimeter contains at least one polarizer as to measure the anisotropy or non-uniform samples, such as three-dimensional profile and material optical constants of thin films consisting of the periodic structure. An optical measurement system including the normal incidence broadband spectroscopic polarimeter is also provided.

Abstract: A method and apparatus for convolving spectroscopic data with certain phase information for practicing phase-compensated sensitivity-enhanced spectroscopy (PCSES). PCSES uses a beam of radiation in a polarization state PSp from a source emitting at a plurality of wavelengths, and places in the beam a compensator capable of altering polarization state PSp by applying a delimited phase shift ? between two orthogonal polarization axes of the radiation to restrict a finely-vibrating spectrum. A sample disposed in the beam after the compensator generates a response beam by reflection, transmission or even both. A polarization state PSa of the response beam is passed to a detector to determine a spectrum of the response beam. A first spectrum is collected when polarization states PSp, PSa and the compensator are in a first polarization-altering configuration and a second spectrum is collected when polarization states PSp, PSa and the compensator are in a second polarization-altering configuration.

Abstract: The refractive index, extinction coefficient, size and density of fluid suspended particles are simultaneously determined by combined transmittance and scattering measurements. The scattering measurements are preferably angle selective to obtain additional information about the scattered light. A charge-coupled device is employed for its high sensitivity to low light intensity in measurement of scattered light in combination with a photodiode array employed for its high signal to noise ratio, which is beneficial in transmittance measurement. The scattered light may be measured in an angle selective fashion by use of a motorized aperture that is concentrically positioned with respect to the impinging beam axis and moveable along the impinging beam axis. An ellipsoidal mirror collects the scattered light that passes through the motorized aperture and focuses the scattered light towards the charge-coupled device.

Abstract: A method and apparatus for convolving spectroscopic data with certain phase information for practicing phase-compensated sensitivity-enhanced spectroscopy (PCSES). PCSES uses a beam of radiation in a polarization state PSp from a source emitting at a plurality of wavelengths, and places in the beam a compensator capable of altering polarization state PSp by applying a delimited phase shift ? between two orthogonal polarization axes of the radiation to restrict a finely-vibrating spectrum. A sample disposed in the beam after the compensator generates a response beam by reflection, transmission or even both. A polarization state PSa of the response beam is passed to a detector to determine a spectrum of the response beam. A first spectrum is collected when polarization states PSp, PSa and the compensator are in a first polarization-altering configuration and a second spectrum is collected when polarization states PSp, PSa and the compensator are in a second polarization-altering configuration.

Abstract: Improved optical characterization is provided by organizing the optical modeling calculations such that incident radiation parameters (e.g., wavelength) are varied in the outermost loop of any modeling run. By completing calculations for all combinations of structure parameters at one wavelength before moving to the next wavelength, calculation efficiency can be greatly improved. In particular, with this approach it is not necessary to cache (or re-compute) intermediate results pertaining to different wavelengths, in contrast to conventional approaches. Further improvements in efficiency can be obtained by organizing reflectance calculations such that for any layer Ll, stored intermediate results pertaining to layers below Ll can be used to calculate optical response as parameters for Ll and layers above Ll are varied.