Abstract: An integrated circuit that equalizes delay across process corners. A delay equalizer circuit is used to adjust and maintain a relatively constant delay across different process corners. The delay equalizer circuit includes a process monitor and a delay compensator circuit coupled to the process monitor. The process monitor may output a compensating bias voltage for a pMOS transistor and a compensating bias voltage for an nMOS transistor. The compensating bias voltages may be used to regulate and maintain a relatively constant delay through the delay compensator circuit across varying process corners.

Abstract: A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.

Abstract: A circuit for determining a process corner for a CMOS device of an integrated circuit is disclosed. The circuit comprises a CMOS monitoring circuit comprising an NMOS transistor and a PMOS transistor of the integrated circuit; reference circuit comprising elements for generating a reference voltage for an NMOS transistor and a reference voltage for a PMOS transistor; a first comparator for comparing a voltage generated by the NMOS transistor monitored by the CMOS monitoring circuit with the reference voltage for a NMOS transistor; and a second comparator for comparing a voltage generated by the PMOS transistor monitored by the CMOS monitoring circuit with the reference voltage for a PMOS transistor. A method for determining a process corner for CMOS devices of an integrated circuit is also disclosed.

Abstract: A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.

Abstract: A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.

Abstract: An output circuit providing an adjustable output amplitude and common-mode voltage is described. The output circuit includes at least one driver circuit and a common-mode feedback circuit including a first replica circuit of the at least one driver circuit. The common-mode feedback circuit is coupled to receive a first bias and provide an output coupled to the at least one driver circuit. The output circuit may also include a current circuit having a configurable resistor and a second replica circuit of the at least one driver circuit. The current circuit may be coupled to receive a second bias and to provide an output coupled to the at least one driver circuit and the common-mode feedback circuit.