Patents by Inventor Guoping Zhou
Guoping Zhou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12022270Abstract: A preparation method for a micro-electromechanical systems (MEMS) microphone includes the steps of: providing a silicon substrate having a silicon surface; forming an enclosed cavity in the silicon substrate; forming a plurality of spaced apart acoustic holes in the silicon substrate, each acoustic hole having two openings, one of which communicating with the cavity and the other one located on the silicon surface; forming a sacrificial layer on the silicon substrate, which includes a first filling portion, a second filling portion and a shielding portion; forming a polysilicon layer on the shielding portion; forming a recess in the silicon substrate on the side away from the silicon surface; and removing the first filling portion, the second filling portion and part of the shielding portion so that the recess is brought into communication with the cavity to form a back chamber, and that the polysilicon layer, the remainder of the shielding portion and the silicon substrate together delimit a hollow chamber,Type: GrantFiled: May 26, 2020Date of Patent: June 25, 2024Assignee: CSMC TECHNOLOGIES FAB2 CO., LTD.Inventors: Jiale Su, Guoping Zhou, Xinwei Zhang, Changfeng Xia
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Patent number: 11671765Abstract: A Micro-Electro-Mechanical System (MEMS) device includes a substrate, and a first sacrificial layer, a first conductive film, a second sacrificial layer, and a second conductive film successively laminated on the substrate, the second sacrificial layer being provided with a cavity; and further includes an amplitude-limiting layer provided with a first through hole and an isolation layer provided with a second through hole. The amplitude-limiting layer is located between the first conductive film and the first sacrificial layer and the isolation layer is located between the amplitude-limiting layer and the first conductive film, and/or the amplitude-limiting layer is located on the second conductive film and the isolation layer is located between the amplitude-limiting layer and the second conductive film. The amplitude-limiting layer extends to a projection region of an opening of the cavity and is in a suspended state.Type: GrantFiled: April 30, 2020Date of Patent: June 6, 2023Assignee: CSMC TECHNOLOGIES FAB2 CO., LTD.Inventors: Yonggang Hu, Guoping Zhou, Changfeng Xia
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Publication number: 20220386052Abstract: A preparation method for a micro-electromechanical systems (MEMS) microphone includes the steps of: providing a silicon substrate having a silicon surface; forming an enclosed cavity in the silicon substrate; forming a plurality of spaced apart acoustic holes in the silicon substrate, each acoustic hole having two openings, one of which communicating with the cavity and the other one located on the silicon surface; forming a sacrificial layer on the silicon substrate, which includes a first filling portion, a second filling portion and a shielding portion; forming a polysilicon layer on the shielding portion; forming a recess in the silicon substrate on the side away from the silicon surface; and removing the first filling portion, the second filling portion and part of the shielding portion so that the recess is brought into communication with the cavity to form a back chamber, and that the polysilicon layer, the remainder of the shielding portion and the silicon substrate together delimit a hollow chamber,Type: ApplicationFiled: May 26, 2020Publication date: December 1, 2022Inventors: Jiale SU, Guoping ZHOU, Xinwei ZHANG, Changfeng XIA
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Publication number: 20220086571Abstract: A Micro-Electro-Mechanical System (MEMS) device includes a substrate, and a first sacrificial layer, a first conductive film, a second sacrificial layer, and a second conductive film successively laminated on the substrate, the second sacrificial layer being provided with a cavity; and further includes an amplitude-limiting layer provided with a first through hole and an isolation layer provided with a second through hole. The amplitude-limiting layer is located between the first conductive film and the first sacrificial layer and the isolation layer is located between the amplitude-limiting layer and the first conductive film, and/or the amplitude-limiting layer is located on the second conductive film and the isolation layer is located between the amplitude-limiting layer and the second conductive film. The amplitude-limiting layer extends to a projection region of an opening of the cavity and is in a suspended state.Type: ApplicationFiled: April 30, 2020Publication date: March 17, 2022Inventors: Yonggang HU, Guoping ZHOU, Changfeng XIA
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Publication number: 20200243342Abstract: A method of forming a cavity based on a deep trench erosion, comprising: providing a semiconductor substrate (200), and performing the deep trench erosion to the semiconductor substrate to form an array of a plurality of trenches (201) in the semiconductor substrate (200), a pitch (D1) between the outermost grooves in the array being greater than a pitch (D2) between the remaining trenches in the array; and preforming an annealing treatment to the semiconductor substrate (200) to form a cavity (202) in the semiconductor substrate (200).Type: ApplicationFiled: August 14, 2018Publication date: July 30, 2020Inventors: Jiale SU, Changfeng XIA, Guoping ZHOU, Xinwei ZHANG
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Patent number: 10077188Abstract: A method of manufacturing a MEMS chip includes: providing a silicon substrate layer, the silicon substrate layer comprising a front surface configured to perform a MEMS process and a rear surface opposite to the front surface; growing a first oxidation layer mainly made of SiO2 on the rear surface of the silicon substrate layer by performing a thermal oxidation process; and depositing a first thin film layer mainly made of silicon nitride on the first oxidation layer by performing a low pressure chemical vapor deposition process.Type: GrantFiled: January 13, 2017Date of Patent: September 18, 2018Assignee: CSMC TECHNOLOGIES FAB1 CO., LTD.Inventors: Dan Dai, Xinwei Zhang, Guoping Zhou, Changfeng Xia
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Patent number: 9975766Abstract: An MEMS-based method for manufacturing a sensor comprises the steps of: forming a shallow channel (120) and a support beam (140) on a front surface of a substrate (100); forming a first epitaxial layer (200) on the front surface of the substrate (100) to seal the shallow channel (120); forming a suspended mesh structure (160) below the first epitaxial layer (200); and forming a deep channel (180) at a position on a back surface of the substrate (100) corresponding to the shallow channel (120), so that the shallow channel (120) is in communication with the deep channel (180). In the Method of manufacturing a MEMS-based sensor, when a shallow channel is formed on a front surface, a support beam of a mass block is formed, so the etching of a channel is easier to control, the process is more precise, and the uniformity and the homogeneity of the formed support beam are better.Type: GrantFiled: May 5, 2015Date of Patent: May 22, 2018Assignee: CSMC TECHNOLOGIES FABI CO., LTD.Inventors: Yonggang Hu, Guoping Zhou
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Publication number: 20170121175Abstract: A method of manufacturing a MEMS chip includes: providing a silicon substrate layer, the silicon substrate layer comprising a front surface configured to perform a MEMS process and a rear surface opposite to the front surface; growing a first oxidation layer mainly made of SiO2 on the rear surface of the silicon substrate layer by performing a thermal oxidation process; and depositing a first thin film layer mainly made of silicon nitride on the first oxidation layer by performing a low pressure chemical vapor deposition process.Type: ApplicationFiled: January 13, 2017Publication date: May 4, 2017Inventors: Dan DAI, Xinwei ZHANG, Guoping ZHOU, Changfeng XIA
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Publication number: 20170073224Abstract: An MEMS-based method for manufacturing a sensor comprises the steps of: forming a shallow channel (120) and a support beam (140) on a front surface of a substrate (100); forming a first epitaxial layer (200) on the front surface of the substrate (100) to seal the shallow channel (120); forming a suspended mesh structure (160) below the first epitaxial layer (200); and forming a deep channel (180) at a position on a back surface of the substrate (100) corresponding to the shallow channel (120), so that the shallow channel (120) is in communication with the deep channel (180). In the Method of manufacturing a MEMS-based sensor, when a shallow channel is formed on a front surface, a support beam of a mass block is formed, so the etching of a channel is easier to control, the process is snore precise. and the uniformity and the homogeneity of the formed support beam are better.Type: ApplicationFiled: May 5, 2015Publication date: March 16, 2017Applicant: CSMC TECHNOLOGIES FAB1 CO., LTD.Inventors: Yonggang HU, Guoping ZHOU
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Patent number: 9580301Abstract: A MEMS chip (100) includes a silicon substrate layer (110), a first oxidation layer (120) and a first thin film layer (130). The silicon substrate layer includes a front surface (112) for a MEMS process and a rear surface (114), both the front surface and the rear surface being polished surfaces. The first oxidation layer is mainly made of silicon dioxide and is formed on the rear surface of the silicon substrate layer. The first thin film layer is mainly made of silicon nitride and is formed on the surface of the first oxidation layer. In the above MEMS chip, by sequentially laminating a first oxidation layer and a first thin film layer on the rear surface of a silicon substrate layer, the rear surface is effectively protected to prevent the scratch damage in the course of a MEMS process. A manufacturing method for the MEMS chip is also provided.Type: GrantFiled: June 29, 2013Date of Patent: February 28, 2017Assignee: CSMC TECHNOLOGIES FAB1 CO., LTD.Inventors: Dan Dai, Xinwei Zhang, Guoping Zhou, Changfeng Xia
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Publication number: 20150175409Abstract: Provided is a method for fabricating a multi-trench structure, including steps of: performing anisotropic etching on a semiconductor substrate so as to form a vertical trench; growing a first epitaxial layer on the semiconductor substrate in which the vertical trench has been formed, so that the first epitaxial layer covers the top of the vertical trench to form a closed structure; performing anisotropic and isotropic etching on the closed structure, so as to form a trench array, and to make the trench array communicate with the vertical trench, the trench array including a number of trenches or vias, upper portions of a number of trenches or vias being separated from each other, and lower portions thereof communicating with each other to form a cavity; and growing a second epitaxial layer to cover the trench array, so as to form a closed multi-trench structure.Type: ApplicationFiled: August 19, 2013Publication date: June 25, 2015Applicant: CSMC TECHNOLOGIES FAB1 CO., LTD.Inventors: Xinwei Zhang, Dan Dai, Guoping Zhou, Changfeng Xia
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Publication number: 20150151958Abstract: A MEMS chip (100) includes a silicon substrate layer (110), a first oxidation layer (120) and a first thin film layer (130). The silicon substrate layer includes a front surface (112) for a MEMS process and a rear surface (114), both the front surface and the rear surface being polished surfaces. The first oxidation layer is mainly made of silicon dioxide and is formed on the rear surface of the silicon substrate layer. The first thin film layer is mainly made of silicon nitride and is formed on the surface of the first oxidation layer. In the above MEMS chip, by sequentially laminating a first oxidation layer and a first thin film layer on the rear surface of a silicon substrate layer, the rear surface is effectively protected to prevent the scratch damage in the course of a MEMS process. A manufacturing method for the MEMS chip is also provided.Type: ApplicationFiled: June 29, 2013Publication date: June 4, 2015Inventors: Dan Dai, Xinwei Zhang, Guoping Zhou, Changfeng Xia
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Patent number: D938344Type: GrantFiled: January 7, 2020Date of Patent: December 14, 2021Inventors: Guoping Zhou, Hanwen Wang