Abstract: Process for the reduction of breakdown risks with respect to the solid dielectric insulant of transmission cables and lines operating under high voltages. The insulant normally separates the conductors of a multi-conductor line or the central conductor and the outer metal envelope of a coaxial line. Small amounts of metal particles with dimensions below 1 micron are added to the dielectric insulant mass.

Abstract: Process for the reduction of breakdown risks with respect to the solid dielectric insulant of transmission cables and lines operating under high voltages. The insulant normally separates the conductors of a multi-conductor line or the central conductor and the outer metal envelope of a coaxial line. Small amounts of metal particles with dimensions below 1 micron are added to the dielectric insulant mass.

Abstract: Process and apparatus for the characterization of an insulator (5) at breakdown with the aid of an electron microscope (1), in which the electron flow rate of the beam (3) is adjusted as a function of in particular backscattered, lost, secondary or absorbed electrons. An automatic controller (9) sensitive to certain sensors (10,12) is provided for this purpose. The electron flow rate is proportional to the voltage to be simulated in the insulator.

Abstract: Process for the preparation of ceramic materials for parts having friction surfaces subject to friction and free from auto/self-adhesion under stress or during aging. A precursor of the ceramic undergoes successive operations of pressing, sintering, polishing the surface obtained, cleaning the solid gangue resulting from the polishing, roasting in the presence of oxygen, and a doping treatment for increasing the dielectric susceptibility and homogeneity of the ceramic material adjacent the friction surfaces and to increase the mobility of the charges.

Abstract: Process for the preparation of ceramic materials for parts having friction surfaces subject to friction and free from auto/self-adhesion under stress or during aging. A precursor of the ceramic undergoes successive operations of pressing, sintering, polishing the surface obtained, cleaning the solid gangue resulting from the polishing, roasting in the presence of oxygen, and a treatment aimed at increasing the dielectric susceptibility and homogeneity of the ceramic material adjacent the friction surfaces and to increase the mobility of charges.

Abstract: In an apparatus for local surface analysis of a target sample in which an ion probe is directed to the target for sputtering particles. A chamber having walls heated to a high temperature (above 2200.degree. K as a rule) collects sputtered particles. The particles entering the chamber are subjected to successive adsorptions and desorptions before they leave the chamber for entry into a mass spectrometer. Scanning may be provided as in conventional SIMS systems.