Abstract: A system such as an imaging system may include an illumination module. The illumination module may include a light source monitoring system. The light source monitoring system may sample a light source signal and aggregate the samples into data chunks. The light source monitoring system may selectively aggregate the data chunks to form groups of a monitoring time window. The light source monitoring system may detect a fault based on a value characterizing light source performance during the monitoring time window.

Abstract: Systems, devices, and methods are described to statically calibrate a time-of-flight (TOF) imaging system requiring no movement during the calibration process and no external components. Methods may include placing a target at a set distance from the imaging system, delaying a modulation signal according to a distance offset, receiving a reflected light signal from the target, generating a pixel response based on the reflected light signal and modulation signal, calculating a distance-related value based on the pixel response, determining a correction value based on the distance-related value, and storing the correction value in a memory of the imaging system. The distance-related value may include a phase offset or a depth measurement. The method may be performed for a plurality of distance offsets and corresponding delays to generate a plurality of correction values that may be used when operating the imaging system to perform depth measurements.

Abstract: A system such as an imaging system may include an illumination module. The illumination module may include a light source monitoring system. The light source monitoring system may sample a light source signal and aggregate the samples into data chunks. The light source monitoring system may selectively aggregate the data chunks to form groups of a monitoring time window. The light source monitoring system may detect a fault based on a value characterizing light source performance during the monitoring time window.