Patents by Inventor Guy SHWARTZ

Guy SHWARTZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250047681
    Abstract: A method and system for providing web resources through a zero trust network environment are provided. The system comprises receiving a request from a client device to access a web resource through a zero trust network environment, wherein the web resource is external to the zero trust network environment, the request including a first uniform resource locator (URL), and the resource further including a second URL; fetching the web resource based on the first URL; generating an alternate resource, the alternate resource including an alternate URL replacing the second URL; and providing the alternate resource to the client device.
    Type: Application
    Filed: October 24, 2024
    Publication date: February 6, 2025
    Inventors: Guy Sviry, Natan Elul, Daniel Reisel, Shay Shwartz
  • Publication number: 20250039195
    Abstract: A system and method for providing file scanning between a client device and a resource through a zero trust network environment (ZTNE) are disclosed. The method includes detecting in network traffic between the client device and the ZTNE a request to receive a first content from a resource deployed in a private network, wherein the resource is accessible to the user device making first request through the ZTNE; detecting in network traffic between the client device and the ZTNE a second request to send a second content from the client device to a public network, wherein the public network is accessible to the user device making the second request through the ZTNE; sending the request to the public network, in response to determining that the second content is allowable; and blocking the request to the public network, in response to determining that the second content is not allowable network traffic.
    Type: Application
    Filed: July 26, 2023
    Publication date: January 30, 2025
    Inventors: Shay SHWARTZ, Guy Sviry, Gil AZRIELANT
  • Publication number: 20240404784
    Abstract: Disclosed herein is a system for non-destructive tomography of specimens. The system includes a scanning electron microscope (SEM) and a processor(s). The SEM is configured to obtain a sinogram of a tested specimen, parameterized by a vector {right arrow over (s)}, by projecting e-beams on the tested specimen, at each of a plurality of projection directions and offsets, and. for each e-beam, measuring a respective intensity of electrons returned from the tested specimen, The processor(s) is configured to obtain a tomographic map, pertaining to the tested specimen, by determining values indicative of components of a vector {right arrow over (t)} defined by an equation W{right arrow over (t)}={right arrow over (s)}. W is a matrix with components wij specifying a contribution of a j-th voxel in a nominal specimen to an i-th element of a nominal sinogram of the nominal specimen. The matrix W accounts for e-beam expansion and attenuation with depth within the nominal specimen.
    Type: Application
    Filed: May 29, 2023
    Publication date: December 5, 2024
    Applicant: Applied Materials Israel Ltd.
    Inventors: Itamar Shani, Konstantin Chirko, Lior Yaron, Guy Eytan, Guy Shwartz
  • Patent number: 11803961
    Abstract: Disclosed herein is s computer-based method for obtaining and analyzing multi-die scan data of a patterned wafer. The method includes sequentially implementing an operation of scanning a respective plurality of sets of slices on a wafer, and, per each slice segment in a multiplicity of slice segments in the plurality of sets of slices, an operation of performing die-to-multi-die (D2MD) analysis of scan data of the slice segment in order to detect defects in the slice segment. Each set of slices may constitute a subset of the totality of slices on the respective die-column. Sets scanned in a same implementation are analogous to one another, thereby facilitating—in the die-to-multi-die analysis of scan data of a slice segment—taking into account, as reference, scan data of areas on other die-columns, which were scanned in the same implementation.
    Type: Grant
    Filed: October 6, 2021
    Date of Patent: October 31, 2023
    Assignee: Applied Materials Israel Ltd.
    Inventors: Ron Naftali, Yariv Simovitch, Guy Shwartz, Ido Almog
  • Publication number: 20230326713
    Abstract: Disclosed herein is a method for non-destructive hybrid acousto-optic and scanning electron microscopy-based metrology. The method includes: (i) obtaining acousto-optic and scanning electron microscopy measurement data of an inspected structure on a sample; (ii) processing the measurement data to extract values of key measurement parameters corresponding to the acousto-optic measurement data and the scanning electron microscopy measurement data, respectively; and (iii) obtaining estimated values of one or more structural parameters of the inspected structure by inputting the extracted values into an algorithm, which is configured to jointly process the extracted values to output estimated values of the one or more structural parameters.
    Type: Application
    Filed: April 6, 2022
    Publication date: October 12, 2023
    Applicant: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Guy Shwartz, Ori Golani, Itamar Shani, Ido Almog
  • Patent number: 11688055
    Abstract: Disclosed is a computerized method for detecting defects on a sample. The method includes: (i) receiving scan data corresponding to a pixel on the sample; (ii) computing a difference vector d based on the scan data and corresponding reference data; (iii) computing a parameter D dependent on t=?d?(Glinear/??s?2)?s, wherein ?T?=K?1 with K being a covariance matrix corresponding to the pixel, s is a predetermined kernel characterizing a defect signal, and Glinear=s·(K?1 d) is a gaussian approximation of a likelihood ratio test expression for distinguishing the defect signal from noise, and wherein D substantially monotonically increases with ?t?; and (iv) computing a score q(g, D) indicative of whether the pixel is defective, wherein g is a parameter indicative of a value of Glinear and q(g, D) substantially monotonically increases with g and substantially monotonically decreases with D.
    Type: Grant
    Filed: January 27, 2021
    Date of Patent: June 27, 2023
    Assignee: Applied Materials Israel Ltd.
    Inventors: Guy Shwartz, Ido Almog
  • Publication number: 20230107630
    Abstract: Disclosed herein is s computer-based method for obtaining and analyzing multi-die scan data of a patterned wafer. The method includes sequentially implementing an operation of scanning a respective plurality of sets of slices on a wafer, and, per each slice segment in a multiplicity of slice segments in the plurality of sets of slices, an operation of performing die-to-multi-die (D2MD) analysis of scan data of the slice segment in order to detect defects in the slice segment. Each set of slices may constitute a subset of the totality of slices on the respective die-column. Sets scanned in a same implementation are analogous to one another, thereby facilitating—in the die-to-multi-die analysis of scan data of a slice segment—taking into account, as reference, scan data of areas on other die-columns, which were scanned in the same implementation.
    Type: Application
    Filed: October 6, 2021
    Publication date: April 6, 2023
    Applicant: Applied Materials Israel Ltd.
    Inventors: Ron Naftali, Yariv Simovitch, Guy Shwartz, Ido Almog
  • Publication number: 20220237758
    Abstract: Disclosed is a computerized method for detecting defects on a sample. The method includes: (i) receiving scan data corresponding to a pixel on the sample; (ii) computing a difference vector d based on the scan data and corresponding reference data; (iii) computing a parameter D dependent on t=?d?(Glinear/??s?2)?s, wherein ?T?=K?1 with K being a covariance matrix corresponding to the pixel, s is a predetermined kernel characterizing a defect signal, and Glinear=s·(K?1 d) is a gaussian approximation of a likelihood ratio test expression for distinguishing the defect signal from noise, and wherein D substantially monotonically increases with ?t?; and (iv) computing a score q(g, D) indicative of whether the pixel is defective, wherein g is a parameter indicative of a value of Glinear and q(g, D) substantially monotonically increases with g and substantially monotonically decreases with D.
    Type: Application
    Filed: January 27, 2021
    Publication date: July 28, 2022
    Inventors: Guy SHWARTZ, Ido ALMOG