Abstract: A method for formal deep bug hunting in a device under test (DUT) may include obtaining a selection of a start state for the DUT; obtaining a selection of one or a plurality of variables that are declared as random variables; for each of said one or a plurality of random variables, generating a sequence of random values in a generation order using a random number generator (RNG); and performing formal verification exploration of the DUT starting at the start state and consecutively assigning each of said one or a plurality of random variables a value from the sequence of values in the generation order.

Abstract: A system and method for generalized next-state-directed constrained random simulation may include obtaining an initial state for a finite state machine (FSM) constrained by a first Boolean random circuit; and unrolling the FSM, wherein each step of steps of the unrolling, except for a final step, is constrained by the first Boolean random circuit that defines a set of generalized cycles, and wherein the final step is constrained by a second Boolean random circuit.