Abstract: A machine for automatically inspecting a flow (F) of individual objects (2) on a conveying plane (3) includes at least one illumination station (4) and at least one detection station (4?) below which the flow (F) of objects to be inspected passes. The at least one illumination station (4) has means (6) for applying and focusing inspecting beams (R) defining a transverse focused illuminated region (ZEF) The at least one detection station (4?) has a means (9) defining a detection region (ZD) in the form of a transverse strip of size (L) as well as means (9,1) for capturing and transmitting the signal contained in a pixel (10) scanning the detection region (ZD). The focused illuminated region (ZEF) fits along the entire width (L) of the detection region (ZD) within this detection region.

Abstract: The invention relates to a machine for automatically inspecting a flow (F) of individual objects (2) on a conveying plane (3), comprising at least one illumination station (4) and at least one detection station (4?) below which the flow (F) of objects to be inspected passes; the at least one illumination station (4) comprises means (6) for applying and focusing inspecting beams (R) defining a transverse focused illuminated region (ZEF), and the at least one detection station (4?) comprises a means (9) defining a detection region (ZD) in the form of a transverse strip of size (L) as well as means (9,1) for capturing and transmitting the signal contained in a pixel (10) scanning the detection region (ZD). Said machine is characterized in that the focused illuminated region (ZEF) fits within the entire width (L) of the detection region (ZD).