Patents by Inventor Gyanesh Mathur

Gyanesh Mathur has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11819339
    Abstract: A thermosensitive nanosensor includes a substrate having a plurality of vertically standing nanostructures attached thereto, the plurality of vertically standing nanostructure being covered with a conductive material to form conductive coated nanostructures; a thermosensitive hydrogel adjacent to the plurality of conductive coated nanostructures; and a cover layer on top of the thermosensitive hydrogel to prevent loss of moisture and mechanical stress.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: November 21, 2023
    Assignee: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Patent number: 11619606
    Abstract: A system and method is provided for depositing nanosensors including directing a plasma stream onto a low energy substrate having a surface energy of from 10 mN/m to 43 mN/m to increase the surface energy of the substrate to from 44 mN/m to 80 mN/m, applying an adhesive layer to the plasma discharge treated substrate; and depositing nanosensors on the adhesive coated substrate of step (b) via electrostatic force assisted deposition using a high strength electrostatic field of from 2 kV/cm to 10 kV/cm to form vertically standing nanosensors.
    Type: Grant
    Filed: May 21, 2021
    Date of Patent: April 4, 2023
    Assignee: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Publication number: 20210278366
    Abstract: A system and method is provided for depositing nanosensors including directing a plasma stream onto a low energy substrate having a surface energy of from 10 mN/m to 43 mN/m to increase the surface energy of the substrate to from 44 mN/m to 80 mN/m, applying an adhesive layer to the plasma discharge treated substrate; and depositing nanosensors on the adhesive coated substrate of step (b) via electrostatic force assisted deposition using a high strength electrostatic field of from 2 kV/cm to 10 kV/cm to form vertically standing nanosensors.
    Type: Application
    Filed: May 21, 2021
    Publication date: September 9, 2021
    Applicant: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Patent number: 11041825
    Abstract: A system and method is provided for depositing nanosensors including directing a plasma stream onto a low energy substrate having a surface energy of from 10 mN/m to 43 mN/m to increase the surface energy of the substrate to from 44 mN/m to 80 mN/m, applying an adhesive layer to the plasma discharge treated substrate; and depositing nanosensors on the adhesive coated substrate of step (b) via electrostatic force assisted deposition using a high strength electrostatic field of from 2 kV/cm to 10 kV/cm to form vertically standing nanosensors.
    Type: Grant
    Filed: September 20, 2018
    Date of Patent: June 22, 2021
    Assignee: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Publication number: 20210000417
    Abstract: A thermosensitive nanosensor includes a substrate having a plurality of vertically standing nanostructures attached thereto, the plurality of vertically standing nanostructure being covered with a conductive material to form conductive coated nanostructures; a thermosensitive hydrogel adjacent to the plurality of conductive coated nanostructures; and a cover layer on top of the thermosensitive hydrogel to prevent loss of moisture and mechanical stress.
    Type: Application
    Filed: June 30, 2020
    Publication date: January 7, 2021
    Applicant: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Patent number: 10714310
    Abstract: A system and method is provided for of characterizing nanostructured surfaces. A nanostructure sample is placed in an SEM chamber and imaged. The system and method locates one of the nanostructures using images from the SEM imaging, excises a top portion of the nanostructure, places said top portion on a substrate such that the nanostructures are perpendicular to the substrate and a base of the top portion contacts the substrate, performs high energy ion beam assisted deposition of metal at the base to attach the top portion to the substrate, SEM imaging the top portions in the SEM chamber, determining coordinates of the top portions relative to the substrate from the SEM imaging of the top portions, placing the substrate in an AFM chamber, and performing AFM imaging of the top portions using the coordinates previously determined.
    Type: Grant
    Filed: September 3, 2019
    Date of Patent: July 14, 2020
    Assignee: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Publication number: 20200006035
    Abstract: A system and method is provided for of characterizing nanostructured surfaces. A nanostructure sample is placed in an SEM chamber and imaged. The system and method locates one of the nanostructures using images from the SEM imaging, excises a top portion of the nanostructure, places said top portion on a substrate such that the nanostructures are perpendicular to the substrate and a base of the top portion contacts the substrate, performs high energy ion beam assisted deposition of metal at the base to attach the top portion to the substrate, SEM imaging the top portions in the SEM chamber, determining coordinates of the top portions relative to the substrate from the SEM imaging of the top portions, placing the substrate in an AFM chamber, and performing AFM imaging of the top portions using the coordinates previously determined.
    Type: Application
    Filed: September 3, 2019
    Publication date: January 2, 2020
    Applicant: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Patent number: 10438772
    Abstract: A system and method is provided for of characterizing nanostructured surfaces. A nanostructure sample is placed in an SEM chamber and imaged. The system and method locates one of the nanostructures using images from the SEM imaging, excises a top portion of the nanostructure, places said top portion on a substrate such that the nanostructures are perpendicular to the substrate and a base of the top portion contacts the substrate, performs high energy ion beam assisted deposition of metal at the base to attach the top portion to the substrate, SEM imaging the top portions in the SEM chamber, determining coordinates of the top portions relative to the substrate from the SEM imaging of the top portions, placing the substrate in an AFM chamber, and performing AFM imaging of the top portions using the coordinates previously determined.
    Type: Grant
    Filed: May 8, 2018
    Date of Patent: October 8, 2019
    Assignee: NANOWEAR INC.
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Publication number: 20190086361
    Abstract: A system and method is provided for depositing nanosensors including directing a plasma stream onto a low energy substrate having a surface energy of from 10 mN/m to 43 mN/m to increase the surface energy of the substrate to from 44 mN/m to 80 mN/m, applying an adhesive layer to the plasma discharge treated substrate; and depositing nanosensors on the adhesive coated substrate of step (b) via electrostatic force assisted deposition using a high strength electrostatic field of from 2 kV/cm to 10 kV/cm to form vertically standing nanosensors.
    Type: Application
    Filed: September 20, 2018
    Publication date: March 21, 2019
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur
  • Publication number: 20180330918
    Abstract: A system and method is provided for of characterizing nanostructured surfaces. A nanostructure sample is placed in an SEM chamber and imaged. The system and method locates one of the nanostructures using images from the SEM imaging, excises a top portion of the nanostructure, places said top portion on a substrate such that the nanostructures are perpendicular to the substrate and a base of the top portion contacts the substrate, performs high energy ion beam assisted deposition of metal at the base to attach the top portion to the substrate, SEM imaging the top portions in the SEM chamber, determining coordinates of the top portions relative to the substrate from the SEM imaging of the top portions, placing the substrate in an AFM chamber, and performing AFM imaging of the top portions using the coordinates previously determined.
    Type: Application
    Filed: May 8, 2018
    Publication date: November 15, 2018
    Inventors: Vijay Varadan, Pratyush Rai, Gyanesh Mathur