Patents by Inventor GYOUNG HWAN HYUN

GYOUNG HWAN HYUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System on chip for debugging a cluster regardless of power state of the cluster, method of operating the same, and system having the same
    Patent number: 9619011
    Abstract: A system on chip includes a debugging controller, a plurality of clusters, and a power management unit (PMU). The debugging controller is included in a first power domain and a joint test action group (JTAG) interface is included in the first power domain. Each of the clusters is included in at least second power domain different from the first power domain. The PMU is configured to release a powered-off state of the debugging controller in response to a debugging request signal output from the JTAG interface.
    Type: Grant
    Filed: July 24, 2014
    Date of Patent: April 11, 2017
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventor: Gyoung Hwan Hyun
  • SYSTEM ON CHIP FOR DEBUGGING A CLUSTER REGARDLESS OF POWER STATE OF THE CLUSTER, METHOD OF OPERATING THE SAME, AND SYSTEM HAVING THE SAME
    Publication number: 20150052410
    Abstract: A system on chip includes a debugging controller, a plurality of clusters, and a power management unit (PMU). The debugging controller is included in a first power domain and a joint test action group (JTAG) interface is included in the first power domain. Each of the clusters is included in at least second power domain different from the first power domain. The PMU is configured to release a powered-off state of the debugging controller in response to a debugging request signal output from the JTAG interface.
    Type: Application
    Filed: July 24, 2014
    Publication date: February 19, 2015
    Inventor: GYOUNG HWAN HYUN