Abstract: Disclosed is an apparatus for converting an analog image data into a digital image data in a CMOS image sensor including a pixel array having M (row line)×N (column line) color pixels, wherein the color pixels include a first color pixel for sensing a first color, a second color pixel for sensing a second color and a third pixel for sensing a third color.

Abstract: The present invention relates to a CMOS (Complementary Metal Oxide Semiconductor) image sensor; and, more particularly, to a pixel array of the CMOS image sensor in a wider dynamic range. A CMOS image sensor based on a correlated double sampling comprises a single common node, a plurality of unit pixels in parallel connected to the single common node, an amplifying means coupled to the single common node for amplifying a voltage of the single common node and outputting the amplified voltage, and an output means for receiving the amplified voltage from the amplifying means and outputting a data voltage level and a reset voltage level.

Abstract: A method for automatically controlling an exposure time in image sensor having a pixel array includes the steps of producing total pixel value of the green pixels from the pixel array, producing a mean value of the green pixels dividing the total pixel value of the green pixels by the number of the green pixels, producing a deviation value, wherein the deviation value is an absolute value of a difference between the mean value and a predetermined reference value, comparing the deviation value with a predetermined boundary value, in case where the deviation value is smaller than the predetermined boundary value, capturing a next image according to a current exposure time, and in case where the deviation value is larger than the predetermined boundary value, calculating an exposure control rate and determining whether an automatic exposure control mode is enabled, and in case where the automatic exposure control mode is disabled, capturing the next image according to the current exposure time, and in case where

Abstract: An image sensor according to the present invention can detect and correct an error value of a defective pixel. The image sensor includes an error detection circuit for detecting an error by comparing difference between a current pixel value and a previous pixel value with a predetermined reference value and an error correction circuit for correcting an error value from a pixel, by substituting the previous pixel value for the current pixel value.

Abstract: The present invention relates to a picture display using CMOS (Complementary Metal Oxide Semiconductor) image sensor; and, more particularly, to a CMOS image sensor having a testing circuit embedded therein and a method for verifying operation of the CMOS image sensor using the testing circuit. The CMOS image sensor according to the present invention includes a control/interface unit for controlling its operation sensor using a state machine and for interfacing the CMOS image sensor with an external system; a pixel array including a plurality of pixels sensing images from an object and generating analogue signals according to an amount of incident light; a converter for converting the analogue signals into digital signals to be processed in a digital logic circuit; and a testing circuit for verifying operations of the converter and the control/interface unit, by controlling the converter.