Abstract: A memory device includes a memory cell having an access transistor and a variable resistance element, a word line connected to a gate of the access transistor, and a gate driver circuit configured to provide a word line voltage to the word line in a read operation or a write operation, receive, during the read operation, a first power supply voltage from a power terminal and provide a second power supply voltage lower than the first power supply voltage to the word line by attenuating the first power supply voltage to the second power supply voltage, and receive, during the write operation, a third power supply voltage higher than the first power supply voltage from the power terminal and provide the third power supply voltage to the word line without attenuating the third power supply voltage.

Abstract: A memory device includes a memory cell array including memory cells, a row decoder, a column decoder, a sense amplifier that reads data stored in a memory cell by detecting a difference between a source line voltage and a reference voltage during a read operation, and a control logic including a read offset compensator that receives output data from the sense amplifier and performs an offset reference resistance compensation operation. The read offset compensator compares a number of error bits of the output data with a threshold value, performs the offset reference resistance compensation operation based on a result of the comparison, calculates a local resistance for compensating an offset reference resistance for the sense amplifier during the offset reference resistance compensation operation, and adjusts a reference resistance for the sense amplifier based on the local resistance during the read operation.

Abstract: A memory device including a memory cell array including a first sub memory cell array including a first memory cell and a second sub memory cell array including a second memory cell, a merged write driver including a first write circuit receiving n-bit data (n being a natural number ?2) through a write input/output line, outputting a first write voltage to a merged node in response to a first data bit of the n-bit data, and outputting a second write voltage to the merged node in response to a second data bit of the n-bit data, and a column decoder including a first column multiplexer applying a first voltage of the merged node corresponding to the first data bit to the first memory cell and a second column multiplexer applying a second voltage of the merged node corresponding to the second data bit to the second memory cell.

Abstract: A memory device which includes a control logic circuit that generates a write enable signal based on a write command, a first memory cell connected with a first word line and a first column line, a first write circuit that receives first write data to be stored in the first memory cell through a first write input/output line and applies a write voltage to a first data line based on the first write data in response to the write enable signal, and a first column multiplexer circuit that selects the first column line and connects the first column line with the first data line in response to a first column select signal, such that the write voltage is applied to the first memory cell. The first write circuit applies the write voltage to a bulk port of the first column multiplexer circuit in response to the write enable signal.

Abstract: A semiconductor device includes a first memory cell array including a plurality of first memory cells, a plurality of first reference cells and a plurality of first dummy cells, a second memory cell array including a plurality of second memory cells, a plurality of second reference cells and a plurality of second dummy cells, an input/output circuit provided between the first memory cell array and the second memory cell array, a first column decoder connected between the first memory cell array and the input/output circuit and a second column decoder connected between the second memory cell array and the input/output circuit. The second column decoder connects one of the plurality of second dummy cells and the plurality of second memory cells to a selected sense amplifier of the input/output circuit, when the first column decoder connects a selected first memory cell to the selected sense amplifier.

Abstract: A nonvolatile memory device includes an array of magnetic memory cells, and control logic circuit having a voltage generator therein, which is configured to generate a gate voltage. A row decoder is provided, which is connected by word lines to the array of magnetic memory cells, and has a word line driver driven therein, which is responsive to the gate voltage. A column decoder is provided, which is connected by bit lines and source lines to the array of magnetic memory cells. A write driver is provided, which has a write voltage generating circuit therein that is configured to output a write voltage, in response to: (i) a reference voltage generated using a replica magnetic memory cell, and (ii) a feedback voltage generated using a magnetic memory cell in which a write operation is to be performed.

Abstract: A semiconductor device includes a first memory cell array including a plurality of first memory cells, a plurality of first reference cells and a plurality of first dummy cells, a second memory cell array including a plurality of second memory cells, a plurality of second reference cells and a plurality of second dummy cells, an input/output circuit provided between the first memory cell array and the second memory cell array, a first column decoder connected between the first memory cell array and the input/output circuit and a second column decoder connected between the second memory cell array and the input/output circuit. The second column decoder connects one of the plurality of second dummy cells and the plurality of second memory cells to a selected sense amplifier of the input/output circuit, when the first column decoder connects a selected first memory cell to the selected sense amplifier.

Abstract: A memory device including a memory cell array including a first sub memory cell array including a first memory cell and a second sub memory cell array including a second memory cell, a merged write driver including a first write circuit receiving n-bit data (n being a natural number ?2) through a write input/output line, outputting a first write voltage to a merged node in response to a first data bit of the n-bit data, and outputting a second write voltage to the merged node in response to a second data bit of the n-bit data, and a column decoder including a first column multiplexer applying a first voltage of the merged node corresponding to the first data bit to the first memory cell and a second column multiplexer applying a second voltage of the merged node corresponding to the second data bit to the second memory cell.

Abstract: A nonvolatile memory device includes an array of magnetic memory cells, and control logic circuit having a voltage generator therein, which is configured to generate a gate voltage. A row decoder is provided, which is connected by word lines to the array of magnetic memory cells, and has a word line driver driven therein, which is responsive to the gate voltage. A column decoder is provided, which is connected by bit lines and source lines to the array of magnetic memory cells. A write driver is provided, which has a write voltage generating circuit therein that is configured to output a write voltage, in response to: (i) a reference voltage generated using a replica magnetic memory cell, and (ii) a feedback voltage generated using a magnetic memory cell in which a write operation is to be performed.

Abstract: A memory device which includes a control logic circuit that generates a write enable signal based on a write command, a first memory cell connected with a first word line and a first column line, a first write circuit that receives first write data to be stored in the first memory cell through a first write input/output line and applies a write voltage to a first data line based on the first write data in response to the write enable signal, and a first column multiplexer circuit that selects the first column line and connects the first column line with the first data line in response to a first column select signal, such that the write voltage is applied to the first memory cell. The first write circuit applies the write voltage to a bulk port of the first column multiplexer circuit in response to the write enable signal.

Abstract: Disclosed is a flip-flop based on a nonvolatile memory. The flip-flop based on the nonvolatile memory includes a flip-flop unit to output output data, a nonvolatile memory unit electrically connected to the flip-flop unit and to store backup data, and a backup controller to selectively control a backup operation for backing up the output data to the backup data, based on whether the backup data are the same as the output data.

Abstract: Disclosed is a flip-flop based on a nonvolatile memory. The flip-flop based on the nonvolatile memory includes a flip-flop unit to output output data, a nonvolatile memory unit electrically connected to the flip-flop unit and to store backup data, and a backup controller to selectively control a backup operation for backing up the output data to the backup data, based on whether the backup data are the same as the output data.

Abstract: A semiconductor device includes a line driving unit connected to a memory cell array, a switch unit including first and second output terminals electrically connected to the memory cell array through a plurality of bit lines and a plurality of source lines, and a power supply unit outputting a precharge voltage and a source voltage to the first and second output terminals. The power supply unit includes a negative voltage generation unit that charge-shares the precharge voltage to be charged with a first voltage and discharges the first voltage to one side to generate a negative voltage on the other side.

Abstract: A semiconductor device includes a line driving unit connected to a memory cell array, a switch unit including first and second output terminals electrically connected to the memory cell array through a plurality of bit lines and a plurality of source lines, and a power supply unit outputting a precharge voltage and a source voltage to the first and second output terminals. The power supply unit includes a negative voltage generation unit that charge-shares the precharge voltage to be charged with a first voltage and discharges the first voltage to one side to generate a negative voltage on the other side.