Patents by Inventor Håkan F. Wintzell

Håkan F. Wintzell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measuring device including a layer of a magnetoelastic alloy and a method for production thereof
    Patent number: 8316724
    Abstract: A measuring device including a layer of a magnetoelastic alloy formed on a load-carrying member. The layer is intended for measuring stresses induced by a force applied to the load-carrying member. An average grain size of the layer is in the range of 100 nm to 10000 nm. A method for production of the layer.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: November 27, 2012
    Assignee: ABB, AB
    Inventors: Hans Ling, Håkan F. Wintzell, Mingsheng Wang, Per S. Gustafsson, Andrius Miniotas