Patents by Inventor H. William Niu

H. William Niu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tandem differential mobility ion mobility spectrometer for chemical vapor detection
    Patent number: 8754366
    Abstract: A DMS-IMS chemical sensing system employs two ion-separation technologies in tandem to extract signals of specific chemicals from the glut of signals present. The sensing system generally includes an atmospheric pressure ion generation system, a Differential Mobility (DMS) system, a time-of-flight IMS (TOF-IMS) system, and an ion detector system. The DMS extracts a narrow range of trace chemicals from an environmental sample for subsequent analysis, and a TOF-IMS then analyzes the resulting narrow range of isolated chemicals, allowing compound-specific detection thresholds at sub-ppb concentrations.
    Type: Grant
    Filed: January 11, 2005
    Date of Patent: June 17, 2014
    Assignee: Hamilton Sundstrand Corporation
    Inventors: David E. Burchfield, H. William Niu, Richard A. Heppner
  • Tandem differential mobility ion mobility spectrometer for chemical vapor detection
    Publication number: 20100001182
    Abstract: A DMS-IMS chemical sensing system employs two ion-separation technologies in tandem to extract signals of specific chemicals from the glut of signals present. The sensing system generally includes an atmospheric pressure ion generation system, a Differential Mobility (DMS) system, a time-of-flight IMS (TOF-IMS) system, and an ion detector system. The DMS extracts a narrow range of trace chemicals from an environmental sample for subsequent analysis, and a TOF-IMS then analyzes the resulting narrow range of isolated chemicals, allowing compound-specific detection thresholds at sub-ppb concentrations.
    Type: Application
    Filed: January 11, 2005
    Publication date: January 7, 2010
    Inventors: David E. Burchfield, H. William Niu, Richard A. Heppner