Abstract: Embodiments of a flip-flip circuit are disclosed that may allow a reduction in data setup time and lower switching power. The flip-flop circuit may include an input circuit, an output circuit, a clock circuit, and a feedback circuit. The clock circuit may be operable to generate internal clocks dependent upon received data, and the generated internal clocks may enable the feedback and input circuits.

Abstract: Embodiments of a logic path are disclosed that may allow for a reduction in switching power. The logic path may include a storage circuit, a comparison circuit, and a clock gating circuit. The storage circuit may be configured to store received data responsive to a local clock signal. The comparison circuit may be operable to compare the received data to data previously stored in the storage circuit. The clock gating circuit may be configured to generate the local clock signal dependent on a global clock signal, and de-activate the local clock signal dependent upon the results of the comparison performed by the comparison circuit.

Abstract: Embodiments of a logic path are disclosed that may allow for a reduction in switching power. The logic path may include a storage circuit, a comparison circuit, and a clock gating circuit. The storage circuit may be configured to store received data responsive to a local clock signal. The comparison circuit may be operable to compare the received data to data previously stored in the storage circuit. The clock gating circuit may be configured to generate the local clock signal dependent on a global clock signal, and de-activate the local clock signal dependent upon the results of the comparison performed by the comparison circuit.

Abstract: A process-tolerant large-swing sense amplifier with latching capability includes top-array and bottom-array access. The sense amplifier provides improved tolerance to process variation, reduces design complexity, reduces power consumption, and reduces the physical footprint of the circuit. In addition, the sense amplifier provides write-through functionality through the read data bus.

Abstract: A process-tolerant large-swing sense amplifier with latching capability includes top-array and bottom-array access. The sense amplifier provides improved tolerance to process variation, reduces design complexity, reduces power consumption, and reduces the physical footprint of the circuit. In addition, the sense amplifier provides write-through functionality through the read data bus.

Abstract: An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a first scan slave element capable of capturing data on a positive edge of a clock signal; and a second scan slave element capable of capturing data on a negative edge of the clock signal. An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a scan slave element capable of capturing data on either a positive edge or a negative edge of a clock signal; wherein a control signal determines whether the scan slave element captures data on the positive edge or negative edge of the clock signal.

Abstract: An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a first scan slave element capable of capturing data on a positive edge of a clock signal; and a second scan slave element capable of capturing data on a negative edge of the clock signal. An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a scan slave element capable of capturing data on either a positive edge or a negative edge of a clock signal; wherein a control signal determines whether the scan slave element captures data on the positive edge or negative edge of the clock signal.