Abstract: A method and an apparatus for filtering motion vector fields provided by a motion estimator apparatus are disclosed. The method includes receiving an input image, determining a motion vector field associated with the input image, determining a local segmentation image, forming a lattice map to identify periodic structures, using the local segmentation image and the lattice map to obtain an image segment pixel count and an image/motion segment pixel count, and using the segment pixel count and the image/motion segment pixel count to provide a filtered motion vector field. Some embodiments further include a motion estimation apparatus including an image delay apparatus, a lattice detector to find lattice structures in the input and delayed images, a histogram generator and a histogram analyzer to provide a set of horizontal and vertical search masks, a motion vector estimator to provide a motion vector field, and a motion vector filter as provided herein.

Abstract: The invention relates to a organic field effect transistor device comprising: an organic semiconductor layer; a source electrode arranged in electronic contact with the said organic semiconductor; a drain electrode arranged in electronic contact with the said organic semiconductor; a gate electrode; an electrolyte layer arranged between said gate electrode and said organic semiconductor layer; wherein the organic semiconductor layer comprises a semiconducting polymeric material comprising one or more blocks of conjugated polymer combined with one or more blocks of copolymer; preferably an amphiphilic copolymer. Also a method of producing the device, and a polyanionic polymer is provided by the invention.

Abstract: A method and apparatus for estimating motion of a pixel block in a first frame, the method including searching a first area in a second frame to identify a first matching block that corresponds to the pixel block, the first matching block including a first error value that is a minimum of at least one error criteria between the pixel block and the first matching block, calculating a first motion vector associated with the first matching block. The method further including searching a second area in the second frame to identify a second matching block that corresponds to the pixel block, the second matching block including a second error value that is a minimum of the at least one error criteria between the pixel block and the second matching block, calculating a second motion vector associated with the second matching block and selecting a final motion vector between the first and second motion vectors based on the first and second error value.

Abstract: A method and an apparatus for filtering motion vector fields provided by a motion estimator apparatus are disclosed. The method includes receiving an input image, determining a motion vector field associated with the input image, determining a local segmentation image, forming a lattice map to identify periodic structures, using the local segmentation image and the lattice map to obtain an image segment pixel count and an image/motion segment pixel count, and using the segment pixel count and the image/motion segment pixel count to provide a filtered motion vector field. Some embodiments further include a motion estimation apparatus including an image delay apparatus, a lattice detector to find lattice structures in the input and delayed images, a histogram generator and a histogram analyzer to provide a set of horizontal and vertical search masks, a motion vector estimator to provide a motion vector field, and a motion vector filter as provided herein.

Abstract: A method and apparatus for estimating motion of a pixel block in a first frame, the method including searching a first area in a second frame to identify a first matching block that corresponds to the pixel block, the first matching block including a first error value that is a minimum of at least one error criteria between the pixel block and the first matching block, calculating a first motion vector associated with the first matching block. The method further including searching a second area in the second frame to identify a second matching block that corresponds to the pixel block, the second matching block including a second error value that is a minimum of the at least one error criteria between the pixel block and the second matching block, calculating a second motion vector associated with the second matching block and selecting a final motion vector between the first and second motion vectors based on the first and second error value.

Abstract: The present invention is directed to a method of identifying test devices having excessive leakage current and also includes computer program products that enable the same. The method obtaining background test data using a test routine to measure the leakage current for a set of test devices as a function of a parameter associated with device speed for the device under test. From the test data, a leakage threshold function is defined that correlates leakage current with the parameter associated with device speed. The test routine and the leakage threshold function are then input into an automated testing apparatus configured to execute the test on production or other devices. Devices are tested to determine leakage current over a range of parameter values associated with device speed. The devices are then screened using the leakage threshold function to determine the status of the device.

Abstract: The present invention is directed to a method of identifying test devices having excessive leakage current and also includes computer program products that enable the same. The method obtaining background test data using a test routine to measure the leakage current for a set of test devices as a function of a parameter associated with device speed for the device under test. From the test data, a leakage threshold function is defined that correlates leakage current with the parameter associated with device speed. The test routine and the leakage threshold function are then input into an automated testing apparatus configured to execute the test on production or other devices. Devices are tested to determine leakage current over a range of parameter values associated with device speed. The devices are then screened using the leakage threshold function to determine the status of the device.