Abstract: A light-emitting display device includes a display panel including a high-potential power voltage line and a low-potential power voltage line and provided with a plurality of pixels each including a driving transistor and an organic light-emitting diode, a timing controller configured to generate N (N being a natural number) sensing images depending on a size of accumulated image data by accumulating image data for each pixel, and to display the display panel of data of at least one sensing image of the N sensing images on the display panel and to obtain an amount of degradation of organic light-emitting diodes in a sensing mode, and a degradation sensing unit configured to estimate the amount of degradation of the organic light-emitting diodes by sensing an electrical physical quantity for each panel or for each region in a panel in a state in which the at least one sensing image is displayed on the display panel, and to provide the amount of degradation of the organic light-emitting diodes to the timing con

Abstract: A light-emitting display device includes a display panel including a high-potential power voltage line and a low-potential power voltage line and provided with a plurality of pixels each including a driving transistor and an organic light-emitting diode, a timing controller configured to generate N (N being a natural number) sensing images depending on a size of accumulated image data by accumulating image data for each pixel, and to display the display panel of data of at least one sensing image of the N sensing images on the display panel and to obtain an amount of degradation of organic light-emitting diodes in a sensing mode, and a degradation sensing unit configured to estimate the amount of degradation of the organic light-emitting diodes by sensing an electrical physical quantity for each panel or for each region in a panel in a state in which the at least one sensing image is displayed on the display panel, and to provide the amount of degradation of the organic light-emitting diodes to the timing con

Abstract: A light-emitting display device includes a display panel including a high-potential power voltage line and a low-potential power voltage line and provided with a plurality of pixels each including a driving transistor and an organic light-emitting diode, a timing controller configured to generate N (N being a natural number) sensing images depending on a size of accumulated image data by accumulating image data for each pixel, and to display the display panel of data of at least one sensing image of the N sensing images on the display panel and to obtain an amount of degradation of organic light-emitting diodes in a sensing mode, and a degradation sensing unit configured to estimate the amount of degradation of the organic light-emitting diodes by sensing an electrical physical quantity for each panel or for each region in a panel in a state in which the at least one sensing image is displayed on the display panel, and to provide the amount of degradation of the organic light-emitting diodes to the timing con

Abstract: A light-emitting display device includes a display panel including a high-potential power voltage line and a low-potential power voltage line and provided with a plurality of pixels each including a driving transistor and an organic light-emitting diode, a timing controller configured to generate N (N being a natural number) sensing images depending on a size of accumulated image data by accumulating image data for each pixel, and to display the display panel of data of at least one sensing image of the N sensing images on the display panel and to obtain an amount of degradation of organic light-emitting diodes in a sensing mode, and a degradation sensing unit configured to estimate the amount of degradation of the organic light-emitting diodes by sensing an electrical physical quantity for each panel or for each region in a panel in a state in which the at least one sensing image is displayed on the display panel, and to provide the amount of degradation of the organic light-emitting diodes to the timing con

Abstract: An organic light emitting diode display device includes a display portion including a substrate, and an organic light emitting diode on the substrate; and an electromagnetic induction sensor portion attached to a bottom of the display portion, wherein the electromagnetic induction sensor portion includes: a back plate; a protection layer covering a bottom of the back plate; and a loop antenna pattern on at least one of top and bottom surfaces of the back plate.

Abstract: A touch input system and a touch detection method using the same are disclosed. With the disclosed touch input system, the size and manufacturing costs of the stylus are reduced while finger touch and touch of stylus without a battery are distinguished and detected. The touch input system includes a sensor panel including a plurality of first channels and a plurality of second channels, crossing each other, a stylus including one or a plurality of primary coils connected in series to each other, a resonance capacitor connected in parallel to the primary coil, and a conductive tip connected to the primary coil, a ground connected to the stylus, an antenna loop formed outside an edge of the sensor panel, and a touch controller connected to the first channel, the second channel, and the antenna loop.

Abstract: An input system and a method for detecting touch using the same are provided. An input system includes: a sensor panel including first and second channels crossing each other, a stylus pen including: a first coil and a second coil divided from each other, a resonance capacitor and a switch serially connected to the second coil, and a conductive tip connected to the first coil, a stylus ground connected to the stylus pen, an antenna loop formed in an outer region of the sensor panel, and a touch controller connected to the first and second channels and the antenna loop.

Abstract: A touch input system and a touch detection method using the same are disclosed. With the disclosed touch input system, the size and manufacturing costs of the stylus are reduced while finger touch and touch of stylus without a battery are distinguished and detected. The touch input system includes a sensor panel including a plurality of first channels and a plurality of second channels, crossing each other, a stylus including one or a plurality of primary coils connected in series to each other, a resonance capacitor connected in parallel to the primary coil, and a conductive tip connected to the primary coil, a ground connected to the stylus, an antenna loop formed outside an edge of the sensor panel, and a touch controller connected to the first channel, the second channel, and the antenna loop.

Abstract: An organic light emitting diode display device includes a display portion including a substrate, and an organic light emitting diode on the substrate; and an electromagnetic induction sensor portion attached to a bottom of the display portion, wherein the electromagnetic induction sensor portion includes: a back plate; a protection layer covering a bottom of the back plate; and a loop antenna pattern on at least one of top and bottom surfaces of the back plate.

Abstract: An input system and a method for detecting touch using the same are provided. An input system includes: a sensor panel including first and second channels crossing each other, a stylus pen including: a first coil and a second coil divided from each other, a resonance capacitor and a switch serially connected to the second coil, and a conductive tip connected to the first coil, a stylus ground connected to the stylus pen, an antenna loop formed in an outer region of the sensor panel, and a touch controller connected to the first and second channels and the antenna loop.

Abstract: A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern includes a capacitor connected to a stress voltage. The stress voltage is applied to the capacitor and the current flowing from the capacitor is measured over time. The dielectric in the capacitor breaks down over time and at a certain point, the current from the capacitor changes suddenly. Unfortunately, the convention test pattern circuit requires serial testing of each unit cell, and therefore, the measuring time is significant when there are many unit cells involved. The circuit allows for the measurements to take place simultaneously for all unit cells within the test pattern circuit.

Abstract: A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern includes a capacitor connected to a stress voltage. The stress voltage is applied to the capacitor and the current flowing from the capacitor is measured over time. The dielectric in the capacitor breaks down over time and at a certain point, the current from the capacitor changes suddenly. Unfortunately, the convention test pattern circuit requires serial testing of each unit cell, and therefore, the measuring time is significant when there are many unit cells involved. The circuit allows for the measurements to take place simultaneously for all unit cells within the test pattern circuit.

Abstract: A semiconductor device and method of manufacturing the semiconductor device including a semiconductor substrate of a first conductivity type. A scribe lane area formed in the substrate to define chip formation areas. A deep well area formed in each chip formation area. The deep well area has a second conductivity type which is opposite the first conductivity type. Also, at least one well area is formed within the deep well area.

Abstract: A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern includes a capacitor connected to a stress voltage. The stress voltage is applied to the capacitor and the current flowing from the capacitor is measured over time. The dielectric in the capacitor breaks down over time and at a certain point, the current from the capacitor changes suddenly. Unfortunately, the convention test pattern circuit requires serial testing of each unit cell, and therefore, the measuring time is significant when there are many unit cells involved. The circuit allows for the measurements to take place simultaneously for all unit cells within the test pattern circuit.

Abstract: A semiconductor device and method of manufacturing the semiconductor device including a semiconductor substrate of a first conductivity type. A scribe lane area formed in the substrate to define chip formation areas. A deep well area formed in each chip formation area. The deep well area has a second conductivity type which is opposite the first conductivity type. Also, at least one well area is formed within the deep well area.

Abstract: A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern includes a capacitor connected to a stress voltage. The stress voltage is applied to the capacitor and the current flowing from the capacitor is measured over time. The dielectric in the capacitor breaks down over time and at a certain point, the current from the capacitor changes suddenly. Unfortunately, the convention test pattern circuit requires serial testing of each unit cell, and therefore, the measuring time is significant when there are many unit cells involved. The circuit allows for the measurements to take place simultaneously for all unit cells within the test pattern circuit.

Abstract: A semiconductor device and method of manufacturing the semiconductor device including a semiconductor substrate of a first conductivity type. A scribe lane area formed in the substrate to define chip formation areas. A deep well area formed in each chip formation area. The deep well area has a second conductivity type which is opposite the first conductivity type. Also, at least one well area is formed within the deep well area.

Abstract: A method for manufacturing a transistor of a double spacer structure is disclosed, in which a local LDD region is formed by forming a transistor including a gate electrode, and an oxide film spacer and a nitride film spacer formed sequentially, dry etching the oxide film spacer using the nitride film spacer as a mask, and injecting an impurity ion into an LDD region of a portion where the oxide film spacer is etched, short channel effect is prevented and current characteristic of the transistor is improved by combination of the ion injection process considering trade-off relation between the short channel effect and the current characteristic of the transistor during design of a device.

Abstract: A method for manufacturing a transistor of a double spacer structure is disclosed, in which a local LDD region is formed by forming a transistor including a gate electrode, and an oxide film spacer and a nitride film spacer formed sequentially, dry etching the oxide film spacer using the nitride film spacer as a mask, and injecting an impurity ion into an LDD region of a portion where the oxide film spacer is etched, short channel effect is prevented and current characteristic of the transistor is improved by combination of the ion injection process considering trade-off relation between the short channel effect and the current characteristic of the transistor during design of a device.

Abstract: A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern includes a capacitor connected to a stress voltage. The stress voltage is applied to the capacitor and the current flowing from the capacitor is measured over time. The dielectric in the capacitor breaks down over time and at a certain point, the current from the capacitor changes suddenly. Unfortunately, the convention test pattern circuit requires serial testing of each unit cell, and therefore, the measuring time is significant when there are many unit cells involved. The circuit allows for the measurements to take place simultaneously for all unit cells within the test pattern circuit.