Abstract: An integrated circuit and method are provided for accurately measuring the temperature of a die of the integrated circuit. Pairs of diodes are driven with different currents in order to generate a series of thermal voltages. The ADC measures the series of thermal voltages against an external reference voltage. Based on these thermal voltage measurements, the ADC calculates the die temperature. The different currents used to generate the series of thermal voltages are selected at specific ratios to each other in order to promote the ability of the ability of the ADC to calculate the die temperature using standard components and logic of an ADC. These thermal voltages are generated and measured using integrated components of the die for which a temperature measurement is being provided, thus reducing several sources of inaccuracies in conventional die temperature measurement techniques. Addition embodiments are provided for detecting defective diodes based on comparisons of the thermal voltage outputs.

Abstract: An integrated circuit and method are provided for accurately measuring the temperature of a die of the integrated circuit. Pairs of diodes are driven with different currents in order to generate a series of thermal voltages. The ADC measures the series of thermal voltages against an external reference voltage. Based on these thermal voltage measurements, the ADC calculates the die temperature. The different currents used to generate the series of thermal voltages are selected at specific ratios to each other in order to promote the ability of the ability of the ADC to calculate the die temperature using standard components and logic of an ADC. These thermal voltages are generated and measured using integrated components of the die for which a temperature measurement is being provided, thus reducing several sources of inaccuracies in conventional die temperature measurement techniques. Addition embodiments are provided for detecting defective diodes based on comparisons of the thermal voltage outputs.

Abstract: A system including an integrated circuit chip also includes a microcontroller in the chip and an algorithm for execution by the microcontroller. The algorithm includes addition, subtraction, and multiplication operators (e.g. 25,15,20) and shift-left and shift-right operators (e.g., 48,21) configured for solving particular equations (Eqns. 1-4). Input numbers are within particular ranges to allow the shift operators to shift binary bits so each number so it fits within a register of a particular width. An IR sensor (4) may convert IR radiation (3) to produce a voltage (Vobj) representing the temperature (Tobj) of an IR emitting object (2). The algorithm (100) operates in conjunction with the microcontroller (7) to convert the voltage (Vobj) into a value representing the temperature (Tobj) of the remote object (2) without keeping track of decimal points and resolution of the numbers.

Abstract: A heat sensor has the ability to correct for errors introduced during temperature changes of the hot junction of the thermopile for the heat sensor. For example, the effect of temperature changes at the hot junction of the heat sensor relative to the cold junction is mathematically modeled such that the effect on the temperature determination can be corrected given certain information relating to the thermopile, its electrical output, and the temperature history and current temperature of the cold junction. By accounting for these factors, a processing device can modify the temperature determination output for the heat sensor while correcting for error introduced by temperature changes at the hot junction as determined by the mathematical model.

Abstract: A system including an integrated circuit chip also includes a microcontroller in the chip and an algorithm for execution by the microcontroller. The algorithm includes addition, subtraction, and multiplication operators (e.g. 25,15,20) and shift-left and shift-right operators (e.g., 48,21) configured for solving particular equations (Eqns. 1-4). Input numbers are within particular ranges to allow the shift operators to shift binary bits so each number so it fits within a register of a particular width. An IR sensor (4) may convert IR radiation (3) to produce a voltage (Vobj) representing the temperature (Tobj) of an IR emitting object (2). The algorithm (100) operates in conjunction with the microcontroller (7) to convert the voltage (Vobj) into a value representing the temperature (Tobj) of the remote object (2) without keeping track of decimal points and resolution of the numbers.

Abstract: A heat sensor has the ability to correct for errors introduced during temperature changes of the hot junction of the thermopile for the heat sensor. For example, the effect of temperature changes at the hot junction of the heat sensor relative to the cold junction is mathematically modeled such that the effect on the temperature determination can be corrected given certain information relating to the thermopile, its electrical output, and the temperature history and current temperature of the cold junction. By accounting for these factors, a processing device can modify the temperature determination output for the heat sensor while correcting for error introduced by temperature changes at the hot junction as determined by the mathematical model.