Patents by Inventor Hac Ju Lee

Hac Ju Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for fabricating probe tip
    Patent number: 8287745
    Abstract: Disclosed is a method for fabricating a probe tip, capable of preventing a rapid increase of a surface size of a front end of the probe tip as the probe tip is worn out by a frequent contact with a wafer chip and, also, capable of improving the precision of the front end of the probe tip. The method for fabricating a probe tip includes forming a front end of the probe tip on a silicon wafer; forming a first protective layer which is patterned to expose a part of the front end of the probe tip; and forming a body of the probe tip in a portion opened by the pattern of the first protective layer.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: October 16, 2012
    Assignee: M2N Inc.
    Inventors: Ki Pil Hong, Jong Hyeon Chae, Hac Ju Lee
  • Method For Fabricating Probe Tip
    Publication number: 20100163518
    Abstract: Disclosed is a method for fabricating a probe tip, capable of preventing a rapid increase of a surface size of a front end of the probe tip as the probe tip is worn out by a frequent contact with a wafer chip and, also, capable of improving the precision of the front end of the probe tip. The method for fabricating a probe tip includes forming a front end of the probe tip on a silicon wafer; forming a first protective layer which is patterned to expose a part of the front end of the probe tip; and forming a body of the probe tip in a portion opened by the pattern of the first protective layer.
    Type: Application
    Filed: May 29, 2008
    Publication date: July 1, 2010
    Applicant: M2N INC.
    Inventors: Ki Pil Hong, Jong Hyeon Chae, Hac Ju Lee
  • PROBE AND METHOD FOR MANUFACTURING THE SAME
    Publication number: 20100134126
    Abstract: A probe for making electric contact with a contact target includes a first part (10) including a first base portion (15) and a socket portion (17) formed on the first base portion; and a second part including (20) a second base portion (25) and a plug portion (21) formed on the second base portion. And the plug portion is removably coupled to the socket portion.
    Type: Application
    Filed: March 31, 2005
    Publication date: June 3, 2010
    Applicants: M2N, INC., SECRON CO., LTD.
    Inventors: Ki-Pil Hong, Jong-Hyeon Chae, Hac-Ju Lee, Young-Gun Park