Patents by Inventor Hadar Mazaki

Hadar Mazaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Cleaning an object within a non-vacuumed environment
    Patent number: 9488924
    Abstract: A system that may include a mechanical stage that is arranged to move an object along a predetermined path in relation to an optical module during an illumination of the object by the optical module; a structural support element that is arranged to support at least a part of the optical module; a gas flow module that is arranged to direct clean gas towards the object through gas flow module openings that define a coverage area that is (a) bigger than the object and (b) is positioned directly above at least a majority of the object when the object is positioned anywhere along the predetermined path.
    Type: Grant
    Filed: January 7, 2014
    Date of Patent: November 8, 2016
    Assignee: Applied Materials Israel Ltd.
    Inventors: Mariano Abramson, Hadar Mazaki, Erez Admoni, Israel Avneri
  • CLEANING AN OBJECT WITHIN A NON-VACUUMED ENVIRONMENT
    Publication number: 20150192868
    Abstract: A system that may include a mechanical stage that is arranged to move an object along a predetermined path in relation to an optical module during an illumination of the object by the optical module; a structural support element that is arranged to support at least a part of the optical module; a gas flow module that is arranged to direct clean gas towards the object through gas flow module openings that define a coverage area that is (a) bigger than the object and (b) is positioned directly above at least a majority of the object when the object is positioned anywhere along the predetermined path.
    Type: Application
    Filed: January 7, 2014
    Publication date: July 9, 2015
    Applicant: APPLIED MATERIALS ISRAEL, LTD.
    Inventors: Mariano Abramson, Hadar Mazaki, Erez Admoni, Israel Avneri
  • Variable angle illumination wafer inspection system
    Patent number: 6853446
    Abstract: A variable illumination angle inspection system is provided, including a light source providing a light beam and a scanner imparting scanning deflection to the light beam to provide a scanning beam approaching a substrate at a first angle. A deflection element is selectively insertable into an optical path of the scanning beam to deflect the scanning beam so as to cause the scanning beam to approach the substrate at a second angle.
    Type: Grant
    Filed: August 16, 2000
    Date of Patent: February 8, 2005
    Assignee: Applied Materials, Inc.
    Inventors: Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Boris Goldberg, Daniel I. Some