Patents by Inventor Hae-Young Jeong
Hae-Young Jeong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240109350Abstract: The present disclosure relates to a portable printer including a main body in a portable form which is capable of accommodating a cartridge having a nozzle for delivering a printing material to a target having a soft or hard surface, a seating part which is provided to be exposed to an outside from a lower portion of the main body to face the surface of the target and at least partially surrounds the nozzle, a roller provided respectively at the front and rear of the nozzle at the lower portion of the main body with respect to a direction in which the main body moves along the surface of the target to deliver the printing material to the target, and a printing adjustment unit configured to adjust a height difference between the nozzle and the roller to adjust a height difference between the nozzle and the surface of the target.Type: ApplicationFiled: October 20, 2022Publication date: April 4, 2024Applicant: LG HOUSEHOLD & HEALTH CARE LTD.Inventors: Chang Hwan HYUN, Ji Hee LEE, Kang Ug LEE, Sung Hyoun JANG, Hyeon Jin KWEON, Hae Na CHEONG, Ji Hee JEONG, Jung Yong LEE, Ha Young KIM
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Publication number: 20240111695Abstract: A memory device of a memory module includes a CA buffer that receives a command/address (CA) signal through a bus shared by a memory device different from the memory device of the memory module, and a calibration logic circuit that identifies location information of the memory device on the bus. The memory device recognizes its own location on a bus in a memory module to perform self-calibration, and thus, the memory device appropriately operates even under an operation condition varying depending on a location in the memory module.Type: ApplicationFiled: December 13, 2023Publication date: April 4, 2024Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Heon Su JEONG, Hangi Jung, Wangsoo Kim, Hae Young Chung
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Patent number: 11949881Abstract: The present invention discloses an encoding apparatus using a Discrete Cosine Transform (DCT) scanning, which includes a mode selection means for selecting an optimal mode for intra prediction; an intra prediction means for performing intra prediction onto video inputted based on the mode selected in the mode selection means; a DCT and quantization means for performing DCT and quantization onto residual coefficients of a block outputted from the intra prediction means; and an entropy encoding means for performing entropy encoding onto DCT coefficients acquired from the DCT and quantization by using a scanning mode decided based on pixel similarity of the residual coefficients.Type: GrantFiled: April 1, 2021Date of Patent: April 2, 2024Assignees: Electronics and Telecommunications Research Institute, Kwangwoon University Research Institute for Industry Cooperation, Industry-Academia Cooperation Group of Sejong UniversityInventors: Se-Yoon Jeong, Hae-Chul Choi, Jeong-Il Seo, Seung-Kwon Beack, In-Seon Jang, Jae-Gon Kim, Kyung-Ae Moon, Dae-Young Jang, Jin-Woo Hong, Jin-Woong Kim, Yung-Lyul Lee, Dong-Gyu Sim, Seoung-Jun Oh, Chang-Beom Ahn, Dae-Yeon Kim, Dong-Kyun Kim
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Publication number: 20240092913Abstract: The present disclosure relates to an isolated anti-FcRN antibody, which is an antibody binding to FcRN (stands for neonatal Fc receptor, also called FcRP, FcRB or Brambell receptor) that is a receptor with a high affinity for IgG or a fragment thereof, a method of preparing thereof, a composition for treating autoimmune disease, which comprises the antibody, and a method of treating and diagnosing autoimmunre diseases using the antibody. The FcRn-specific antibody according to the present disclosure binds to FcRn non-competitively with IgG to reduce serum pathogenic auto-antibody levels, and thus can be used for the treatment of autoimmune diseases.Type: ApplicationFiled: November 17, 2023Publication date: March 21, 2024Applicant: HANALL BIOPHARMA CO., LTD.Inventors: Sung Wuk KIM, Seung Kook PARK, Jae Kap JEONG, Hyea Kyung AHN, Min Sun KIM, Eun Sun KIM, Hae-Young YONG, Dongok SHIN, Yeon Jung SONG, Tae Hyoung YOO
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Publication number: 20230415140Abstract: Provided is a catalytic activity recovery method of a manganese oxide catalyst, an air-cleaning device using the same, air-cleaning system including the air-cleaning device, and an operation method of air-cleaning device by using the manganese oxide catalyst. The catalytic activity recovery method of a manganese oxide catalyst includes recovering the initial activity of a manganese Ni oxide catalyst by heating a manganese oxide catalyst which has been used to decompose ozone and of which activity is thus reduced by 10% or more compared to the initial ozone decomposition efficiency thereof, at the temperature of 80° C. to 250° C.Type: ApplicationFiled: November 12, 2020Publication date: December 28, 2023Applicant: PURESPACE INC.Inventors: Jeong Se YUN, Jae Sung LEE, Hae Young JEONG, Sun Young LEE
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Publication number: 20230415128Abstract: Provided are an air-cleaning device and method for reducing harmful gas including ethylene and harmful microorganisms, and an air-cleaning system including the air-cleaning device.Type: ApplicationFiled: November 12, 2020Publication date: December 28, 2023Applicant: PURESPACE INC.Inventors: Jeong Se YUN, Jae Sung LEE, Hae Young JEONG, Sun Young LEE
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Publication number: 20170031240Abstract: Apparatuses for attaching pellicle may be provided. For example, a pellicle attaching apparatus includes a lower supporter supporting a lower surface of a pellicle, an upper supporter supporting an upper surface of a reticle such that a lower surface of the reticle is in contact with a pellicle frame disposed on an upper surface of the pellicle, and a first sound wave generator disposed on the upper surface of the reticle to irradiate ultrasonic waves onto the upper surface of the reticle.Type: ApplicationFiled: April 1, 2016Publication date: February 2, 2017Inventor: HAE-YOUNG JEONG
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Patent number: 7989123Abstract: A photomask includes an ion trapping layer and a method of manufacturing a semiconductor device uses the photomask. The photomask includes a transparent substrate and an ion trapping layer formed on a first region of the transparent substrate to trap ions present near the transparent substrate. In manufacturing a semiconductor device, a photosensitive film formed on a substrate is exposed through the photomask in which the ion trapping layer is formed on the transparent substrate, and the substrate is processed using the photosensitive film obtained as the result of the exposure.Type: GrantFiled: June 17, 2009Date of Patent: August 2, 2011Assignee: Samsung Electronics Co., Ltd.Inventors: Han-shin Lee, Jae-hyuck Choi, Hae-young Jeong, Hyung-ho Ko, Jin-sik Jung, Jong-keun Oh, Soo-jung Kang
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Patent number: 7842916Abstract: A method of analyzing ions adsorbed on a surface of a mask for pattern formation of a semiconductor device, and an apparatus using the same are disclosed. The ion analyzing method includes: filling a heating container within a main chamber with a predetermined amount of a solvent; immersing a mask in the solvent-filled heating container; raising an internal pressure of the chamber to a predetermined level by supplying gas into the chamber; separating ions from a surface of the mask by heating the solvent within the heating container at a predetermined temperature for a predetermined period; and analyzing the ions by collecting the solvent.Type: GrantFiled: August 22, 2008Date of Patent: November 30, 2010Assignee: Samsung Electronics Co., Ltd.Inventors: Dong-Hun Lee, Hae-Young Jeong, Byung-Cheol Cha, Sung-Jae Han
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Patent number: 7803506Abstract: A method of measuring a critical dimension may include forming an object pattern on a substrate and forming a plurality of reference patterns on the substrate, wherein each of the plurality of reference patterns has a different critical dimension. An optical property of each of the plurality of reference patterns may be measured to provide a respective measured optical property for each of the reference patterns, and an optical property of the object pattern may be measured to provide a measured optical property of the object pattern. The measured optical property of the object pattern may be compared with the measured optical properties of the reference patterns, and a critical dimension of the object pattern may be determined as being the same as the critical dimension of the reference pattern having the measured optical property that is closest to the measured optical property of the object pattern. Related devices are also discussed.Type: GrantFiled: June 13, 2007Date of Patent: September 28, 2010Assignee: Samsung Electronics Co., Ltd.Inventors: Kyoung-Yoon Bang, Hae-Young Jeong, Yong-Hoon Kim, Yo-Han Choi, Hyung-Joo Lee
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Publication number: 20100068631Abstract: A photomask includes an ion trapping layer and a method of manufacturing a semiconductor device uses the photomask. The photomask includes a transparent substrate and an ion trapping layer formed on a first region of the transparent substrate to trap ions present near the transparent substrate. In manufacturing a semiconductor device, a photosensitive film formed on a substrate is exposed through the photomask in which the ion trapping layer is formed on the transparent substrate, and the substrate is processed using the photosensitive film obtained as the result of the exposure.Type: ApplicationFiled: June 17, 2009Publication date: March 18, 2010Applicant: Samsung Electronics Co., Ltd.Inventors: Han-shin Lee, Jae-hyuck Choi, Hae-young Jeong, Hyung-ho Ko, Jin-sik Jung, Jong-keun Oh, Soo-jung Kang
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Patent number: 7601469Abstract: A plasma etching chamber of a plasma etching apparatus used in an etching process for manufacturing a photomask and a method for manufacturing a photomask using the same. The plasma etching chamber includes an electrode having a supporting surface for supporting a photomask substrate and a top surface surrounding the supporting surface, a heat transfer element installed along a peripheral edge of the supporting surface, and a heater for supplying heat to the heat transfer element. In the method for manufacturing a photomask, a shading layer is formed on a transparent substrate. A photoresist layer pattern is formed on the shading layer to partially expose the shading layer. The shading layer is etched to form a shading layer pattern, using plasma with the photoresist layer pattern as an etching mask, under a state in which the temperature of at least one portion of the peripheral edge of the transparent substrate is maintained higher than a temperature at a center of the transparent substrate.Type: GrantFiled: June 5, 2007Date of Patent: October 13, 2009Assignee: Samsung Electronics Co., Ltd.Inventors: Jeong-Yun Lee, Jin-Min Kim, Hae-Young Jeong, Young-Hwa No, Sang-Joon Yoon, Sung-Yong Cho
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Publication number: 20090191471Abstract: A composition for cleaning a phase shift mask, including an organic acid ammonium salt, wherein a base ionization constant (Kb) of organic acid ions is larger than an acid ionization constant (Ka) of ammonium ions, hydrogen peroxide, and water, and associated methods.Type: ApplicationFiled: December 30, 2008Publication date: July 30, 2009Inventors: Dong-Hun Lee, Hae-Young Jeong, Sung-Jae Han, Han-Shin Lee
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Publication number: 20090101811Abstract: A method of analyzing ions adsorbed on a surface of a mask for pattern formation of a semiconductor device, and an apparatus using the same are disclosed. The ion analyzing method includes: filling a heating container within a main chamber with a predetermined amount of a solvent; immersing a mask in the solvent-filled heating container; raising an internal pressure of the chamber to a predetermined level by supplying gas into the chamber; separating ions from a surface of the mask by heating the solvent within the heating container at a predetermined temperature for a predetermined period; and analyzing the ions by collecting the solvent.Type: ApplicationFiled: August 22, 2008Publication date: April 23, 2009Applicant: Samsung Electronics Co., Ltd.Inventors: Dong-Hun Lee, Hae-Young Jeong, Byung-Cheol Cha, Sung-Jae Han
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Publication number: 20070292778Abstract: A method of measuring a critical dimension may include forming an object pattern on a substrate and forming a plurality of reference patterns on the substrate, wherein each of the plurality of reference patterns has a different critical dimension. An optical property of each of the plurality of reference patterns may be measured to provide a respective measured optical property for each of the reference patterns, and an optical property of the object pattern may be measured to provide a measured optical property of the object pattern. The measured optical property of the object pattern may be compared with the measured optical properties of the reference patterns, and a critical dimension of the object pattern may be determined as being the same as the critical dimension of the reference pattern having the measured optical property that is closest to the measured optical property of the object pattern. Related devices are also discussed.Type: ApplicationFiled: June 13, 2007Publication date: December 20, 2007Inventors: Kyoung-Yoon Bang, Hae-Young Jeong, Yong-Hoon Kim, Yo-Han Choi, Hyung-Joo Lee
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Publication number: 20070231716Abstract: A plasma etching chamber of a plasma etching apparatus used in an etching process for manufacturing a photomask and a method for manufacturing a photomask using the same. The plasma etching chamber includes an electrode having a supporting surface for supporting a photomask substrate and a top surface surrounding the supporting surface, a heat transfer element installed along a peripheral edge of the supporting surface, and a heater for supplying heat to the heat transfer element. In the method for manufacturing a photomask, a shading layer is formed on a transparent substrate. A photoresist layer pattern is formed on the shading layer to partially expose the shading layer. The shading layer is etched to form a shading layer pattern, using plasma with the photoresist layer pattern as an etching mask, under a state in which the temperature of at least one portion of the peripheral edge of the transparent substrate is maintained higher than a temperature at a center of the transparent substrate.Type: ApplicationFiled: June 5, 2007Publication date: October 4, 2007Applicant: SAMSUNG ELECTRONICS CO., LTDInventors: Jeong-Yun LEE, Jin-Min KIM, Hae-Young JEONG, Young-Hwa NO, Sang-Joon YOON, Sung-Yong CHO
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Patent number: 7053262Abstract: The mammary gland-specific expression systems developed by the present inventors, named pGbc, pGbc_L and pGbc_S were deposited under the Budapest Treaty on the International Recognition of the Deposit of Microorganisms for the Purpose of Patent Procedure in the Korean Collection for Type Cultures (KCTC), Korean Research Institute of Bioscience and Biotechnology at 52, Oun-dong, Yusong-Ku, Taejon 305–333, Republic of Korea, on Aug. 17, 1998, and the accession deposit Nos. KCTC 0515BP, 0514BP and 0513BP were issued, respectively. All restructions on the availability to the public of the deposited materials will be irrevocably removed upon the granting of a patent.Type: GrantFiled: January 17, 2003Date of Patent: May 30, 2006Assignee: Hanmi Pharm Co., Ltd.Inventors: Ook Joon Yoo, Kyung Kwang Lee, Young Mahn Han, Sun Jung Kim, Hae Young Jeong, Jung Ho Ko, Won Jun Oh
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Patent number: 6980284Abstract: A condensation particle counter measures the number of ultra-fine particles by growing the ultra-fine particles through a condensing process. The counter includes a capillary in which vapor of operating liquid is condensed and the ultra-fine particles grow. An insulating material surrounds the capillary to shut out heat flow between the capillary and the environment. The condensation particle counter can use various operating liquids including alcohol and water, and can be also applied to semiconductor clean rooms.Type: GrantFiled: September 20, 2001Date of Patent: December 27, 2005Assignee: Hyundai Calibration & Certification Technologies Co., Ltd.Inventors: Kang-Ho Ahn, Sang-Soo Kim, Hae-Young Jeong
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Publication number: 20040012772Abstract: Provided is a condensation particle counter. The condensation particle counter measures the number of ultra-fine particles by growing the ultra-fine particles through a condensing process. The counter comprises a capillary in which vapor of operating liquid is condensed and the ultra-fine particles grow. An insulating material surrounds the capillary to shut out heat flow between the capillary and the environment. The condensation particle counter according to the present invention can use various operating liquids including alcohol and water, and can be also applied to semiconductor clean rooms.Type: ApplicationFiled: March 24, 2003Publication date: January 22, 2004Inventors: Kang-Ho Ahn, Sang-Soo Kim, Hae-Young Jeong
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Patent number: 6635474Abstract: There are disclosed mammary gland tissue-specific expression systems using the promoter site for the &bgr;-casein gene of Korean native goats, by use of which physiological activating substances can be produced. In each of the expression systems, that is, novel plasmids pGbc, pGbc_L and pGbc_S (deposition Nos. KCTC 0515BP, 0514BP and 0513BP, respectively), a &bgr;-casein gene expression-regulating region, a physiological activating substance gene and a termination-regulating region are linked. Human granulocyte colony stimulating factor (hG-CSF) or human granulocyte macrophage colony stimulating factor (hGM-CSF) can be produced in HC11 cells, a mouse mammary gland tissue-derived cell line, and in the milk secreted from the transgenic mice by use of a hG-CSF or hGM-CSF gene-carrying pGbc, pGbc_L or pGbc_S in transfection into cell and microinjection to mouse. The proteins are those which experience the posttranslational modification and maintain their normal activity in the human body.Type: GrantFiled: November 14, 2000Date of Patent: October 21, 2003Assignee: Hanmi Pharm Co., LtdInventors: Ook Joon Yoo, Kyung Kwang Lee, Young Mahn Han, Sun Jung Kim, Hae Young Jeong, Jung Ho Ko, Won Jun Oh