Abstract: A system-on-chip (SOC) having built-in-self-test (BIST) circuits and a self-test method of the SOC are provided. The SOC having the BIST circuits includes intellectual property (IP) blocks having BIST logic circuits and a BIST control unit. The BIST logic circuit operates in a normal or a test mode in response to control data received through a system bus, and outputs test result data in the test mode. The BIST control unit tests the IP blocks by transferring the control data, a command signal, test pattern data, and test address signals to the BIST logic circuit through the system bus, and compresses and stores the test result data received through the system bus in the test mode.

Abstract: A system-on-chip (SOC) having built-in-self-test (BIST) circuits and a self-test method of the SOC are provided. The SOC having the BIST circuits includes intellectual property (IP) blocks having BIST logic circuits and a BIST control unit. The BIST logic circuit operates in a normal or a test mode in response to control data received through a system bus, and outputs test result data in the test mode. The BIST control unit tests the IP blocks by transferring the control data, a command signal, test pattern data, and test address signals to the BIST logic circuit through the system bus, and compresses and stores the test result data received through the system bus in the test mode.

Abstract: A system-on-chip (SOC) having built-in-self-test (BIST) circuits and a self-test method of the SOC are provided. The SOC having the BIST circuits includes intellectual property (IP) blocks having BIST logic circuits and a BIST control unit. The BIST logic circuit operates in a normal or a test mode in response to control data received through a system bus, and outputs test result data in the test mode. The BIST control unit tests the IP blocks by transferring the control data, a command signal, test pattern data, and test address signals to the BIST logic circuit through the system bus, and compresses and stores the test result data received through the system bus in the test mode.

Abstract: A bus system including a bus arbiter and a plurality of masters. The bus arbiter grants bus control to one of the plurality of masters. When a master with bus control sends a read command, bus control is transferred to another one of the plurality of masters, thereby increasing the efficiency of the bus system. A method including sending a read command and transferring bus control to another one of a plurality of masters before receiving the response to the read command.

Abstract: A bus system including a bus arbiter and a plurality of masters. The bus arbiter grants bus control to one of the plurality of masters. When a master with bus control sends a read command, bus control is transferred to another one of the plurality of masters, thereby increasing the efficiency of the bus system. A method including sending a read command and transferring bus control to another one of a plurality of masters before receiving the response to the read command.

Abstract: A system-on-chip (SOC) having built-in-self-test (BIST) circuits and a self-test method of the SOC are provided. The SOC having the BIST circuits includes intellectual property (IP) blocks having BIST logic circuits and a BIST control unit. The BIST logic circuit operates in a normal or a test mode in response to control data received through a system bus, and outputs test result data in the test mode. The BIST control unit tests the IP blocks by transferring the control data, a command signal, test pattern data, and test address signals to the BIST logic circuit through the system bus, and compresses and stores the test result data received through the system bus in the test mode.

Abstract: A semiconductor memory device having a data line structure is disclosed which is capable of eliminating a noise interference between data lines and enhancing an integrity of a memory device. In the semiconductor memory device, a pair of data lines are not aligned on the identical plane. Namely, it is separated into an upper layer line and a lower layer line using an insulation film, wherein the data lines forming a plurality of pairs of the data lines are aligned in the upper wiring line and lower wiring line on a semiconductor substrate, and have at least one intersected portion therebetween.

Abstract: A circuit for reading data from a memory device reduces electric power consumption by recycling in a precharge period the charge consumed in a preceding sensing period. The circuit includes a pair of data lines set to a voltage level higher than a precharge voltage by the sensing operation of a pull-up amplifier, and a pair of data lines set to a voltage level lower than the precharge voltage by the sensing operation of a pull-down amplifier. The charge consumed in the sensing period is recycled by electrically connecting the two pairs of data lines, respectively, during a succeeding precharge period.