Patents by Inventor Haenam Jeon

Haenam Jeon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5691840
    Abstract: Described in this invention is a microscope that can examine a specimen of an anisotropic property regardless of the specimen being thin or thick, i.e., opaque or transparent. The video microscope includes a first light guide for a transmission method; a first polarizer for partially polarizing the light from the first light source, arranged beneath a stage on which a specimen is placed; a second light guide for reflection method; a second polarizer for partially polarizing the light from the second light source, provided in the second light guide; a lens assembly admitting the polarized light from the first or second polarizer and including an objective, an analyzer, and a compensating plate; a beam splitter for reflecting the polarized light from the second polarizer to an object provided in the lens assembly; a CCD mount in which CCD is provided, mounted on the lens assembly; and height and focus adjustment.
    Type: Grant
    Filed: November 8, 1995
    Date of Patent: November 25, 1997
    Assignee: Samsung Aerospace Industries, Ltd.
    Inventors: Jaewoo Bae, Haenam Jeon