Patents by Inventor Hagai Cohen
Hagai Cohen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12214322Abstract: A carbonation machine includes a rotatable carbonation head including at least one pressure release valve, a carbonation tube connectable via piping to a gas canister and a flange for engaging a neck of a bottle filled with liquid to be carbonated by screwing the neck into or onto the flange to firmly hold the bottle with the carbonation tube maintained inside the bottle, and for disengaging the neck of the bottle from the flange by unscrewing the neck off the flange. The rotatable carbonation head is configured, when screwing the neck into or onto the flange, to be rotated from a release position to a lock position, and is configured, when unscrewing the neck off the flange, to be rotated from the lock position to the release position. In the release position said at least one pressure release valve is operated to open so as to release excess pressure if such excess pressure exists in the bottle, and in the lock position said at least one pressure valve remains closed.Type: GrantFiled: June 7, 2021Date of Patent: February 4, 2025Assignee: Sodastream Industries Ltd.Inventors: Oren Shalev, Avi Cohen, Michael Bursak, Allan Ring, Hagai Harduff, Doron Krom, Eyal Shmueli, Michael Tsinzovsky
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Publication number: 20230288355Abstract: A measurement system and method are presented for measuring one or more parameters of a sample. The measurement system comprises an excitation system and a detection system. The excitation system is configured to generate combined exciting radiation comprising one- or multi-parameter modulation of multiple exciting signals of different types to be applied to at least a portion of a sample under measurements to thereby induce electron emission response of said at least portion of the sample to said combined exciting radiation. The detection system is configured for detecting the electron emission response of the at least portion of the sample and generating measured data indicative of a modulated change of an electrical state of the at least portion of the sample, thereby enabling determination of one or more parameters of the sample from the measured data.Type: ApplicationFiled: June 28, 2021Publication date: September 14, 2023Inventor: Hagai COHEN
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Publication number: 20230243766Abstract: A measurement system includes: an excitation system; a detector; and a control unit. The excitation system includes excitation sources generating excitations of different types comprising: a high energy electromagnetic radiation source; at least one electric power supply providing a bias voltage to a sample; and at least one electron beam source generating relatively low energy e-radiation in the form of an electron beam. The excitation system includes first and second sequentially performed measurement modes, for respectively, exciting the sample by the high energy radiation to induce a first-mode secondary electron emission spectral response, and supplying initial bias voltage to the sample and exciting the sample with the e-radiation followed by a gradual variation of the bias voltage from said initial bias voltage to induce a second-mode electric current variations in the sample.Type: ApplicationFiled: June 28, 2021Publication date: August 3, 2023Inventor: Hagai COHEN
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Patent number: 10800679Abstract: Provided is an electrode including conductive particles, which sediment under gravitational force and a liquid fluidizing medium flowing through the electrode, in which the conductive particles are suspended and optionally further including conductive particles, which do not sediment under gravitational force when the fluidizing medium flows in the electrode. Further provided are electrochemical devices and energy storage systems including the electrode.Type: GrantFiled: July 10, 2017Date of Patent: October 13, 2020Assignee: Technion Research and Development Foundation LimitedInventors: Hagai Cohen, Ilya Loiferman, Matthew Suss
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Publication number: 20190152811Abstract: Provided is an electrode including conductive particles, which sediment under gravitational force and a liquid fluidizing medium flowing through the electrode, in which the conductive particles are suspended and optionally further including conductive particles, which do not sediment under gravitational force when the fluidizing medium flows in the electrode. Further provided are electrochemical devices and energy storage systems including the electrode.Type: ApplicationFiled: July 10, 2017Publication date: May 23, 2019Applicant: Technion Research and Development Foundation LimitedInventors: Hagai COHEN, Ilya LOIFERMAN, Matthew SUSS
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Patent number: 9496067Abstract: A lubricating and shock absorbing materials are described, which are based on nanoparticles having the formula A1-x-Bx-chalcogenide. Processes for their manufacture are also described.Type: GrantFiled: March 10, 2011Date of Patent: November 15, 2016Assignee: YEDA RESEARCH AND DEVELOPMENT CO. LTD.Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
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Patent number: 8518364Abstract: A nanostructure, being either an Inorganic Fullerene-like (IF) nanostructure or an Inorganic Nanotube (INT), having the formula A1?x-Bx-chalcogenide are described. A being a metal or transition metal or an alloy of metals and/or transition metals, B being a metal or transition metal B different from that of A and x being ?0.3. A process for their manufacture and their use for modifying the electronic character of A-chalcogenide are described.Type: GrantFiled: November 7, 2012Date of Patent: August 27, 2013Assignee: Yeda Research and Development Company Ltd.Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
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Patent number: 8507853Abstract: The present invention relates to a novel system and method for the determination of depth profiling with improved accuracy and reliability. The method comprises obtaining spectroscopic data from the sample while under at least two different electrical conditions of the sample, the spectroscopic data comprising a signal of charged particles emitted from the sample, and being indicative of a change in amplitude, spectral position and spectral shape of the signal from the sample while under different electrical conditions of the sample, the change being indicative of the compositional profile and spatial distribution for at least one chemical element in the sample along a direction through the sample.Type: GrantFiled: October 22, 2009Date of Patent: August 13, 2013Assignee: Yeda Research and Development Company Ltd.Inventor: Hagai Cohen
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Publication number: 20120329686Abstract: A lubricating and shock absorbing materials are described, which are based on nanoparticles having the formula A1-x-Bx-chalcogenide. Processes for their manufacture are also described.Type: ApplicationFiled: March 10, 2011Publication date: December 27, 2012Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
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Patent number: 8329138Abstract: A nanostructure, being either an Inorganic Fullerene-like (IF) nanostructure or an Inorganic Nanotube (INT), having the formula A1?x-Bx-chalcogenide are described. A being a metal or transition metal or an alloy of metals and/or transition metals, B being a metal or transition metal B different from that of A and x being ?0.3. A process for their manufacture and their use for modifying the electronic character of A-chalcogenide are described.Type: GrantFiled: March 10, 2010Date of Patent: December 11, 2012Assignee: Yeda Research and Development Company Ltd.Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
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Publication number: 20110210246Abstract: The present invention relates to a novel system and method for the determination of depth profiling with improved accuracy and reliability. The method comprises obtaining spectroscopic data from the sample while under at least two different electrical conditions of the sample, the spectroscopic data comprising a signal of charged particles emitted from the sample, and being indicative of a change in amplitude, spectral position and spectral shape of the signal from the sample while under different electrical conditions of the sample, the change being indicative of the compositional profile and spatial distribution for at least one chemical element in the sample along a direction through the sample.Type: ApplicationFiled: October 22, 2009Publication date: September 1, 2011Applicant: YEDA RESEARCH AND DEVELOPMENT COMPANY LTD.Inventor: Hagai COHEN
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Publication number: 20100227782Abstract: A nanostructure, being either an Inorganic Fullerene-like (IF) nanostructure or an Inorganic Nanotube (INT), having the formula A1?x-Bx-chalcognide are described. A being a metal or transition metal or an alloy of metals and/or transition metals, B being a metal or transition metal B different from that of A and x being ?0.3. A process for their manufacture and their use for modifying the electronic character of A-chalcognide are described.Type: ApplicationFiled: March 10, 2010Publication date: September 9, 2010Applicant: YEDA RESEARCH AND DEVELOPMENT COMPANY LTD.Inventors: Reshef TENNE, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
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Patent number: 7148478Abstract: A method and device are presented for measuring the electrical properties of a specimen. The specimen is excited with high energy radiation to cause emission of internal charged particles from the specimen. Electrical power is supplied to a circuit, that is formed by the specimen and any added component connected to a back contact of the specimen. The electric power supply includes at least one of the following: irradiating the circuit with low energy charged particles; subjecting the circuit to an external field of the kind affecting the flux of emitted internal charged particles, and supplying a bias voltage to the back contact of the specimen. During the power supply to the specimen, at least one of the following is carried out: an electric current through the specimen is measured, and the emitted charged particles are analyzed versus their energy (using a contactless voltmeter) which provides local potential values at chemical entities of the specimen.Type: GrantFiled: November 15, 2004Date of Patent: December 12, 2006Assignee: Yeda Research and Development Company Ltd.Inventors: Hagai Cohen, Igor Lubomirsky
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Publication number: 20060103395Abstract: A method and device are presented for measuring the electrical properties of a specimen. The specimen is excited with high energy radiation to cause emission of internal charged particles from the specimen. Electrical power is supplied to a circuit, that is formed by the specimen and any added component connected to a back contact of the specimen. The electric power supply includes at least one of the following: irradiating the circuit with low energy charged particles; subjecting the circuit to an external field of the kind affecting the flux of emitted internal charged particles, and supplying a bias voltage to the back contact of the specimen. During the power supply to the specimen, at least one of the following is carried out: an electric current through the specimen is measured, and the emitted charged particles are analyzed versus their energy (using a contactless voltmeter) which provides local potential values at chemical entities of the specimen.Type: ApplicationFiled: November 15, 2004Publication date: May 18, 2006Inventors: Hagai Cohen, Igor Lubomirsky
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Patent number: 6720556Abstract: A method of examining a sample, including: performing a first spectroscopic analysis of a surface portion of the sample when the sample surface portion is in a first electrical charge state; placing the sample surface portion in a second electrical charge state that is different from the first electrical charge state and performing a second spectroscopic analysis of the surface portion of the sample when the sample surface portion is in the second electrical charge state; and comparing the first spectroscopic analysis result with the second spectroscopic analysis result to obtain at least one of structural and electrical information about the sample.Type: GrantFiled: May 3, 2001Date of Patent: April 13, 2004Assignee: Yeda Research and Development Co. Ltd.Inventors: Hagai Cohen, Israel Rubinstein
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Publication number: 20020020814Abstract: A method of examining a sample, including: performing a first spectroscopic analysis of a surface portion of the sample when the sample surface portion is in a first electrical charge state; placing the sample surface portion in a second electrical charge state that is different from the first electrical charge state and performing a second spectroscopic analysis of the surface portion of the sample when the sample surface portion is in the second electrical charge state; and comparing the first spectroscopic analysis result with the second spectroscopic analysis result to obtain at least one of structural and electrical information about the sample.Type: ApplicationFiled: May 3, 2001Publication date: February 21, 2002Inventors: Hagai Cohen, Israel Rubinstein