Patents by Inventor Hagai Cohen

Hagai Cohen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10800679
    Abstract: Provided is an electrode including conductive particles, which sediment under gravitational force and a liquid fluidizing medium flowing through the electrode, in which the conductive particles are suspended and optionally further including conductive particles, which do not sediment under gravitational force when the fluidizing medium flows in the electrode. Further provided are electrochemical devices and energy storage systems including the electrode.
    Type: Grant
    Filed: July 10, 2017
    Date of Patent: October 13, 2020
    Assignee: Technion Research and Development Foundation Limited
    Inventors: Hagai Cohen, Ilya Loiferman, Matthew Suss
  • Publication number: 20190152811
    Abstract: Provided is an electrode including conductive particles, which sediment under gravitational force and a liquid fluidizing medium flowing through the electrode, in which the conductive particles are suspended and optionally further including conductive particles, which do not sediment under gravitational force when the fluidizing medium flows in the electrode. Further provided are electrochemical devices and energy storage systems including the electrode.
    Type: Application
    Filed: July 10, 2017
    Publication date: May 23, 2019
    Applicant: Technion Research and Development Foundation Limited
    Inventors: Hagai COHEN, Ilya LOIFERMAN, Matthew SUSS
  • Patent number: 9496067
    Abstract: A lubricating and shock absorbing materials are described, which are based on nanoparticles having the formula A1-x-Bx-chalcogenide. Processes for their manufacture are also described.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: November 15, 2016
    Assignee: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
    Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
  • Patent number: 8518364
    Abstract: A nanostructure, being either an Inorganic Fullerene-like (IF) nanostructure or an Inorganic Nanotube (INT), having the formula A1?x-Bx-chalcogenide are described. A being a metal or transition metal or an alloy of metals and/or transition metals, B being a metal or transition metal B different from that of A and x being ?0.3. A process for their manufacture and their use for modifying the electronic character of A-chalcogenide are described.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: August 27, 2013
    Assignee: Yeda Research and Development Company Ltd.
    Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
  • Patent number: 8507853
    Abstract: The present invention relates to a novel system and method for the determination of depth profiling with improved accuracy and reliability. The method comprises obtaining spectroscopic data from the sample while under at least two different electrical conditions of the sample, the spectroscopic data comprising a signal of charged particles emitted from the sample, and being indicative of a change in amplitude, spectral position and spectral shape of the signal from the sample while under different electrical conditions of the sample, the change being indicative of the compositional profile and spatial distribution for at least one chemical element in the sample along a direction through the sample.
    Type: Grant
    Filed: October 22, 2009
    Date of Patent: August 13, 2013
    Assignee: Yeda Research and Development Company Ltd.
    Inventor: Hagai Cohen
  • Publication number: 20120329686
    Abstract: A lubricating and shock absorbing materials are described, which are based on nanoparticles having the formula A1-x-Bx-chalcogenide. Processes for their manufacture are also described.
    Type: Application
    Filed: March 10, 2011
    Publication date: December 27, 2012
    Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
  • Patent number: 8329138
    Abstract: A nanostructure, being either an Inorganic Fullerene-like (IF) nanostructure or an Inorganic Nanotube (INT), having the formula A1?x-Bx-chalcogenide are described. A being a metal or transition metal or an alloy of metals and/or transition metals, B being a metal or transition metal B different from that of A and x being ?0.3. A process for their manufacture and their use for modifying the electronic character of A-chalcogenide are described.
    Type: Grant
    Filed: March 10, 2010
    Date of Patent: December 11, 2012
    Assignee: Yeda Research and Development Company Ltd.
    Inventors: Reshef Tenne, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
  • Publication number: 20110210246
    Abstract: The present invention relates to a novel system and method for the determination of depth profiling with improved accuracy and reliability. The method comprises obtaining spectroscopic data from the sample while under at least two different electrical conditions of the sample, the spectroscopic data comprising a signal of charged particles emitted from the sample, and being indicative of a change in amplitude, spectral position and spectral shape of the signal from the sample while under different electrical conditions of the sample, the change being indicative of the compositional profile and spatial distribution for at least one chemical element in the sample along a direction through the sample.
    Type: Application
    Filed: October 22, 2009
    Publication date: September 1, 2011
    Applicant: YEDA RESEARCH AND DEVELOPMENT COMPANY LTD.
    Inventor: Hagai COHEN
  • Publication number: 20100227782
    Abstract: A nanostructure, being either an Inorganic Fullerene-like (IF) nanostructure or an Inorganic Nanotube (INT), having the formula A1?x-Bx-chalcognide are described. A being a metal or transition metal or an alloy of metals and/or transition metals, B being a metal or transition metal B different from that of A and x being ?0.3. A process for their manufacture and their use for modifying the electronic character of A-chalcognide are described.
    Type: Application
    Filed: March 10, 2010
    Publication date: September 9, 2010
    Applicant: YEDA RESEARCH AND DEVELOPMENT COMPANY LTD.
    Inventors: Reshef TENNE, Francis Leonard Deepak, Hagai Cohen, Sidney R. Cohen, Rita Rosentsveig, Lena Yadgarov
  • Patent number: 7148478
    Abstract: A method and device are presented for measuring the electrical properties of a specimen. The specimen is excited with high energy radiation to cause emission of internal charged particles from the specimen. Electrical power is supplied to a circuit, that is formed by the specimen and any added component connected to a back contact of the specimen. The electric power supply includes at least one of the following: irradiating the circuit with low energy charged particles; subjecting the circuit to an external field of the kind affecting the flux of emitted internal charged particles, and supplying a bias voltage to the back contact of the specimen. During the power supply to the specimen, at least one of the following is carried out: an electric current through the specimen is measured, and the emitted charged particles are analyzed versus their energy (using a contactless voltmeter) which provides local potential values at chemical entities of the specimen.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: December 12, 2006
    Assignee: Yeda Research and Development Company Ltd.
    Inventors: Hagai Cohen, Igor Lubomirsky
  • Publication number: 20060103395
    Abstract: A method and device are presented for measuring the electrical properties of a specimen. The specimen is excited with high energy radiation to cause emission of internal charged particles from the specimen. Electrical power is supplied to a circuit, that is formed by the specimen and any added component connected to a back contact of the specimen. The electric power supply includes at least one of the following: irradiating the circuit with low energy charged particles; subjecting the circuit to an external field of the kind affecting the flux of emitted internal charged particles, and supplying a bias voltage to the back contact of the specimen. During the power supply to the specimen, at least one of the following is carried out: an electric current through the specimen is measured, and the emitted charged particles are analyzed versus their energy (using a contactless voltmeter) which provides local potential values at chemical entities of the specimen.
    Type: Application
    Filed: November 15, 2004
    Publication date: May 18, 2006
    Inventors: Hagai Cohen, Igor Lubomirsky
  • Patent number: 6720556
    Abstract: A method of examining a sample, including: performing a first spectroscopic analysis of a surface portion of the sample when the sample surface portion is in a first electrical charge state; placing the sample surface portion in a second electrical charge state that is different from the first electrical charge state and performing a second spectroscopic analysis of the surface portion of the sample when the sample surface portion is in the second electrical charge state; and comparing the first spectroscopic analysis result with the second spectroscopic analysis result to obtain at least one of structural and electrical information about the sample.
    Type: Grant
    Filed: May 3, 2001
    Date of Patent: April 13, 2004
    Assignee: Yeda Research and Development Co. Ltd.
    Inventors: Hagai Cohen, Israel Rubinstein
  • Publication number: 20020020814
    Abstract: A method of examining a sample, including: performing a first spectroscopic analysis of a surface portion of the sample when the sample surface portion is in a first electrical charge state; placing the sample surface portion in a second electrical charge state that is different from the first electrical charge state and performing a second spectroscopic analysis of the surface portion of the sample when the sample surface portion is in the second electrical charge state; and comparing the first spectroscopic analysis result with the second spectroscopic analysis result to obtain at least one of structural and electrical information about the sample.
    Type: Application
    Filed: May 3, 2001
    Publication date: February 21, 2002
    Inventors: Hagai Cohen, Israel Rubinstein