Patents by Inventor Hairong Shi

Hairong Shi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High resolution elastography using two step strain estimation
    Patent number: 7632230
    Abstract: High-resolution elastography employs a multiple-step process in which successively finer samplings of data and smaller areas of data are evaluated to provide increasingly accurate displacement measurements, wherein each displacement measurement guides the determination of corresponding regions of comparison used in the next displacement evaluation.
    Type: Grant
    Filed: March 20, 2006
    Date of Patent: December 15, 2009
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Tomy Varghese, Hairong Shi, Hao Chen
  • High resolution elastography using two step strain estimation
    Publication number: 20070083113
    Abstract: High-resolution elastography employs a multiple-step process in which successively finer samplings of data and smaller areas of data are evaluated to provide increasingly accurate displacement measurements, wherein each displacement measurement guides the determination of corresponding regions of comparison used in the next displacement evaluation.
    Type: Application
    Filed: March 20, 2006
    Publication date: April 12, 2007
    Inventors: Tomy Varghese, Hairong Shi, Hao Chen