Abstract: An electric stirrer and charging base, wherein electric stirrer comprises a stirrer body and a stirring component, the stirring component is provided at the bottom end of stirrer body, and a supporting part is provided on the bottom of stirrer body; the charging base comprises a charging base body. A bearing part is provided in charging base body, and the stirrer body is supported on bearing part of charging base body through the supporting part, so that stirring component is located below stirrer body and suspended. While avoiding the risk of any liquid flowing into stirrer body to damage the internal circuitry or motor, the technical solution of the present invention prevents the stirring component from contacting any other item to avoid the contamination risk of stirring component. In addition, stirrer body can be placed, charged and taken for use conveniently, and in a normal gesture without any excess motion.

Abstract: A test system is provided. The system includes a first test apparatus and a second test apparatus. A device power supply of the first test apparatus (ATE) is electrically connected with a device under test (DUT) through a driving branch (F) and a detecting branch (S), the driving branch (F) being configured to provide an original driving current to the DUT b the device power supply during testing, and the detecting branch (S) being configured to detect an effective driving current reaching the DUT. The second test apparatus includes a first voltage drop branch, the first voltage drop branch is connected to the detecting branch (S), and a voltage drop detected by the driving branch (F) is used to determine an effectiveness of an electrical connection formed between the driving branch and the device under test, and an electrical connection formed between the detecting branch (S) and the DUT.

Abstract: A test system is provided. The system includes a first test apparatus and a second test apparatus. A device power supply of the first test apparatus (ATE) is electrically connected with a device under test (DUT) through a driving branch (F) and a detecting branch (S), the driving branch (F) being configured to provide an original driving current to the DUT b the device power supply during testing, and the detecting branch (S) being configured to detect an effective driving current reaching the DUT. The second test apparatus includes a first voltage drop branch, the first voltage drop branch is connected to the detecting branch (S), and a voltage drop detected by the driving branch (F) is used to determine an effectiveness of an electrical connection formed between the driving branch and the device under test, and an electrical connection formed between the detecting branch (S) and the DUT.

Abstract: A testing device of a data collecting chip (10) and control method thereof, and the testing device (10) includes: a data collecting module (200) for receiving multiple frames of sampling data sampling data collected by the data collecting chip; a storing module (300); a processing module (400) for calculating noise of a plurality of data sampling points to obtain a noise test result; a data transceiving module (500) for uploading the noise test result; and a control module (600). The testing device (10) only uploads the noise test result by calculating the noise of the plurality of data sampling points, so that the efficiency of a chip test is improved, the cost of the chip test is reduced, and the test reliability is ensured better.