Patents by Inventor Haili Zhang
Haili Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11957497Abstract: A method for processing breast tissue image data includes processing the image data to generate a set of image slices collectively depicting the patient's breast; for each image slice, applying one or more filters associated with a plurality of multi-level feature modules, each configured to represent and recognize an assigned characteristic or feature of a high-dimensional object; generating at each multi-level feature module a feature map depicting regions of the image slice having the assigned feature; combining the feature maps generated from the plurality of multi-level feature modules into a combined image object map indicating a probability that the high-dimensional object is present at a particular location of the image slice; and creating a 2D synthesized image identifying one or more high-dimensional objects based at least in part on object maps generated for a plurality of image slices.Type: GrantFiled: March 11, 2022Date of Patent: April 16, 2024Assignee: HOLOGIC, INCInventors: Haili Chui, Liyang Wei, Jun Ge, Xiangwei Zhang, Nikolaos Gkanatsios
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Publication number: 20240105895Abstract: A display module and a display device are provided. The display module includes a display panel, a flexible circuit board, and a printed circuit board. The display panel includes a bonding area. The flexible circuit board and the printed circuit board are electrically bonded and connected to the display panel in the bonding area, and are connected by a connector. The connector includes a first connection board and a second connection board. A side of the first connection board includes a groove including first pins. A side of the second connection board facing the first connection board includes second pins. The first pins and the second pins have a one-to-one correspondence. The second pins are plugged into the grooves, and are in contact with and electrically connected to the first pins; and a portion of at least one of the first pins is coated with a first insulating layer.Type: ApplicationFiled: February 13, 2023Publication date: March 28, 2024Inventors: Pan ZHANG, Lu LI, Haili ZHU, Yan ZOU
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Publication number: 20240092874Abstract: The present invention provides a rabies virus monoclonal antibody 2F2 and universal rabies virus antibody rapid detection test paper and belongs to the technical field of biological detection. An amino acid sequence of the monoclonal antibody 2F2 is shown as SEQ ID No. 1. The monoclonal antibody 2F2 provided by the present invention specifically binds to rabies virus G proteins, and preparation of the monoclonal antibody 2F2 into test paper has the advantages of rapidity, accuracy, sensitivity, specificity and low cost.Type: ApplicationFiled: December 21, 2022Publication date: March 21, 2024Inventors: Gaiping Zhang, Aiping Wang, Peiyang Ding, Yaning Sun, Yumei Chen, Jianguo Zhao, Hongliang Liu, Haili Wang
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Publication number: 20230139085Abstract: An improved apparatus and method for facilitating inspection of a wafer are disclosed. An improved method for facilitating inspection of a wafer comprises identifying a plurality of repeating patterns from reference image data associated with a layout design of the wafer. The method also comprises determining a pattern feature of one of the identified plurality of repeating patterns based on a change of a first characteristic of the reference image data. The method further comprises causing a first area of the wafer corresponding to the determined pattern feature to be evaluated.Type: ApplicationFiled: April 6, 2021Publication date: May 4, 2023Applicant: ASML Netherlands B.V.Inventors: Shengcheng JIN, Haili ZHANG, Zhichao CHEN
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Patent number: 11597948Abstract: The present invention provides a recombinant sequence information of a key host factor ANP32A/B which is necessary for the replication of influenza virus in a host. More specifically, the present invention relates to a 129-130 motif and a 149 site of the host factor ANP32A/B protein, which are key active sites for exerting its ability to promote the replication of influenza virus, and are also potential targeting sites of anti-influenza drugs.Type: GrantFiled: February 26, 2019Date of Patent: March 7, 2023Assignee: Harbin Veterinary Research Institute, Chinese Academy of Agricultural Sciences (China Animal Health and Epidemiology Center, Harbin)Inventors: Xiaojun Wang, Haili Zhang, Zhenyu Zhang
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Publication number: 20220317672Abstract: The invention discloses a visualization method for process monitoring based on bi-kernel t-distributed stochastic neighbor embedding. It includes two steps of offline modeling and online monitoring. In offline modeling, standard t-SNE method is used to reduce the dimension of historical normal data. The mapping parameter matrix from the input kernel matrix to the feature kernel matrix is calculated. PCA is used to reduce the feature kernel matrix to two dimensions, and then the square Mahalanobis distance is calculated as a statistic and the control limit is solved. Online monitor and calculate the kernel function to between the collected data and the modeling data; and the obtained kernel vector is multiplied by the mapping parameter matrix to obtain the mapped feature kernel vector. PCA is used to reduce the dimension of the mapped feature kernel vector to obtain two-dimensional features for visualization. Draw the scatter diagram of the feature and observe whether it is within the ellipse control limit.Type: ApplicationFiled: June 17, 2022Publication date: October 6, 2022Inventors: Pu Wang, Haili Zhang, Xuejin Gao, Huihui Gao, Huayun Han
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Publication number: 20220044124Abstract: The invention discloses a convolution self-encoding fault monitoring method based on batch imaging, and belongs to the technical field of batch process fault monitoring. The method comprises two steps of off-line modeling and on-line monitoring. The offline modeling step comprises the following steps: firstly, normalizing three-dimensional data of intermittent process; then, taking the two-dimensional array of each batch as an image to be directly input into a convolutional auto-encoder (CAE) to carry out deep unsupervised feature learning; and finally, constructing statistics and corresponding control limits for the features learned by CAE by utilizing a support vector machine. The online monitoring step includes: normalizing the collected data, and carrying out batch filling; inputting the normalized and filled batch graph into trained CAE to learn features; and calculating an online statistic, comparing online statistic with an offline control limit.Type: ApplicationFiled: October 20, 2021Publication date: February 10, 2022Inventors: Pu WANG, Haili ZHANG, Xuejin GAO, Huihui GAO
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Patent number: 11238579Abstract: A defect pattern grouping method is disclosed. The defect pattern grouping method comprises obtaining a first polygon that represents a first defect from an image of a sample, comparing the first polygon with a set of one or more representative polygons of a defect-pattern collection, and grouping the first polygon with any one or more representative polygons identified based on the comparison.Type: GrantFiled: January 18, 2018Date of Patent: February 1, 2022Assignee: ASML Netherlands B.V.Inventors: Wei Fang, Haili Zhang, Zhichao Chen, Shengcheng Jin
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Patent number: 11126089Abstract: A method for determining corrections to features of a mask. The method includes obtaining (i) a pattern group for a design layout, and (ii) defect inspection data of a substrate imaged using the mask used in the patterning process for the design layout; determining, based on the defect inspection data, a defect map associated with the pattern group, wherein the defect map comprises locations of assist features having a relatively higher probability of being printed on the substrate compared to other patterns of the design layout; and determining, via simulating an optical proximity correction process using data associated with the defect map, corrections to the features of the mask.Type: GrantFiled: April 14, 2020Date of Patent: September 21, 2021Assignee: ASML Netherlands B.V.Inventors: Wei Fang, Lingling Pu, Zhichao Chen, Haili Zhang, Pengcheng Zhang
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Publication number: 20210054411Abstract: The present invention provides a recombinant sequence information of a key host factor ANP32A/B which is necessary for the replication of influenza virus in a host. More specifically, the present invention relates to a 129-130 motif and a 149 site of the host factor ANP32A/B protein, which are key active sites for exerting its ability to promote the replication of influenza virus, and are also potential targeting sites of anti-influenza drugs.Type: ApplicationFiled: February 26, 2019Publication date: February 25, 2021Inventors: Xiaojun Wang, Haili Zhang, Zhenyu Zhang
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Publication number: 20200326632Abstract: A method for determining corrections to features of a mask. The method includes obtaining (i) a pattern group for a design layout, and (ii) defect inspection data of a substrate imaged using the mask used in the patterning process for the design layout; determining, based on the defect inspection data, a defect map associated with the pattern group, wherein the defect map comprises locations of assist features having a relatively higher probability of being printed on the substrate compared to other patterns of the design layout; and determining, via simulating an optical proximity correction process using data associated with the defect map, corrections to the features of the mask.Type: ApplicationFiled: April 14, 2020Publication date: October 15, 2020Applicant: ASML NETHERLANDS B.V.Inventors: Wei Fang, Lingling Pu, Zhichao Chen, Haili Zhang, Pengcheng Zhang
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Publication number: 20190333205Abstract: A defect pattern grouping method is disclosed. The defect pattern grouping method comprises obtaining a first polygon that represents a first defect from an image of a sample, comparing the first polygon with a set of one or more representative polygons of a defect-pattern collection, and grouping the first polygon with any one or more representative polygons identified based on the comparison.Type: ApplicationFiled: January 18, 2018Publication date: October 31, 2019Inventors: Wei FANG, Haili ZHANG, Zhichao CHEN, Shengcheng JIN
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Patent number: 9270339Abstract: A device, method and system for recovering an operating system may comprise a near field communication module; a high speed wireless communication module; and a recovery manager. In some embodiments, the recovery manager may initiate a session between a portable communication device and another portable communication device through a near field communication connection established by the near field communication module; continue the session to receive an operating system image from the another portable communication device through a high speed wireless connection established by the high speed wireless communication module; and recover the operating system of the portable communication device with use of the operating system image.Type: GrantFiled: August 29, 2012Date of Patent: February 23, 2016Assignee: Intel CorporationInventors: Jiewen Yao, Chuan Song, Haili Zhang, Wenlong Yang
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Publication number: 20140380137Abstract: Systems and methods for converting web-based applications that were written for an original form-factor that supports a single operating system (OS) interface to multiple other form-factors and OS interfaces. A conversion process may be performed on applications that include HTML code, web scripts, CSS styles and various image or multimedia resources. Each file in a source application package is parsed for elements that may be modified based on a source profile and target profile for different device form-factors. Individual elements are resized, converted, or wrapped with a plug-in or shim, thereby accommodating the differences between different devices with different interfaces, screen resolutions and operating environments.Type: ApplicationFiled: December 30, 2011Publication date: December 25, 2014Inventors: Haili Zhang, Cong Liu, Junyong Ding, Jing Yong Zhu
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Patent number: 7468274Abstract: A novel single-cell-level phenotypic assay is described, which can simultaneously analyze HIV-1 drug susceptibility and intrinsic replication capacity. This allows quantitative dissection of the functions of antiretroviral drugs into suppression of viral replication and selection of resistant viruses with diminished replication capacities. The disclosed assay provides a tool for the rational evaluation of treatment decisions for patients failing antiretroviral therapy and is expected to be an important part in clinical management of HIV.Type: GrantFiled: January 25, 2005Date of Patent: December 23, 2008Assignee: The Johns Hopkins UniversityInventors: Robert Siliciano, Haili Zhang, Yan Zhou
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Publication number: 20050244818Abstract: A novel single-cell-level phenotypic assay is described, which can simultaneously analyze HIV-1 drug susceptibility and intrinsic replication capacity. This allows quantitative dissection of the functions of antiretroviral drugs into suppression of viral replication and selection of resistant viruses with diminished replication capacities. The disclosed assay provides a tool for the rational evaluation of treatment decisions for patients failing antiretroviral therapy and is expected to be an important part in clinical management of HIV.Type: ApplicationFiled: January 25, 2005Publication date: November 3, 2005Inventors: Robert Siliciano, Haili Zhang, Yan Zhou
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Patent number: D1008702Type: GrantFiled: November 30, 2021Date of Patent: December 26, 2023Assignee: Langfang Balaide Trading Co., Ltd.Inventor: Haili Zhang