Abstract: Disclosed embodiments include a head attached to a gantry. The head includes an optical assembly to focus a laser beam onto a surface of a material to be processed by a CNC machine and a measurement assembly with emitter(s) and detector(s), where the detector(s) are for measuring intensity of light emitted from the emitter(s) and reflected off the surface of the material. Processors are configured to (i) determine a material type of the material, (ii) determine a distance between the optical assembly and the material surface based on (a) measurement(s) of the intensity of the light emitted from the emitter(s) and reflected off the material surface, and (b) measurement parameter(s) associated with the determined material type, and (iii) control focusing of the laser beam onto the surface of the material based on the determined distance between the optical assembly and the surface of the material.

Abstract: An illumination apparatus includes a semiconductor laser providing light-output in first and second mutually perpendicular axes. The light-output propagates in a direction mutually perpendicular to the first and second axes. An optical system is arranged cooperative with the semiconductor laser to focus the light-output inn the first and second axes at respectively first and second focal points spaced apart in the propagation direction. At a plane intersecting the first focal point perpendicular to the direction of propagation, the focussed diode-laser light-output is formed into a line of light having a width in the first axis and a length in the second axis.

Abstract: An illumination apparatus includes a semiconductor laser providing light-output in first and second mutually perpendicular axes. The light-output propagates in a direction mutually perpendicular to the first and second axes. An optical system is arranged cooperative with the semiconductor laser to focus the light-output inn the first and second axes at respectively first and second focal points spaced apart in the propagation direction. At a plane intersecting the first focal point perpendicular to the direction of propagation, the focussed diode-laser light-output is formed into a line of light having a width in the first axis and a length in the second axis.

Abstract: An illumination apparatus includes a semiconductor laser providing light-output in first and second mutually perpendicular axes. The light-output propagates in a direction mutually perpendicular to the first and second axes. An optical system is arranged cooperative with the semiconductor laser to focus the light-output inn the first and second axes at respectively first and second focal points spaced apart in the propagation direction. At a plane intersecting the first focal point perpendicular to the direction of propagation, the focussed diode-laser light-output is formed into a line of light having a width in the first axis and a length in the second axis.