Patents by Inventor Hajime Horie

Hajime Horie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for inspecting plural semiconductor devices
    Patent number: 4985673
    Abstract: A method of inspecting semiconductor devices, wherein a plurality of semiconductor devices of the same type are successively connected to a measuring-inspecting means in a manner to be exchanged over from one to another, and pass or fail of the plurality of semiconductor devices is successively inspected by the measuring-inspecting section.
    Type: Grant
    Filed: May 18, 1989
    Date of Patent: January 15, 1991
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Hajime Horie