Abstract: A pattern generation device includes a memory and a processor coupled to the memory. The processor is configured to generate pattern data corresponding to a pattern of a metal layer based on a generation condition, determine whether the generated pattern data satisfies a predetermined condition, return to generate the pattern data when the predetermined condition is not satisfied, calculate a characteristic of the pattern or an element or circuit having the pattern when a high-frequency signal is inputted to a first portion and a high-frequency signal is outputted from a second portion by performing an electromagnetic field analysis based on the pattern data when the predetermined condition is satisfied, determine whether the calculated characteristic is within a target range, change the generation condition when the calculated characteristic is not within the target range, and return to generate the pattern data after changing the generation condition.

Abstract: An environmental information measurement device includes: a power source unit; an environmental information detector; a timer; and a controller. The power source unit generates, from an electromagnetic wave received, a power source voltage to be supplied to a load. The load includes the environmental information detector, the timer, and the controller. The environmental information detector includes a detector including a circuit element having an impedance or an electrostatic capacitance that varies according to a physical amount detected under an environment at a measurement target point, and outputs a signal that varies according to a response characteristic of the detector. The timer measures a duration from the time when measurement is initiated to the time when a voltage of the signal becomes a predetermined detection voltage. The controller controls an operation of the environmental information detector.

Abstract: A fuel-saving management system allowing fuel-saving management and associated driver assistance. The system includes, mounted on a vehicle, information detectors detecting various information on the driving state of the vehicle, an information processor, in addition to processing the information detected by the information detectors, generating a warning when processed information satisfies required warning conditions, and an information storage device storing the processed information. In this system, when either a time during which the processed information is maintained to satisfy the required warning conditions, or an elapsed time of the processed information exceeds a previously set time, the information processor stores the occurrence of this overtime event into the information storage device. A setter allowing modification of the required warning conditions, and a printer outputting the information relating to the processed information are also mounted.

Abstract: This invention relates to a fuel-saving management system that allows fuel-saving management and associated driver assistance to be conducted very smoothly. The constituent elements of this system include the following mounted on a vehicle: information detectors (11 to 15) for detecting various information on the driving state of the vehicle, an information processor (3) for, in addition to processing the information detected by the information detectors, generating a warning when processed information satisfies required warning conditions, and an information storage device (4) for storing the processed information. In this system, when either a time during which the processed information is maintained to satisfy the required warning conditions, or an elapsed time of the processed information exceeds a previously set time, the information processor stores the occurrence of this overtime event into the information storage device.

Abstract: A method of aligning a semiconductor wafer, usable in a step-and-repeat type exposure apparatus for projecting, in a reduced scale, images of a pattern formed on a reticle upon different shot areas on the semiconductor wafer in a predetermined sequence. According to this alignment method, the wafer is moved stepwise before the initiation of step-and-repeat exposures of the shot areas on the wafer and in accordance with a predetermined layout grid concerning the sites of the shot areas on the wafer. While moving the wafer stepwise in this manner, any positional deviation of each of some of the shot areas with respect to the layout grid is measured by use of a reduction projection lens system and, from the results of measurement, a corrected grid is prepared according to which grid the amount of stepwise movement of the wafer to be made for the step-and-repeat exposures thereof is determined.