Abstract: A method of evaluating quality of a crystal unit, capable of performing quantitative measurement of an actual operation of a crystal unit which is to be oscillated in an actual oscillator to ensure an accurate quality evaluation, is provided. The method includes increasing a DC input voltage of a crystal oscillator, the crystal oscillator having at least one AGC amplifier whose amplification rate varies depending on the DC input voltage and having a crystal unit connected thereto, measuring a maximum value of the DC input voltage at a start of oscillation of the crystal oscillator, and evaluating quality of the crystal unit by the measured maximum value.

Abstract: A method of evaluating quality of a crystal unit, capable of performing quantitative measurement of an actual operation of a crystal unit which is to be oscillated in an actual oscillator to ensure an accurate quality evaluation, is provided which comprises the steps of increasing a DC input voltage of a crystal oscillator, said crystal oscillator having at least one AGC amplifier whose amplification rate varies depending on the DC input voltage and having a crystal unit connected thereto; measuring a maximum value of the DC input voltage at a start of oscillation of the crystal oscillator; and evaluating quality of the crystal unit by the measured maximum value.

Abstract: A crystal oscillator for measuring crystal impedance (CI) easily and accurately of various crystal units having an oscillating frequency in a wide band and various CI-values in a broad rage. A DC input voltage is measured, representing CI of a crystal unit, in a crystal oscillator, wherein an integrating circuit is provided in an output section providing a frequency oscillated from the crystal unit as an output, and one or more AGC amplifiers having an amplification rate proportional to a DC input voltage is provided between the crystal unit and the integrating circuit.