Patents by Inventor Hak Chuah Sim
Hak Chuah Sim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11815349Abstract: In one embodiment, an automatic high-speed X-ray system may generate a high-resolution X-ray image of an inspected sample at a direction substantially orthogonal to a plane of the inspected sample. The system may determine a first cross-sectional shape of a first portion of a first element of interest in the inspected sample based on grayscale values of the X-ray image associated with the first element of interest. The system may determine a second cross-sectional shape of a second portion of the first element of interest in the inspected sample. The second cross-sectional shape may be determined based on the grayscale values of the X-ray image associated with the first element of interest. The system may determine one or more first metrological parameters associated with the first element of interest in the inspected sample based a comparison of the first cross-sectional shape and the second cross-sectional shape.Type: GrantFiled: August 4, 2021Date of Patent: November 14, 2023Assignee: Bruker Nano, Inc.Inventors: Brennan Lovelace Peterson, Hak Chuah Sim, Andrew George Reid, Nabil Farah Dawahre Olivieri
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Publication number: 20230334651Abstract: A method and system for inspecting a honeycomb body. The method includes capturing a first image. Instances of at least one feature in the first image that correlates to a structural characteristic of the honeycomb body are detected. One or more detected instances of the at least one feature identified in the first image are abstracted by creating a graphical representation of each of the one or more detected instances of the at least one feature. A second image is generated by augmenting the first image with the graphical representation in place of or in addition to each of the one or more detected instances of the at least one feature identified in the first image. The second image is analyzed using a machine learning algorithm to classify the honeycomb body with respect to the structural characteristic of the honeycomb body.Type: ApplicationFiled: August 5, 2021Publication date: October 19, 2023Inventors: Jacob George, Byoungseon Jeon, Seth Thomas Nickerson, Hak Chuah Sim
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Publication number: 20220042795Abstract: In one embodiment, an automatic high-speed X-ray system may generate a high-resolution X-ray image of an inspected sample at a direction substantially orthogonal to a plane of the inspected sample. The system may determine a first cross-sectional shape of a first portion of a first element of interest in the inspected sample based on grayscale values of the X-ray image associated with the first element of interest. The system may determine a second cross-sectional shape of a second portion of the first element of interest in the inspected sample. The second cross-sectional shape may be determined based on the grayscale values of the X-ray image associated with the first element of interest. The system may determine one or more first metrological parameters associated with the first element of interest in the inspected sample based a comparison of the first cross-sectional shape and the second cross-sectional shape.Type: ApplicationFiled: August 4, 2021Publication date: February 10, 2022Inventors: Brennan Lovelace Peterson, Hak Chuah Sim, Andrew George Reid, Nabil Farah Dawahre Olivieri
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Patent number: 9996766Abstract: Imaging-based methods for detecting defects in an extruded cellular ceramic article having a web array are disclosed. The methods may include capturing a digital image of the web array to establish an intensity-based initial web array representation. The methods also may include performing an intensity threshold process on the initial web array representation to define an intensity-based high-resolution web array representation having sub-pixel resolution, and performing piecewise cubic spline fits to define corresponding web skeletons. The method may also include comparing intensities of the high-resolution web array representation along the web skeletons to a threshold intensity to determine the defect locations and sizes. The methods can be applied to determining the size and location of skin defects as well.Type: GrantFiled: April 27, 2016Date of Patent: June 12, 2018Assignee: Corning IncorporatedInventors: DiRisio Carlo Richard, Frey Julie Charmaine, Gehl Kristine Sluder, Russell Wayne Madara, Hak Chuah Sim, Yeqing Zhang
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Publication number: 20160321797Abstract: Imaging-based methods for detecting defects in an extruded cellular ceramic article having a web array are disclosed. The methods may include capturing a digital image of the web array to establish an intensity-based initial web array representation. The methods also may include performing an intensity threshold process on the initial web array representation to define an intensity-based high-resolution web array representation having sub-pixel resolution, and performing piecewise cubic spline fits to define corresponding web skeletons. The method may also include comparing intensities of the high-resolution web array representation along the web skeletons to a threshold intensity to determine the defect locations and sizes. The methods can be applied to determining the size and location of skin defects as well.Type: ApplicationFiled: April 27, 2016Publication date: November 3, 2016Inventors: DiRisio Carlo Richard, Frey Julie Charmaine, Gehl Kristine Sluder, Russell Wayne Madara, Hak Chuah Sim, Yeqing Zhang
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Patent number: 8810804Abstract: Optical reader systems and methods with rapid microplate position detection capability are disclosed. The optical reader system includes a scanning optical system configured to scan select position-detecting features to accurately determine the microplate position within the optical reader system. The method includes measuring positions of the position-detecting features in order of their respective amounts of position tolerance, from smallest to largest. The position measurement is carried out for a number of position-detecting features sufficient to determine the microplate position with the optical reader system to within a select microplate position tolerance.Type: GrantFiled: October 18, 2012Date of Patent: August 19, 2014Assignee: Corning IncorporatedInventors: Ronald Charles Hollenbeck, Hak Chuah Sim, Cameron John Tovey, Cynthia L. Wida
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Publication number: 20130100462Abstract: Optical reader systems and methods with rapid microplate position detection capability are disclosed. The optical reader system includes a scanning optical system configured to scan select position-detecting features to accurately determine the microplate position within the optical reader system. The method includes measuring positions of the position-detecting features in order of their respective amounts of position tolerance, from smallest to largest. The position measurement is carried out for a number of position-detecting features sufficient to determine the microplate position with the optical reader system to within a select microplate position tolerance.Type: ApplicationFiled: October 18, 2012Publication date: April 25, 2013Inventors: Ronald Charles Hollenbeck, Hak Chuah Sim, Cameron John Tovey, Cynthia L. Wida
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Patent number: 7706599Abstract: An edge inspection method for detecting defects on a wafer edge normal surface includes acquiring a set of digital images which captures a circumference of the wafer. An edge of the wafer about the circumference is determined. Each digital image is segmented into a plurality of horizontal bands. Adjacent edge clusters about the circumference of the wafer are combined into edge pixel bins. The edge pixel bins are analyzed via edge clusters analysis to identify defects. The edge pixel bins are also analyzed via blob analysis to determine defects.Type: GrantFiled: February 25, 2008Date of Patent: April 27, 2010Assignee: Rudolph Technologies, Inc.Inventor: Hak Chuah Sim
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Publication number: 20080204756Abstract: An edge inspection method for detecting defects on a wafer edge normal surface includes acquiring a set of digital images which captures a circumference of the wafer. An edge of the wafer about the circumference is determined. Each digital image is segmented into a plurality of horizontal bands. Adjacent edge clusters about the circumference of the wafer are combined into edge pixel bins. The edge pixel bins are analyzed via edge clusters analysis to identify defects. The edge pixel bins are also analyzed via blob analysis to determine defects.Type: ApplicationFiled: February 25, 2008Publication date: August 28, 2008Applicant: RUDOLPH TECHNOLOGIES, INC.Inventor: Hak Chuah Sim
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Patent number: 7366344Abstract: An edge inspection method for detecting defects on a wafer edge normal surface includes acquiring a set of digital images which captures a circumference of the wafer. An edge of the wafer about the circumference is determined. Each digital image is segmented into a plurality of horizontal bands. Adjacent edge clusters about the circumference of the wafer are combined into edge pixel bins. The edge pixel bins are analyzed via edge clusters analysis to identify defects. The edge pixel bins are also analyzed via blob analysis to determine defects.Type: GrantFiled: January 13, 2006Date of Patent: April 29, 2008Assignee: Rudolph Technologies, Inc.Inventor: Hak Chuah Sim
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Patent number: 7024031Abstract: A system for inspecting components is provided. The system includes an axial lighting system that illuminates the component with axial lighting to allow one or more features of the component to be located, such as by causing protruding features to be brighter than the background and recessed features to be darker than the background. An off-axis lighting system illuminates the component with off-axis lighting in the absence of the axial lighting to allow the component to be inspected to locate one or more features, such as a bump contact.Type: GrantFiled: October 23, 2001Date of Patent: April 4, 2006Assignee: August Technology Corp.Inventors: Ramiro Castellanos-Nolasco, Sanjeev Mathur, John Mark Thornell, Thomas Casey Carrington, Hak Chuah Sim, Clyde Maxwell Guest, Charles Kenneth Harris
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Patent number: 6947588Abstract: An edge inspection method for detecting defects on a wafer edge normal surface includes acquiring a set of digital images which captures a circumference of the wafer. An edge of the wafer about the circumference is determined. Each digital image is segmented into a plurality of horizontal bands. Adjacent edge clusters about the circumference of the wafer are combined into edge pixel bins. The edge pixel bins are analyzed via edge clusters analysis to identify defects. The edge pixel bins are also analyzed via blob analysis to determine defects.Type: GrantFiled: July 14, 2004Date of Patent: September 20, 2005Assignee: August Technology Corp.Inventor: Hak Chuah Sim