Patents by Inventor Hak Sung Kim

Hak Sung Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240088425
    Abstract: An electrode assembly, a battery, a battery pack and a vehicle including the same are provided. In the electrode assembly, the uncoated portion of an electrode includes a segment region divided into a plurality of segments, and the segment region includes a plurality of segment groups separated by a group separation pitch along a winding direction. One end of the electrode assembly includes a plurality of segment alignments. In winding turns corresponding to the plurality of segment alignments, group separation pitches of segment groups disposed in a same winding turn are substantially identical, and separation pitches of the segment groups is greater in a winding turn of a region adjacent to the outer circumference of the electrode assembly than in a winding turn of a region adjacent to the core of the electrode assembly.
    Type: Application
    Filed: July 19, 2022
    Publication date: March 14, 2024
    Applicant: LG ENERGY SOLUTION, LTD.
    Inventors: Jae-Eun LEE, Jong-Sik PARK, Hak-Kyun KIM, Je-Jun LEE, Jae-Won LIM, Yu-Sung CHOE, Byoung-Gu LEE, Duk-Hyun RYU, Kwan-Hee LEE
  • Patent number: 11781981
    Abstract: According to an embodiment of a specimen inspection apparatus, the specimen inspection apparatus may comprise: a radiation unit; a reflection unit; a focus adjusting unit; a reception unit; and a control unit. The specimen inspection apparatus may comprise: a radiation unit for emitting a terahertz wave; a reflection unit for changing the path of a terahertz wave emitted from the radiation unit; a focus adjusting unit for forming an irradiation region on a specimen according to the path of the terahertz wave; a reception unit for receiving individual terahertz waves obtained by reflection, by the specimen, of the terahertz wave irradiated onto the first region; and a control unit for controlling the distance between at least two elements among the plurality of elements, and detecting whether the specimen is defective, according to the reflectivity difference between the terahertz waves.
    Type: Grant
    Filed: October 1, 2019
    Date of Patent: October 10, 2023
    Assignee: ACTRO CO., LTD.
    Inventors: Hak Sung Kim, Gyung Hwan Oh, Dong Woon Park
  • Publication number: 20230289593
    Abstract: A device for calculating thermal characteristics of a building structure using an artificial neural network comprise a first artificial neural network which receives first input information including a drawing image as input information and outputs first output information including feature information, in which shape information for each part of the drawing image is extracted, as output information, a second artificial network which receives the first output information and second input information including thermal conductivity information for each part as input information and outputs second output information including temperature distribution image information corresponding to the drawing image as output information and a third artificial neural network which receives the first output information and the second input information as input information and outputs third output information including heat flow distribution image information corresponding to the drawing image as output information.
    Type: Application
    Filed: October 14, 2022
    Publication date: September 14, 2023
    Inventors: Hak-Sung KIM, Dug-Joong KIM, Sang-Il KIM, Se-Min LEE
  • Patent number: 11729942
    Abstract: A light sintering device is provided. The light sintering device can comprise: a housing having, therein, a cooling hollow portion in which cooling water flows; a beam guide mounted on one side of the housing so as to form one wall of the cooling hollow portion, and guiding sintered light; and an optical filter mounted on the other side of the housing so as to face the beam guide, thereby forming the other wall of the cooling hollow portion, and filtering out a specific wavelength of the sintered light.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: August 15, 2023
    Assignee: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
    Inventors: Hak-Sung Kim, Yong Rae Jang, Wan Ho Chung
  • Patent number: 11629038
    Abstract: The present invention relates to a forklift capable of mounting a door in a state in which a pipe for forming a cabin frame is not drilled, the forklift having: a door mounting bar, which is mounted on the outer surfaces of rear pipes at both left and right surfaces of the cabin frame of the forklift, has a bent part formed at the upper end thereof, and has a fastening part formed on one side surface thereof by bending so as to be positioned at the rear surface of the rear pipe; a rear window frame which is mounted between both the left and right rear pipes at the rear of the cabin frame and is formed as a square frame having, at both the left and right sides thereof, engagement fastening parts coupled to the fastening part of the door mounting bar; connecting brackets which simultaneously fasten the door mounting bar and the rear window frame while coming in close contact with the rear pipe at the inner side of the cabin frame; and a hinge bracket which is provided at the upper and lower ends of the outer su
    Type: Grant
    Filed: March 26, 2019
    Date of Patent: April 18, 2023
    Inventor: Hak Sung Kim
  • Publication number: 20220356365
    Abstract: Provided is photo-sintering nano ink. The photo-sintering nano ink includes a photo-sintering precursor including a conductive nano particle and an oxide film surrounding the conductive nano particle, polymer binder resin, and an adhesive.
    Type: Application
    Filed: July 27, 2022
    Publication date: November 10, 2022
    Applicant: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
    Inventors: Hak-Sung KIM, Chunghyeon RYU
  • Patent number: 11486822
    Abstract: According to one embodiment of the present invention, A sample inspection device may provided, a total inspection module scanning a first area comprising a plurality of samples; a precision inspection module performing inspection on a sample determined as a suspected defective sample by the total inspection module in the first area; and a controller processing each data obtained from the total inspection module and the precision inspection module, and detecting a defective sample in the first area, wherein the precision inspection module may include an emitter emitting terahertz wave to the first area, a guide wire guiding an irradiation direction of the terahertz wave, and a vibration unit vibrating the guide wire.
    Type: Grant
    Filed: July 24, 2019
    Date of Patent: November 1, 2022
    Assignee: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
    Inventors: Hak Sung Kim, Gyung Hwan Oh, Dong Woon Park
  • Publication number: 20220315662
    Abstract: The present invention relates to a novel polypeptide which can specifically bind to programmed cell death protein 1, a polynucleotide coding for the polypeptide, a vector comprising the polynucleotide, a recombinant microorganism in which the expression vector has been introduced, a method for preparing the polypeptide by means of the recombinant microorganism, a cancer preventing or treating composition comprising the polypeptide, and a cancer prevention or treatment method comprising administration of the cancer preventing or treating composition comprising the polypeptide. The polypeptide of the present invention can inhibit the activity of programmed cell death protein 1 by binding thereto and thus can be widely utilized for a formulation for preventing or treating various diseases associated with programmed cell death protein 1.
    Type: Application
    Filed: August 21, 2020
    Publication date: October 6, 2022
    Inventors: Hak-Sung KIM, Sumin SON, Hyo-Deok SEO, Jinho PARK
  • Publication number: 20220316860
    Abstract: A thickness measuring device of the present invention includes a supporter which supports a specimen, an emission unit which emits an electromagnetic wave in a direction toward the specimen, a chamber which surrounds the specimen, a receiving unit which receives an electromagnetic wave output in a direction in which the chamber is positioned, and a control unit which receives a signal from the receiving unit and calculates a thickness of the specimen. At least a part of the chamber transmits a part of the electromagnetic wave and reflects the remaining part of the electromagnetic wave. The receiving unit receives a first electromagnetic wave having a first peak and a second electromagnetic wave having a second peak. The first peak occurs at a first time point, the second peak occurs at a second time point, and a difference between the first time point and the second time point is a first period or more.
    Type: Application
    Filed: April 21, 2020
    Publication date: October 6, 2022
    Applicant: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
    Inventors: Hak Sung KIM, Gyung Hwan OH, Dong Woon PARK, Heon Su KIM
  • Publication number: 20220268568
    Abstract: According to an aspect of the invention, a thickness measuring device comprising: an emission unit emitting an electromagnetic wave toward a specimen, a reception unit receiving an electromagnetic wave output from a direction in which the specimen is positioned; and a control unit calculating a thickness of the specimen by receiving a signal from the reception unit, wherein when the specimen has a first thickness, the reception unit receives a first electromagnetic wave, and when the specimen has a second thickness, the reception unit receives a second electromagnetic wave, wherein the first electromagnetic wave has a first peak value at a first time point, and the second electromagnetic wave has a second peak value at a second time point, and wherein when the first thickness is greater than the second thickness, the first peak value is smaller than the second peak value, may be provided.
    Type: Application
    Filed: July 20, 2020
    Publication date: August 25, 2022
    Applicant: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hak Sung KIM, Dong Woon PARK, Gyung Hwan OH, Heon Su KIM
  • Patent number: 11346659
    Abstract: A method for measuring the thickness of a specimen, according to an embodiment, can measure the thickness of a specimen having multiple layers in a contactless and non-destructive manner. In addition, when the refractive indexes of materials forming the respective layers are already known, the thicknesses of the respective layers can be integrally measured through differences in reflection times of terahertz waves with respect to the respective layers of the specimen, thereby measuring the thickness of the specimen, such that the time taken for measuring the thickness of the specimen can be reduced.
    Type: Grant
    Filed: March 1, 2021
    Date of Patent: May 31, 2022
    Assignee: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hak Sung Kim, Gyung Hwan Oh, Dong Woon Park
  • Publication number: 20210389238
    Abstract: According to an embodiment of a specimen inspection apparatus, the specimen inspection apparatus may comprise: a radiation unit; a reflection unit; a focus adjusting unit; a reception unit; and a control unit. The specimen inspection apparatus may comprise: a radiation unit for emitting a terahertz wave; a reflection unit for changing the path of a terahertz wave emitted from the radiation unit; a focus adjusting unit for forming an irradiation region on a specimen according to the path of the terahertz wave; a reception unit for receiving individual terahertz waves obtained by reflection, by the specimen, of the terahertz wave irradiated onto the first region; and a control unit for controlling the distance between at least two elements among the plurality of elements, and detecting whether the specimen is defective, according to the reflectivity difference between the terahertz waves.
    Type: Application
    Filed: October 1, 2019
    Publication date: December 16, 2021
    Applicant: Industry-University Cooperation Foundation Hanyang University
    Inventors: Hak Sung KIM, Gyung Hwan OH, Dong Woon PARK
  • Patent number: 11150080
    Abstract: A thickness measuring device is provided. The thickness measuring device may include a terahertz wave signal processing unit configured to receive a terahertz wave according to at least one mode of a reflection mode and a transmission mode, a refractive index information acquisition unit configured to acquire refractive index information of the thickness measurement sample in consideration of second-time difference information between a first reflected terahertz wave and a second reflected terahertz wave, and a thickness information acquisition unit configured to acquire thickness information of the thickness measurement sample in consideration of the refractive index information.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: October 19, 2021
    Assignee: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
    Inventors: Hak-Sung Kim, Gyung Hwan Oh, Deok Joong Kim, Dong Woon Park
  • Publication number: 20210310943
    Abstract: According to one embodiment of the present invention, A sample inspection device may provided, a total inspection module scanning a first area comprising a plurality of samples; a precision inspection module performing inspection on a sample determined as a suspected defective sample by the total inspection module in the first area; and a controller processing each data obtained from the total inspection module and the precision inspection module, and detecting a defective sample in the first area, wherein the precision inspection module may include an emitter emitting terahertz wave to the first area, a guide wire guiding an irradiation direction of the terahertz wave, and a vibration unit vibrating the guide wire.
    Type: Application
    Filed: July 24, 2019
    Publication date: October 7, 2021
    Applicant: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hak Sung KIM, Gyung Hwan OH, Dong Woon PARK
  • Publication number: 20210180946
    Abstract: A method for measuring the thickness of a specimen, according to an embodiment, can measure the thickness of a specimen having multiple layers in a contactless and non-destructive manner. In addition, when the refractive indexes of materials forming the respective layers are already known, the thicknesses of the respective layers can be integrally measured through differences in reflection times of terahertz waves with respect to the respective layers of the specimen, thereby measuring the thickness of the specimen, such that the time taken for measuring the thickness of the specimen can be reduced.
    Type: Application
    Filed: March 1, 2021
    Publication date: June 17, 2021
    Applicant: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hak Sung KIM, Gyung Hwan OH, Dong Woon PARK
  • Patent number: 10995153
    Abstract: The present invention relates to a novel polypeptide that binds selectively to mouse or rabbit immunoglobulin G. More specifically, the present invention relates to a polypeptide that binds to mouse or rabbit immunoglobulin G, a polynucleotide encoding the polypeptide, an expression vector comprising the polynucleotide, a transformant introduced with the expression vector, a method of producing the polypeptide using the transformant, and a composition for immunoassay comprising the polypeptide. The novel peptide according to the present invention binds specifically to mouse or rabbit immunoglobulin G, can replace conventional expensive secondary immunoglobulin G, and can be used in various biological immunoassays. In addition, a conjugate of the polypeptide of the present invention and immunoglobulin G is useful for fabrication of various immunosensors/immunochips and for drug screening.
    Type: Grant
    Filed: September 20, 2016
    Date of Patent: May 4, 2021
    Assignee: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Hak-Sung Kim, Sukyo Jeong, Woosung Heu, Jong-Won Kim, Joong-Jae Lee
  • Publication number: 20210107775
    Abstract: The present invention relates to a forklift capable of mounting a door in a state in which a pipe for forming a cabin frame is not drilled, the forklift having: a door mounting bar, which is mounted on the outer surfaces of rear pipes at both left and right surfaces of the cabin frame of the forklift, has a bent part formed at the upper end thereof, and has a fastening part formed on one side surface thereof by bending so as to be positioned at the rear surface of the rear pipe; a rear window frame which is mounted between both the left and right rear pipes at the rear of the cabin frame and is formed as a square frame having, at both the left and right sides thereof, engagement fastening parts coupled to the fastening part of the door mounting bar; connecting brackets which simultaneously fasten the door mounting bar and the rear window frame while coming in close contact with the rear pipe at the inner side of the cabin frame; and a hinge bracket which is provided at the upper and lower ends of the outer su
    Type: Application
    Filed: March 26, 2019
    Publication date: April 15, 2021
    Inventor: Hak Sung KIM
  • Publication number: 20210051817
    Abstract: A light sintering device is provided. The light sintering device can comprise: a housing having, therein, a cooling hollow portion in which cooling water flows; a beam guide mounted on one side of the housing so as to form one wall of the cooling hollow portion, and guiding sintered light; and an optical filter mounted on the other side of the housing so as to face the beam guide, thereby forming the other wall of the cooling hollow portion, and filtering out a specific wavelength of the sintered light.
    Type: Application
    Filed: June 15, 2020
    Publication date: February 18, 2021
    Applicant: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hak-Sung KIM, Yong Rae Jang, Wan Ho Chung
  • Publication number: 20210047533
    Abstract: Provided is photo-sintering nano ink. The photo-sintering nano ink includes a photo-sintering precursor including a conductive nano particle and an oxide film surrounding the conductive nano particle, polymer binder resin, and an adhesive.
    Type: Application
    Filed: October 30, 2020
    Publication date: February 18, 2021
    Applicant: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hak-Sung Kim, Chunghyeon Ryu
  • Publication number: 20210007182
    Abstract: Provided is a reflector comprising: an outer wall; and an inner wall which reflects the xenon lamp light from a xenon lamp toward an object to be light sintered, and which consists of inner side walls and an inner top wall which are spaced apart by a predetermined distance from the outer wall to allow cooling water for cooling heat generated by the xenon lamp light to flow, wherein at least a part of the inner side walls has the same thickness as at least a part of the inner top wall.
    Type: Application
    Filed: September 18, 2020
    Publication date: January 7, 2021
    Applicant: IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
    Inventors: Hak-Sung KIM, Chung Hyeon Ryu, Yong Rae Jang, Ji Hyeon Chu, Jong Whi Park, Chang Jin Moon