Abstract: Provided is an automatic inspection device and method for inspecting processing quality of laser processing equipment that forms a modified area by irradiating a laser beam into an object to be processed. The automatic inspection device includes: an image film coated on a bottom surface of the object to be processed; an image sensing unit configured to detect a damage image of the object to be processed formed on the image film through irradiation of the laser beam; and an image processing unit configured to process the damage image detected by the image sensing unit.

Abstract: A storage device including: a memory controller configured to output user data received from outside of the storage device in a write operation mode and receive read data in a read operation mode; and a memory device including a memory cell array and a random input and output (I/O) engine, the random I/O engine configured to encode the user data provided from the memory controller using a random I/O code, in the write operation mode, and to generate the read data by decoding internal read data read by a data I/O circuit from the memory cell array using the random I/O code, in the read operation mode.

Abstract: Provided is an automatic inspection device and method for inspecting processing quality of laser processing equipment that forms a modified area by irradiating a laser beam into an object to be processed. The automatic inspection device includes: an image film coated on a bottom surface of the object to be processed; an image sensing unit configured to detect a damage image of the object to be processed formed on the image film through irradiation of the laser beam; and an image processing unit configured to process the damage image detected by the image sensing unit.

Abstract: A memory device includes an interface unit and a memory unit. The interface unit receives a clock signal, a command signal and a data signal, internally adjusts input impedance based upon at least one of the command signal and the clock signal, and generates internal control signal of the memory device based upon the command signal and data signal. The memory unit performs read/write operations based upon the internal control signal.

Abstract: Provided are a semiconductor package, a semiconductor memory module including the semiconductor package, and a system including the semiconductor memory module. The semiconductor package may include a plurality of main terminals arranged on a surface of the semiconductor package with constant intervals, and the plurality of main terminals may include terminals of a first set including a plurality of input/output terminals to which test signals may be input, and terminals of a second set including a plurality of input/output terminals to/from which signals other than the test signals may be input/output.

Abstract: A femto access point in a communication system provides an interface for a UE, an interface for a macro access point or a relay, and an interface for a core network.

Abstract: A non-volatile memory device having a hidden cell located separate from data storage cells, and a method of effectively managing an erase count of the non-volatile memory device. The method includes preparing the non-volatile memory device that includes a hidden cell located separate from data storage cells and is not accessible to users of the data storage cells, and increasing an erase count stored in an erase count storing region of the hidden cell corresponding to at least one erased data storage cell when the at least one data storage cell is erased.

Abstract: An apparatus and method for providing a multicast/broadcast service in a mobile communication system. Upon detecting an occurrence of a multicast data packet, an Internet Protocol (IP) terminal converts the multicast data packet into an alternative multicast data packet, and transmits the alternative multicast data packet to a femto Node B. Upon detecting an occurrence of a broadcast data packet, the IP terminal converts the broadcast data packet into an alternative broadcast data packet, and transmits the alternative broadcast data packet to the femto Node B.

Abstract: Disclosed are a laser processing apparatus and method that can effectively remove a low-k material formed on a wafer. A laser processing apparatus of the invention is a laser processing apparatus that processes a subject on which a low-k material is formed. The laser processing apparatus includes a laser generating unit that emits a laser beam; and an optical system that splits the laser beam emitted from the laser generating unit into two and irradiates the split laser beams onto the subject In this case, the optical system includes a pair of condensing lenses in which cut surfaces that are cut at a predetermined distance from central axes to be parallel to the central axes contact with each other, and the interval between the two split laser beams is the same as the interval between two edges of the low-k material in a removal subject region.

Abstract: A memory device includes an interface unit and a memory unit. The interface unit receives a clock signal, a command signal and a data signal, internally adjusts input impedance based upon at least one of the command signal and the clock signal, and generates internal control signal of the memory device based upon the command signal and data signal. The memory unit performs read/write operations based upon the internal control signal.

Abstract: Provided are a semiconductor package, a semiconductor memory module including the semiconductor package, and a system including the semiconductor memory module. The semiconductor package may include a plurality of main terminals arranged on a surface of the semiconductor package with constant intervals, and the plurality of main terminals may include terminals of a first set including a plurality of input/output terminals to which test signals may be input, and terminals of a second set including a plurality of input/output terminals to/from which signals other than the test signals may be input/output.

Abstract: A non-volatile memory device having a hidden cell located separate from data storage cells, and a method of effectively managing an erase count of the non-volatile memory device. The method includes preparing the non-volatile memory device that includes a hidden cell located separate from data storage cells and is not accessible to users of the data storage cells, and increasing an erase count stored in an erase count storing region of the hidden cell corresponding to at least one erased data storage cell when the at least one data storage cell is erased.

Abstract: Disclosed are a laser processing apparatus and method that can effectively remove a low-k material formed on a wafer. A laser processing apparatus of the invention is a laser processing apparatus that processes a subject on which a low-k material is formed. The laser processing apparatus includes a laser generating unit that emits a laser beam; and an optical system that splits the laser beam emitted from the laser generating unit into two and irradiates the split laser beams onto the subject In this case, the optical system includes a pair of condensing lenses in which cut surfaces that are cut at a predetermined distance from central axes to be parallel to the central axes contact with each other, and the interval between the two split laser beams is the same as the interval between two edges of the low-k material in a removal subject region.

Abstract: A method of multi-processing an object using a polygon mirror according to an embodiment of the invention includes setting processing parameters for individual layers of an object having a multilayer structure, performing laser processing on exposed layers in a region to be processed of the object according to the processing parameters using a polygon mirror, determining whether or not all of the layers of the object having a multilayer structure are processed, and if it is determined in the determining that not all of the layers are processed, progressing the performing of laser processing. Therefore, efficiency in processing the object can be increased, and cracks that occur in the object during laser processing using a polygon mirror can be minimized.

Abstract: Disclosed is a laser processing apparatus for minimizing generation of sludge and enhancing the processing efficiency while processing an object. The laser processing apparatus includes a beam irradiator for emitting a laser beam from a laser light source, a beam scanner for operating the laser beam emitted from the beam scanner, to be irradiated on a predetermined interval of a processing position of the object repeatedly on the straight, and a condensing lens for regulating a focus of the laser beam emitted from the beam irradiator. The object is movable at least once along a processing direction during processing the object. According to the present invention, it is able to improve the processing efficiency and to work an object with a uniform morphology by using a mask filtering a laser beam irradiated at a rotation turning point of a beam scanning mirror, capable of continuously irradiating a laser beam by deforming the laser beam into an elliptical pattern.

Abstract: Disclosed is a laser processing apparatus for minimizing generation of sludge and enhancing the processing efficiency while processing an object. The laser processing apparatus includes a beam irradiator for emitting a laser beam from a laser light source, a beam scanner for operating the laser beam emitted from the beam scanner, to be irradiated on a predetermined interval of a processing position of the object repeatedly on the straight, and a condensing lens for regulating a focus of the laser beam emitted from the beam irradiator The object is movable at least once along a processing direction during processing the object. According to the present invention, it is able to improve the processing efficiency and to work an object with a uniform morphology by using a mask filtering a laser beam irradiated at a rotation turning point of a beam scanning mirror, capable of continuously irradiating a laser beam by deforming the laser beam into an elliptical pattern.

Abstract: A method of multi-processing an object using a polygon mirror according to an embodiment of the invention includes setting processing parameters for individual layers of an object having a multilayer structure, performing laser processing on exposed layers in a region to be processed of the object according to the processing parameters using a polygon mirror, determining whether or not all of the layers of the object having a multilayer structure are processed, and if it is determined in the determining that not all of the layers are processed, progressing the performing of laser processing. Therefore, efficiency in processing the object can be increased, and cracks that occur in the object during laser processing using a polygon mirror can be minimized.

Abstract: This invention relates to a microstrip array antenna, especially a broad-band dual-polarized microstrip array antenna having parallel feeding structure whose consist of two parts power supplying layers each of which generates its own polarization respectively. And the broad-band dual-polarized microstrip array antenna according to the present invention arranges transmission paths for two separate linear polarization on a different layer each other in order to minimize an interference effect and a proximity feeding method and an aperture coupled method are used in order to get two separate polarization.

Abstract: This invention relates to a microstrip array antenna, especially a broad-band dual-polarized microstrip array antenna having parallel feeding structure whose consist of two parts power supplying layers each of which generates its own polarization respectively. And the broad-band dual-polarized microstrip array antenna according to the present invention arranges transmission paths for two separate linear polarization on a different layer each other in order to minimize an interference effect and a proximity feeding method and an aperture coupled method are used in order to get two separate polarization.