Abstract: In recent years there has been a growing market for more universal analysis instruments. Analysis tools such as AFM1, TEM2 and nanoindentation work in similar environments. It is therefore possible, within limits, to use the same equipment to do all of these analyses. Conducting nanoindentation experiments in a TEM has also the advantage of increased accuracy compared to the tests done today. 1 Atomic Force Microscopy 2 Transmission Electron Microscope This project is focused on design and fabrication of a capacitive force sensor for AFM and/or nanoindentation measurements in a TEM. Nanofactory Instruments, the initiator of this, project, has developed a specimen holder for TEM that can be used for nanoindentation experiments. The measurement system used today has its limitations of being to large to be mounted in a TEM and thus an improved model was desired.

Abstract: Method for assembling a micro-, sub-micro- or nano-scale structure includes the steps of providing a set of cells (1A-5A) designed to assemble into a cell structure (C) in a predetermined order. The set of cells (1A-5A) are brought into contact with at least one seed so that a cell structure (C) grows from the seed(s). Before bringing the set of cells into contact with at least one seed, the method includes the step of mixing the set of cells (1A-5A) with at least one set of size-control-units (1B-11B) designed to assemble into a size-control-structure (U) in the vicinity of the cell(s) structure (C) in a predetermined order. The first set of cells (1A-5A) are also mixed with stop blocks (S) designed to prevent further growth of a cell structure (C) when a particular cell in the cell structure (C) becomes substantially adjacently located to a particular size-control-unit in the size-control-structure (U) by attaching to that particular cell and size-control-unit.-.

Abstract: This invention relates to a measurement device for use in an electron microscope. The device comprises a sample holder, for holding a sample to be studied, and an indentation tip, being arranged in proximity of the sample holder, whereby an interaction between the sample and the tip is arranged to be measured. The measurement device comprises a force sensor being positioned in proximity with an interaction area of the sample and the tip and is arranged to directly measure a force resulting from interaction between the sample and the tip.

Abstract: This invention relates to a device for reducing the impact of undesired distortions when studying a sample in an electron microscope, wherein said sample is arranged to be mounted on a micro-positioning device, characterised in that said micro-positioning device is connected with a control device, being arranged to control said micro-positioning device so as to compensate for measurement errors due to undesired distortions.

Abstract: This invention relates to a device for micropositioning of an object (4). e.g. for use in a microscope. The device comprises an acceleration unit (1) and an intermediate part (3), connecting said acceleration unit (1) with said object (4). The position of the object relative to the acceleration unit (1) is variable at high acceleration or retardation of said acceleration unit (1), owing to mechanical inertia of the object (4). Further, the intermediate part (3) has a first end (3′), being attached to said acceleration unit (1), and a second end (3″), being provided with an essentially circumferential contact surface (3a), and the object (4) is provided with clamping elements (4′).

Abstract: An access point for mobile devices with wireless communication capability for usage in a packet based network, said network comprising at least one gateway having access to a remote service, the access point comprises communication means for establishing communication with at least one or more access point in order to form a network between at least said access points. Also, there are means for adding the identity of the mobile device; and registering means for registering the identity of data packets transferred through said access point. The invention also concerns a method and system for billing in such a network.

Abstract: This invention relates to a method for increasing the measurement information available from a transmission electron microscope, said information relating to a measurement sample, comprising the step of: including, in said transmission electron microscope, an atomic force microscopy device. This invention also relates to a transmission electron microscopy device, characterised in that a transmission electron microscope is combined with an atomic force microscope, positioned within said transmission electron microscope. Finally, the invention relates to a device for insertion in a transmission electron microscope, characterised in that said device comprises an atomic force microscopy device.

Abstract: The invention relates to a device for micropositioning of objects, for example, in microscopy. The device comprises an accelerating means and a positioning unit connected therewith and connected with the object. The position of the object relative to the positioning unit can be changed at high acceleration or retardation of the accelerating means owing to mechanical inertia of the object. The positioning unit comprises at least two clamping elements between which the object is intended to be held merely by the clamping force and the frictional force exerted by these clamping elements.