Patents by Inventor Hamed Bazaz

Hamed Bazaz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11493484
    Abstract: A method of detecting corrosion in a conduit or container comprises measuring the thickness of a wall of the conduit or container with one or more pulse-echo ultrasound devices, wherein the method comprises the following steps: (i) receiving signals indicative of A-scan data from the one or more pulse-echo ultrasound devices, wherein the A-scan data comprises a plurality of A-scan spectra; (ii) determining which of the A-scan spectra have a distorted waveform such that a reliable wall thickness measurement cannot be determined; (iii) analysing the A-scan spectra identified in step (ii) as having a distorted waveform to determine one or more A-scan spectral characteristics of each spectrum that are causing the distortion; (iv) resolving the waveform characteristics based on the determined spectral characteristics causing the waveform distortion so as to produce modified A-scan spectra; (v) determining thickness measurements of the wall based on the modified A-scan spectra; and (vi) determining the extent to wh
    Type: Grant
    Filed: July 26, 2018
    Date of Patent: November 8, 2022
    Assignee: BP CORPORATION NORTH AMERICA INC.
    Inventors: Linxiao Yu, Margarit Lozev, Thomas Eason, Steven Orwig, Christopher Overstreet, Hamed Bazaz
  • Publication number: 20200166480
    Abstract: A method of detecting corrosion in a conduit or container comprises measuring the thickness of a wall of the conduit or container with one or more pulse-echo ultrasound devices, wherein the method comprises the following steps: (i) receiving signals indicative of A-scan data from the one or more pulse-echo ultrasound devices, wherein the A-scan data comprises a plurality of A-scan spectra; (ii) determining which of the A-scan spectra have a distorted waveform such that a reliable wall thickness measurement cannot be determined; (iii) analysing the A-scan spectra identified in step (ii) as having a distorted waveform to determine one or more A-scan spectral characteristics of each spectrum that are causing the distortion; (iv) resolving the waveform characteristics based on the determined spectral characteristics causing the waveform distortion so as to produce modified A-scan spectra; (v) determining thickness measurements of the wall based on the modified A-scan spectra; and (vi) determining the extent to wh
    Type: Application
    Filed: July 26, 2018
    Publication date: May 28, 2020
    Inventors: Linxiao Yu, Margarit Lozev, Thomas Eason, Steven Orwig, Christopher Overstreet, Hamed Bazaz