Abstract: A phase look loop (PLL) device has a dynamic lock range that is based on a temperature measured during a calibration process. The PLL device includes a calibration circuit configured to receive a temperature reading corresponding to a junction temperature of the PLL device during the calibration process. Based on this temperature reading, the calibration circuit initiates a preset procedure that presets a control voltage of a voltage control oscillator in the PLL device. The preset procedure implements a calibration function defined by a slope with a numerator component and a denominator component. The numerator component corresponds to a range of the control voltage, whereas the denominator component corresponds to a range of ambient temperatures within which the PLL device operates.

Abstract: A phase look loop (PLL) device has a dynamic lock range that is based on a temperature measured during a calibration process. The PLL device includes a calibration circuit configured to receive a temperature reading corresponding to a junction temperature of the PLL device during the calibration process. Based on this temperature reading, the calibration circuit initiates a preset procedure that presets a control voltage of a voltage control oscillator in the PLL device. The preset procedure implements a calibration function defined by a slope with a numerator component and a denominator component. The numerator component corresponds to a range of the control voltage, whereas the denominator component corresponds to a range of ambient temperatures within which the PLL device operates.

Abstract: A phase look loop (PLL) device has a dynamic lock range that is based on a temperature measured during a calibration process. The PLL device includes a calibration circuit configured to receive a temperature reading corresponding to a junction temperature of the PLL device during the calibration process. Based on this temperature reading, the calibration circuit initiates a preset procedure that presets a control voltage of a voltage control oscillator in the PLL device. The preset procedure implements a calibration function defined by a slope with a numerator component and a denominator component. The numerator component corresponds to a range of the control voltage, whereas the denominator component corresponds to a range of ambient temperatures within which the PLL device operates.

Abstract: A phase look loop (PLL) device has a dynamic lock range that is based on a temperature measured during a calibration process. The PLL device includes a calibration circuit configured to receive a temperature reading corresponding to a junction temperature of the PLL device during the calibration process. Based on this temperature reading, the calibration circuit initiates a preset procedure that presets a control voltage of a voltage control oscillator in the PLL device. The preset procedure implements a calibration function defined by a slope with a numerator component and a denominator component. The numerator component corresponds to a range of the control voltage, whereas the denominator component corresponds to a range of ambient temperatures within which the PLL device operates.

Abstract: An integrated automatic IIP2 calibration architecture for wireless transceivers is disclosed. The architecture enables a wireless transceiver to generate a test radio frequency (RF) signal having a second order tone with minimal additional circuitry. In particular, the test RF signal is generated using a combination of native transceiver circuits and test adaptor circuits. Native transceiver circuits are those circuits implemented on the transceiver chip for executing native transceiver functions during normal operation, which can be used for generating the test (RF) signal. Test adaptor circuits are added to the transceiver chip, more specifically to the native circuits, for enabling the native circuits to generate the test RF signal in a self-test mode of operation. Circuits for implementing a particular IIP2 minimizing scheme can be included on the transceiver chip for automatic IIP2 calibration during the self-test mode of operation.