Patents by Inventor Hamish Ian STEWART

Hamish Ian STEWART has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190180998
    Abstract: A time of flight (“TOF”) mass spectrometer and method thereof. The TOF mass spectrometer including: an ion source configured to produce ions having a plurality of m/z values; a detector for detecting ions produced by the ion source; a tilt correction device located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector; wherein the tilt correction device includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path, the at least one dipole electric field being configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector.
    Type: Application
    Filed: February 21, 2019
    Publication date: June 13, 2019
    Applicant: SHIMADZU CORPORATION
    Inventors: Hamish Ian STEWART, Matthew GILL, Roger GILES
  • Patent number: 10269549
    Abstract: A time of flight (“TOF”) mass spectrometer including an ion source, a detector, and a tilt correction device. The ion source is configured to produce ions having a plurality of m/z values. The detector detects ions produced by the ion source. The tilt correction device is located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector and includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path. The at least one dipole electric field is configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector.
    Type: Grant
    Filed: September 27, 2016
    Date of Patent: April 23, 2019
    Assignee: SHIMADZU CORPORATION
    Inventors: Hamish Ian Stewart, Matthew Gill, Roger Giles
  • Publication number: 20170098533
    Abstract: A time of flight (“TOF”) mass spectrometer including: an ion source configured to produce ions having a plurality of m/z values; a detector for detecting ions produced by the ion source; a tilt correction device located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector; wherein the tilt correction device includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path, the at least one dipole electric field being configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector.
    Type: Application
    Filed: September 27, 2016
    Publication date: April 6, 2017
    Applicant: SHIMADZU CORPORATION
    Inventors: Hamish Ian STEWART, Matthew GILL, Roger GILES