Abstract: A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor.

Abstract: Apparatuses for trapping ions comprise an array of electrodes extending along a surface and one or more further electrodes that are distinct from the array of electrodes. A trapping region for receiving the ions is defined by the array of electrodes and the one or more further electrodes. A control circuit is configured to apply a set of oscillatory voltages to the array of electrodes to repel the ions, wherein each electrode in the array has a different phase to each adjacent electrode. A trapping voltage is applied to at least one of the one or more further electrodes to force the ions towards the array of electrodes, the set of oscillatory voltages and the trapping voltage thereby trapping the ions within the trapping region, wherein the trapping voltage is a time-varying direct current, DC, voltage that increases in magnitude over time.

Abstract: An ion guide is provided for a spectrometer. The ion guide comprises a first electrode assembly, comprising a plurality of guide electrodes aligned along a central axis. Each guide electrode comprises an aperture. The apertures define an ion channel from a first end of the first electrode assembly to a second end of the first electrode assembly. The ion channel is configured to receive an ion beam at the first end. The guide electrodes are configured to receive RF voltages to define a confinement volume for the ion beam, wherein the confinement volume is centred about the central axis. The ion guide comprises a second electrode assembly adjacent to the first electrode assembly, wherein the second electrode assembly is configured to receive a DC voltage, such that a centre of the ion beam is deflected to be off the central axis.

Abstract: An analytical instrument comprises a mass analyser and first and second ion traps coupled to the mass analyser. A method of operating the instrument comprises operating the first ion trap in a mode of operation in which the first ion trap confines ions within a first mass-to-charge ratio (m/z) range, storing first ions in the first ion trap, operating the second ion trap in a mode of operation in which the second ion trap confines ions within a second different mass-to-charge ratio (m/z) range, and storing second ions in the second ion trap. The method further comprises ejecting the first ions from the first ion trap into the mass analyser, ejecting the second ions from the second ion trap into the mass analyser, and mass analysing the first ions and the second ions.

Abstract: A Time of Flight (TOF) mass analyser comprises an ion source, a detector, an electrode, and a resistive divider comprising first and second resistors. The ion source and the detector define an ion flight path from the ion source to the detector. The electrode is arranged along the ion flight path and receives an output voltage. Thermal expansion produces a first mass shift/Kelvin of detected ions. The resistive divider is thermally coupled to the TOF mass analyser to receive an input voltage and output an output voltage to the electrode. The first and second resistors have respective first and second temperature coefficients that provide a voltage shift/Kelvin to the output voltage to the electrode producing a second mass shift/Kelvin of detected ions, compensating for the first mass shift/Kelvin.

Abstract: A method of analysing a signal generated by a mass analyser comprises receiving a signal generated by the mass analyser, determining the area of a first ion peak of one or more ion peaks in the signal, and estimating the number of ions that contributed to the first ion peak. The number of ions that contributed to the first ion peak is estimated by determining a correction to be applied to the area of the first ion peak from a correction function, and applying the correction to the area of the first ion peak. The correction function describes a relationship between average single ion area and ion mass, mass-to-charge ratio and/or charge for the mass analyser.

Abstract: An ion guide with a switchable ion path for a spectrometer includes a first ion transport aperture configured to receive an ion beam. A radio frequency surface comprises a plurality of radio frequency electrodes arranged on a first surface, such that the radio frequency electrodes are parallel. A radio frequency voltage source is configured to apply an alternating radio frequency phase to each radio frequency electrode. A DC potential source is configured to apply a DC gradient across the radio frequency surface. The DC gradient is configured to guide an ion beam via either a first ion path or a second ion path. Ions travelling in the first ion path are directed between the first ion transport aperture and a second ion transport aperture. Ions travelling in the second ion path are directed between the first ion transport aperture and a third ion transport aperture.

Abstract: A method of analysing labelled analyte ions comprises fragmenting labelled analyte ions to produce analyte fragment ions and reporter ions or complementary ions, analysing the analyte fragment ions using a time-of-flight mass analyser operating in a first mode of operation, and analysing the reporter ions or the complementary ions using the time-of-flight mass analyser operating in a second mode of operation. In the first mode of operation, ions are caused to travel along a flight path having a first length, and in the second mode of operation, ions are caused to travel along a flight path having a second length, wherein the second length is greater than the first length.

Abstract: An ion guide may comprise a set of plate electrodes, each plate electrode having a plurality of apertures formed therethrough. The set of plate electrodes are spatially arranged such that a relative positioning of each plurality of apertures of a respective plate electrode of the set of plate electrodes and respective adjacent plate electrodes of the set of plate electrodes defines a continuous ion flight path through the respective plurality of apertures of each plate electrode of the set of plate electrodes. The continuous ion flight path has a helical-based and/or spiral-based shape.

Abstract: Embodiments provide methods of disambiguating the spectra produced by cyclic ion analysers. Systems, methods, and computer readable media described herein can compare two sets of ion data that have been obtained using different analyser settings such that the number of passes N through the cyclic segment of the ion path taken by ions contributing to an ion peak can be determined. As a result of the determination of the number of passes N taken by ions, the physicochemical property of those ions can be unambiguously assigned to the ion peak.

Abstract: An ion mirror for a time of flight mass spectrometer (ToF) is provided. The ion mirror is elongated from a first end to a second end along a drift direction (z) and is configured to reflect ions in a reflection direction (y) orthogonal to the drift direction. The ion mirror comprises a plurality of elongate mirror electrodes and at least one Fringe Field Correcting (FFC) assembly. Each of the elongate mirror electrodes extends in the drift direction. Each of the plurality of elongate mirror electrodes is configured to receive a respective mirror electrode voltage in order to provide an electrostatic field of the ion mirror. The at least one FFC assembly is provided at the first and/or second end of the ion mirror. The FFC assembly comprises a plurality of electrodes, the plurality of electrodes extending in a plane orthogonal to the drift direction, each electrode configured to receive a respective FFC voltage.

Abstract: A method of analysing data generated by an ion analyser comprises (i) receiving a segment of data generated by an ion analyser, wherein the segment of data comprises data associated with a first arrival time range, and (ii) applying a filter to the segment of data so as to produce a filtered version of the segment of data. A width associated with the filter is configured to depend upon a width of an expected ion arrival time distribution for the ion analyser for arrival times within the first arrival time range. The method further comprises (iii) identifying one or more ion peaks in the filtered version of the segment of data, and then (iv) determining one or more characteristics of each ion peak of the one or more identified ion peaks.

Abstract: Systems, methods, and computer-readable media described provide multi-reflection time-of-flight analyser (e.g. of a type in which the ion beam is allowed to spread out relatively broadly) and methods for use in a zoom mode, in which time-of-flight perturbations induced by reflections at the deflector are cancelled out or removed, such that they do not give rise to a significant increase in the arrival time spread of ions at the detector. This accordingly facilitates high resolution operation of the analyser in the zoom mode. Furthermore, this is done in a way which allows the analyser to remain drift focussed, which in turn means that the analyser can be straightforwardly and seamlessly switched between its normal mode of operation and the zoom mode of operation.

Abstract: A method of operating an instrument which comprises a first and second ion stores, comprising determining whether a target accumulation time for the second ion store is greater than a threshold accumulation time. When the target accumulation time is less than the threshold accumulation time, ions are accumulated within the second ion store using an accumulation time that is based on the target accumulation time. When the target accumulation time is greater than the threshold accumulation time, ions are accumulated within the first ion store using a first accumulation time that is based on a difference between the target accumulation time and the threshold accumulation time, the ions accumulated in the first ion store are passed to the second ion store, and further ions are accumulated within the second ion store using a second accumulation time that is based on the threshold accumulation time.

Abstract: An ion guide may comprise a set of plate electrodes, each plate electrode having a plurality of apertures formed therethrough. The set of plate electrodes are spatially arranged such that a relative positioning of each plurality of apertures of a respective plate electrode of the set of plate electrodes and respective adjacent plate electrodes of the set of plate electrodes defines a continuous ion flight path through the respective plurality of apertures of each plate electrode of the set of plate electrodes. The continuous ion flight path has a helical-based and/or spiral-based shape.

Abstract: A method for correcting mass spectral data obtained for a sample is described, where the mass spectral data is a time-of-flight mass spectral data. The method includes receiving mass spectral data obtained from a sample, the mass spectral data being indicative of an ion abundance. The method further includes applying a correction function to the mass spectral data based on the ion abundance indicated by the mass spectral data and on one or more trapping parameters associated with the mass spectral data. The correction function defines correction values for the mass spectral data for a range of ion abundances and for a range of trapping parameters.

Abstract: A mass spectrometer comprises: a first ion optical device in a relatively low gas pressure region; a second ion optical device in a relatively high gas pressure region, the first and second ion optical devices receiving respective RF voltages from respective RF power supplies for generating respective RF fields that confine ions in respective trapping regions of the ion optical devices; and a gas conductance restriction, restricting gas flow from the relatively high gas pressure region to the relatively low gas pressure region, the gas conductance restriction having an aperture to allow ions to pass from the second to the first ion optical device. The first and second RF power supplies are independent to allow the RF voltages for generating the first RF field to have a different amplitude from the RF voltages for generating the second RF field.

Abstract: The present invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer wherein the time-of-flight mass spectrometer is contained within the vacuum chamber. The time-of-flight mass spectrometer comprising a first electrode and a second electrode, the second electrode being spaced apart from the first electrode at a distance defining a portion of an ion-flight path therebetween. The assembly further comprising a first support for supporting the first electrode, the first support arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to permit relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The present invention also relates to a multi-reflection time-of-flight mass analyser.

Abstract: A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor. The first resistor is configured to define the first voltage, the first resistor having a first temperature coefficient. The second resistor is configured to define the second voltage, the second resistor having a second temperature coefficient.

Abstract: A mass spectrometer includes a controller operable to: transfer first ions of a first charge into an ion trap; apply an RF pseudopotential that radially confines the first ions in an elongate ion channel of the trap; generate a first potential well that confines the first ions within a first volume; after a specified pre-cooling time, transfer second ions of a second, opposite charge into the trap; apply one or more additional DC potentials that generate a second potential well that confines the second ions within a second volume, the first potential well being within the second potential well; cause, after cooling the second ions, the first ions and the second ions to interact and generate product ions; and generate at least one third potential well that confines the product ions, that is adjacent to the second potential well and that has a same polarity as the first potential well.