Patents by Inventor Han-Chao Wei

Han-Chao Wei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040137371
    Abstract: In semiconductor manufacturing, a pellicle film (28) is used to protect the surface of a reticle (24). The reticle (24) is used in an optical microlithography system (10) to pattern semiconductor wafers (18). To work properly, the pellicle (28) must be transparent at the particular wavelength of light used to expose photoresist through the reticle (24). The pellicle (28) is made more transparent to short wavelength light used by the optical microlithography system by removing unwanted hydrogen in the pellicle (28). The unwanted hydrogen is removed by exposing the pellicle (28) to a gas containing fluorine. This unwanted hydrogen apparently came as artifacts of the process of the making the pellicle (28), particularly the chemicals introduced to terminate the polymerization process and the ones used as solvents.
    Type: Application
    Filed: January 9, 2003
    Publication date: July 15, 2004
    Inventors: Cesar M. Garza, Thomas Ray Bierschenk, Han-Chao Wei, Hajimu Kawa
  • Patent number: 6426391
    Abstract: A method of fluorinating a substance comprises providing a reaction mixture comprising a liquid or supercritical carbon dioxide reaction medium, a first reactant, and a second reactant, wherein the first reactant is a fluorinating reagent, and then contacting the first reactant and the second reactant in the carbon dioxide such that the first reactant fluorinates the second reactant.
    Type: Grant
    Filed: May 7, 1999
    Date of Patent: July 30, 2002
    Assignees: The University of North Carolina at Chapel Hill, North Carolina State University
    Inventors: Joseph M. DeSimone, Han-Chao Wei, Timothy J. Romack