Patents by Inventor Han-Jen Yu

Han-Jen Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for the on-machine 2-D contour measurement
    Patent number: 8103376
    Abstract: The present invention provides a system and method for the on-machine 2-D contour measurement, employing the contour measurement, coordinate system transformation, error identification, and image matching theory in image processing field to develop the on-machine measurement of X-Y-plan manufacturing error of a micro device manufactured by a high-precision micro-device machine tool, contour error, and trace error.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: January 24, 2012
    Assignee: Chung Yuan Christian University
    Inventors: Shih-Ming Wang, Han-Jen Yu
  • System and method for on-machine 3-D depth measurement
    Patent number: 7929155
    Abstract: The present invention provides a method and system for on-machine 3-D depth measurement. The same image retrieving apparatus measures the first distance for the width of the similar gray-level region of cutting-surface from the first angle, and measures the second distance for the width of the similar gray-level region of cutting-surface from the first angle superimposing the second angle. The width of the similar gray-level region of cutting-surface comprises the cutting-surface and the shadow of the bottom portion of the cutting-surface. And then the cutting-surface depth is calculated according to the first angle, the second angle, the first distance, and the second distance.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: April 19, 2011
    Assignee: Chung Yuan Christian University
    Inventors: Shih-Ming Wang, Han-Jen Yu
  • System and Method for on-machine 3-D depth measurement
    Publication number: 20100060907
    Abstract: The present invention provides a method and system for on-machine 3-D depth measurement. The same image retrieving apparatus measures the first distance for the width of the similar gray-level region of cutting-surface from the first angle, and measures the second distance for the width of the similar gray-level region of cutting-surface from the first angle superimposing the second angle. The width of the similar gray-level region of cutting-surface comprises the cutting-surface and the shadow of the bottom portion of the cutting-surface. And then the cutting-surface depth is calculated according to the first angle, the second angle, the first distance, and the second distance.
    Type: Application
    Filed: September 5, 2008
    Publication date: March 11, 2010
    Applicant: CHUNG YUAN CHRISTIAN UNIVERSITY
    Inventors: Shih-Ming Wang, Han-Jen Yu
  • SYSTEM AND METHOD FOR THE ON-MACHINE 2-D CONTOUR MEASUREMENT
    Publication number: 20100063612
    Abstract: The present invention provides a system and method for the on-machine 2-D contour measurement, employing the contour measurement, coordinate system transformation, error identification, and image matching theory in image processing field to develop the on-machine measurement of X-Y-plan manufacturing error of a micro device manufactured by a high-precision micro-device machine tool, contour error, and trace error.
    Type: Application
    Filed: September 5, 2008
    Publication date: March 11, 2010
    Applicant: CHUNG YUAN CHRISTIAN UNIVERSITY
    Inventors: Shih-Ming Wang, Han-Jen Yu