Patents by Inventor Han-Kuei Fu
Han-Kuei Fu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240027755Abstract: A head-mounted eye tracking system including an eye tracker, a signal processor, and a plurality of light-emitting optical guides is provided. The eye tracker is adaptable for sensing eyeballs of a wearer. The eye tracker includes a plurality of light-emitting devices and a plurality of sensing devices. The plurality of light-emitting devices are adaptable for emitting a tracking beam. The sensing devices are adaptable for receiving the tracking beam reflected by the eyeballs of the wearer. The signal processor is signally connected to the eye tracker. The plurality of light-emitting optical guides is disposed corresponding to the plurality of light-emitting devices.Type: ApplicationFiled: October 5, 2023Publication date: January 25, 2024Applicant: Industrial Technology Research InstituteInventors: Chia-Hsin Chao, Han-Kuei Fu, Meng-Han Lin, Ming-Hsien Wu
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Publication number: 20230234654Abstract: A vacuum suction wall-climbing robot including a body, a vacuum pump and at least four leg mechanisms is disclosed. Each leg mechanism includes a foot unit and a limb unit connecting the foot unit and the body. The foot unit includes a plurality of suction sets connected to the vacuum pump through a pipe. Each suction set includes a sucker able to create a vacuum state within a contact area through the operation of the vacuum pump, and a sheet valve arranged between the pipe and the sucker, which automatically closes the connection between the pipe and the sucker when the vacuum state between the sucker and the contact area becomes a non-vacuum state.Type: ApplicationFiled: May 12, 2022Publication date: July 27, 2023Inventors: Chao-Jen LI, Sheng-Wen YEH, Han-Kuei FU, Chin-Pang TU, Shi-Dian LUO
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Patent number: 11290663Abstract: A thermal image sensing system including at least one thermal sensor, at least one light sensor, an image identification module, a storage module and a computing module is provided. The thermal sensor senses thermal radiation emitted by an object and generates a thermal radiation image signal correspondingly. The light sensor senses visible light reflected by the object and generates at least one visible light image signal correspondingly. The image identification module receives the visible light image signal generated by the light sensor and determines a material of the object according to the at least one visible light image signal. The storage module stores a radiation coefficient of the material of the object. The computing module calculates a surface temperature of the object according to the radiation coefficient of the material of the object and the thermal radiation emitted by the object. A thermal image sensing method is also provided.Type: GrantFiled: January 21, 2020Date of Patent: March 29, 2022Assignee: Industrial Technology Research InstituteInventors: Han-Kuei Fu, Hsueh-Chih Chang, Shih-Yi Wen, Hung-Lieh Hu
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Publication number: 20200252558Abstract: A thermal image sensing system including at least one thermal sensor, at least one light sensor, an image identification module, a storage module and a computing module is provided. The thermal sensor senses thermal radiation emitted by an object and generates a thermal radiation image signal correspondingly. The light sensor senses visible light reflected by the object and generates at least one visible light image signal correspondingly. The image identification module receives the visible light image signal generated by the light sensor and determines a material of the object according to the at least one visible light image signal. The storage module stores a radiation coefficient of the material of the object. The computing module calculates a surface temperature of the object according to the radiation coefficient of the material of the object and the thermal radiation emitted by the object. A thermal image sensing method is also provided.Type: ApplicationFiled: January 21, 2020Publication date: August 6, 2020Applicant: Industrial Technology Research InstituteInventors: Han-Kuei Fu, Hsueh-Chih Chang, Shih-Yi Wen, Hung-Lieh Hu
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Patent number: 10271410Abstract: A light controlling method, a light controlling device, and a computer program product are provided. The light controlling method includes: displaying a user controlling interface which includes a plurality of first input parameter fields; receiving a first input parameter input through the first input parameter fields; obtaining a light parameter set corresponding to the first input parameters from a human factor light parameter table; transmitting a wireless signal to control a light according to the light parameter set.Type: GrantFiled: May 8, 2018Date of Patent: April 23, 2019Assignee: Industrial Technology Research InstituteInventors: Yin-Jie Wang, Tzung-Te Chen, Han-Kuei Fu
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Patent number: 9992842Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The light source includes a color temperature adjustable light source. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.Type: GrantFiled: December 26, 2016Date of Patent: June 5, 2018Assignee: Industrial Technology Research InstituteInventors: Ya-Hui Chiang, Tzung-Te Chen, Chia-Fen Hsieh, Shih-Yi Wen, Han-Kuei Fu
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Patent number: 9980338Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.Type: GrantFiled: May 2, 2017Date of Patent: May 22, 2018Assignee: Industrial Technology Research InstituteInventors: Ya-Hui Chiang, Shih-Yi Wen, Chia-Fen Hsieh, Chun-Hsing Lee, Chien-Chun Lu, Han-Kuei Fu
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Publication number: 20170238394Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.Type: ApplicationFiled: May 2, 2017Publication date: August 17, 2017Applicant: Industrial Technology Research InstituteInventors: Ya-Hui Chiang, Shih-Yi Wen, Chia-Fen Hsieh, Chun-Hsing Lee, Chien-Chun Lu, Han-Kuei Fu
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Patent number: 9726713Abstract: A testing method and testing system for a semiconductor element are provided. The method includes following steps. A level of a testing electrostatic discharge (ESD) voltage is determined. A plurality of sample components is provided. The testing ESD voltage is imposed on the sample components for testing ESD decay rates of the sample components. ESD withstand voltages of the sample components are detected. The relation between the ESD withstand voltages and the electrostatic discharge rates are recorded to a database. The testing ESD voltage is imposed on the semiconductor element for testing an ESD decay rate of the semiconductor element. The database is looked up according to the ESD decay rate of the semiconductor element to determine an ESD withstand voltage of the semiconductor element.Type: GrantFiled: April 16, 2013Date of Patent: August 8, 2017Assignee: Industrial Technology Research InstituteInventors: Tzung-Te Chen, Chun-Fan Dai, Han-Kuei Fu, Chien-Ping Wang, Pei-Ting Chou
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Patent number: 9693408Abstract: A light source apparatus including a light-emitting module and a control unit is provided. The light-emitting module is configured to provide a light. The control unit makes the light emitted from the light-emitting module switched between a first light and a second light. A spectrum of the first light is different from a spectrum of the second light, and color temperatures of the first light and the second light are substantially the same as each other.Type: GrantFiled: June 23, 2015Date of Patent: June 27, 2017Assignee: Industrial Technology Research InstituteInventors: Chien-Chun Lu, Shih-Yi Wen, Han-Kuei Fu, Chun-Hsing Lee, Ya-Hui Chiang, Chia-Fen Hsieh
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Patent number: 9674920Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.Type: GrantFiled: December 1, 2015Date of Patent: June 6, 2017Assignee: Industrial Technology Research InstituteInventors: Ya-Hui Chiang, Shih-Yi Wen, Chia-Fen Hsieh, Chun-Hsing Lee, Chien-Chun Lu, Han-Kuei Fu
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Publication number: 20170111973Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The light source includes a color temperature adjustable light source. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.Type: ApplicationFiled: December 26, 2016Publication date: April 20, 2017Applicant: Industrial Technology Research InstituteInventors: Ya-Hui Chiang, Tzung-Te Chen, Chia-Fen Hsieh, Shih-Yi Wen, Han-Kuei Fu
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Publication number: 20160157321Abstract: An illumination system that includes a light source device and an algorithm unit is provided. The algorithm unit is coupled to the light source device and outputs a control signal to the light source device according to a reflection spectrum of an object, a visual color matching function, a visual preference correction function, or a combination of the above. The light source device outputs an illumination beam according to the control signal, so as to develop target visual perception of the object while the object is being irradiated by the illumination beam. A method for developing target visual perception of an object is also provided.Type: ApplicationFiled: December 1, 2015Publication date: June 2, 2016Inventors: Ya-Hui Chiang, Shih-Yi Wen, Chia-Fen Hsieh, Chun-Hsing Lee, Chien-Chun Lu, Han-Kuei Fu
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Patent number: 9341669Abstract: The disclosure discloses a light emitting diode testing apparatus, which includes a power supply module, a probe, a control unit and a data acquisition unit. The power supply module provides a first current or a second current to a testing item. The probe measures characteristics of the testing item. The control unit controls the power supply module to provide the first current or the second current. The data acquisition unit acquires the characteristics of the testing item from the probe. The power supply module includes a first current source, at least one second current source and at least one protector. The first current source provides the first current to the testing item. The at least one second current source provides at least one additional current. The at least one protector prevents the first current from feeding back to the at least one second current source.Type: GrantFiled: September 18, 2013Date of Patent: May 17, 2016Assignee: Industrial Technology Research InstituteInventors: Chien-Ping Wang, Tzung-Te Chen, Yen-Liang Liu, Chun-Fan Dai, Han-Kuei Fu, Pei-Ting Chou
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Publication number: 20150327342Abstract: A light source apparatus including a light-emitting module and a control unit is provided. The light-emitting module is configured to provide a light. The control unit makes the light emitted from the light-emitting module switched between a first light and a second light. A spectrum of the first light is different from a spectrum of the second light, and color temperatures of the first light and the second light are substantially the same as each other.Type: ApplicationFiled: June 23, 2015Publication date: November 12, 2015Inventors: Chien-Chun Lu, Shih-Yi Wen, Han-Kuei Fu, Chun-Hsing Lee, Ya-Hui Chiang, Chia-Fen Hsieh
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Publication number: 20140107961Abstract: A testing method and testing system for a semiconductor element are provided. The method includes following steps. A level of a testing electrostatic discharge (ESD) voltage is determined. A plurality of sample components is provided. The testing ESD voltage is imposed on the sample components for testing ESD decay rates of the sample components. ESD withstand voltages of the sample components are detected. The relation between the ESD withstand voltages and the electrostatic discharge rates are recorded to a database. The testing ESD voltage is imposed on the semiconductor element for testing an ESD decay rate of the semiconductor element. The database is looked up according to the ESD decay rate of the semiconductor element to determine an ESD withstand voltage of the semiconductor element.Type: ApplicationFiled: April 16, 2013Publication date: April 17, 2014Applicant: Industrial Technology Research InstituteInventors: Tzung-Te Chen, Chun-Fan Dai, Han-Kuei Fu, Chien-Ping Wang, Pei-Ting Chou
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Publication number: 20140015531Abstract: The disclosure discloses a light emitting diode testing apparatus, which includes a power supply module, a probe, a control unit and a data acquisition unit. The power supply module provides a first current or a second current to a testing item. The probe measures characteristics of the testing item. The control unit controls the power supply module to provide the first current or the second current. The data acquisition unit acquires the characteristics of the testing item from the probe. The power supply module includes a first current source, at least one second current source and at least one protector. The first current source provides the first current to the testing item. The at least one second current source provides at least one additional current. The at least one protector prevents the first current from feeding back to the at least one second current source.Type: ApplicationFiled: September 18, 2013Publication date: January 16, 2014Applicant: Industrial Technology Research InstituteInventors: Chien-Ping Wang, Tzung-Te Chen, Yen-Liang Liu, Chun-Fan Dai, Han-Kuei Fu, Pei-Ting Chou