Abstract: A method of sorting a multi-bit per cell non-volatile memory includes programming and reading to test an n-bit-per-cell (n-bpc) non-volatile memory, which has a plurality of m-bpc pages, where m is a positive integer from 1 through n. If the m-bpc page fails the test, counting a block associated with the failed m-bpc page to (m-1)-bpc blocks, wherein each said m-bpc page is subjected to at most one time of programming and reading. When m is equal to 1, the 0-bpc block corresponds to a bad block.

Abstract: A method of programming a multi-bit per cell non-volatile memory is disclosed. In one embodiment, the non-volatile memory is read to obtain a first data of a most-significant-bit (MSB) page on a current word line that succeeds in data reading, wherein the current word line follows a preceding word line on which data reading fails. At least one reference voltage is set. The MSB page on the current word line is secondly programmed with a second data according to the reference voltage, the second data being different from the first data.

Abstract: A method of programming/reading a multi-bit per cell non-volatile memory with a sequence is disclosed. A plurality of less-significant-bit pages are programmed, and a plurality of consecutive most-significant-bit pages of a plurality of consecutive word lines are programmed one after the other in a consecutive order. The most-significant-bit pages through all word lines in at least one memory block of the non-volatile memory are programmed or read after the less-significant-bit pages through all the word lines in the at least one memory block are programmed or read.

Abstract: A method of dynamic data storage for error correction in a memory device is disclosed. Data for storage is received, the received data is encoded and error correction code (ECC) is generated. The encoded data is stored in the memory device that includes a plurality of pages each having a plurality of data partitions. More corrected errors a marked page has, a smaller portion with a space of at least one datum of each of the corresponding data partitions associated with the marked page is allocated to store the encoded data, while a size of the ECC is fixed, thereby increasing capability of correcting errors in the marked page.

Abstract: A method of programming/reading a multi-bit per cell non-volatile memory with a sequence is disclosed. A plurality of less-significant-bit pages are programmed, and a plurality of consecutive most-significant-bit pages of a plurality of consecutive word lines are programmed one after the other in a consecutive order. The most-significant-bit pages through all word lines in at least one memory block of the non-volatile memory are programmed or read after the less-significant-bit pages through all the word lines in the at least one memory block are programmed or read.

Abstract: A method of programming a multi-bit per cell non-volatile memory is disclosed. In one embodiment, the non-volatile memory is read to obtain a first data of a most-significant-bit (MSB) page on a current word line that succeeds in data reading, wherein the current word line follows a preceding word line on which data reading fails. At least one reference voltage is set. The MSB page on the current word line is secondly programmed with a second data according to the reference voltage, the second data being different from the first data.

Abstract: A method of twice programming a multi-bit per cell non-volatile memory with a sequence is disclosed. At least one page at a given word line is firstly programmed with program data by a controller of the non-volatile memory, and at least one page at a word line preceding the given word line is secondly programmed with the same program data by the controller.

Abstract: The invention relates to a motor assembly having an electric motor for driving a pressure washer pump, and the electric motor having an integral stainless steel cooling jacket surrounding the motor for efficiently using a liquid, such as water, to conduct heat away from the electric motor.

Abstract: A method of programming a multi-bit per cell non-volatile memory is disclosed. In one embodiment, the non-volatile memory is read to obtain a first data of a most-significant-bit (MSB) page on a current word line that succeeds in data reading, wherein the current word line follows a preceding word line on which data reading fails. At least one reference voltage is set. The MSB page on the current word line is secondly programmed with a second data according to the reference voltage, the second data being different from the first data.

Abstract: A method of dynamic data storage for error correction in a memory device is disclosed. Data for storage is received, and the received data is then encoded and associated error correction code (ECC) is generated. The encoded data is stored in a portion of a data partition of the memory device, wherein percentage of the stored data in the data partition is determined according to an amount of corrected errors associated with the data partition or is predetermined.

Abstract: A method of sorting a multi-bit per cell non-volatile memory includes programming and reading to test an n-bit-per-cell (n-bpc) non-volatile memory, which has a plurality of m-bpc pages, where m is a positive integer from 1 through n. If the m-bpc page fails the test, counting a block associated with the failed m-bpc page to (m-1)-bpc blocks, wherein each said m-bpc page is subjected to at most one time of programming and reading. When m is equal to 1, the 0-bpc block corresponds to a bad block.

Abstract: A program method for a non-volatile memory is disclosed. At least two blocks in the non-volatile memory are configured as 1-bit per cell (1-bpc) blocks. The data of the configured blocks are read and written to a target block in such a way that the data of each said configured block are moved to pages of a same significant bit. In another embodiment, the data of the configured blocks excluding one block are read and written to the excluded block.

Abstract: A method and system for adaptively finding reference voltages for reading data from a multi-level cell (MLC) flash memory is disclosed. According to one embodiment, a first total number of cells of the flash memory above a first threshold voltage in a shifted threshold voltage distribution is provided. Search to find a second threshold voltage such that a second total number of the cells above the second threshold voltage is approximate to the first total number. An initial reference voltage or voltages of the initial threshold voltage distribution are shifted with an amount approximate to a voltage difference between the second threshold voltage and the first threshold voltage, thereby resulting in a new reference voltage or voltages for reading the data from the MLC flash memory.

Abstract: A method of programming a multi-bit per cell non-volatile memory is disclosed. In one embodiment, the non-volatile memory is read to obtain a first data of a most-significant-bit (MSB) page on a current word line that succeeds in data reading, wherein the current word line follows a preceding word line on which data reading fails. At least one reference voltage is set. The MSB page on the current word line is secondly programmed with a second data according to the reference voltage, the second data being different from the first data.

Abstract: The present invention is directed to a memory device with protection capability and a method of accessing data therein. A spreader encrypts input user data according to an entered password, and the encrypted data is then stored in a storage area. A despreader performs reverse process of the spreader on the stored data according to the entered password.

Abstract: A method of reducing coupling effect in a flash memory is disclosed. A neighboring page is read, and a flag is set active if the neighboring page is an interfering page. Data are read from the neighboring page at least two more times using at least two distinct read voltages respectively. The threshold-voltage distributions associated with an original page and the neighboring page are transferred according to the read data and the flag.

Abstract: A uniform coding system for a flash memory is disclosed. A statistic decision unit determines a coding word according to a plurality of inputs. An inverse unit controllably inverts input data to be encoded. The input data are then encoded into encoded data according to a statistic determined by the statistic decision unit.

Abstract: A method and system of finding a read voltage for a flash memory is disclosed. Data are read from array cells of the flash memory with a default read voltage, and a recorded state bit number that is recorded during programming is also read. Determine an optimal read voltage if the readout data do not pass the error correction control (ECC). Data are then re-read from the array cells of the flash memory with the determined optimal read voltage.

Abstract: The present invention is directed to a memory device with protection capability and a method of accessing data therein. A spreader encrypts input user data according to an entered password, and the encrypted data is then stored in a storage area. A despreader performs reverse process of the spreader on the stored data according to the entered password.

Abstract: A uniform coding system for a flash memory is disclosed. A statistic decision unit determines a coding word according to a plurality of inputs. An inverse unit controllably inverts input data to be encoded. The input data are then encoded into encoded data according to a statistic determined by the statistic decision unit.