Patents by Inventor Han Yong Ban

Han Yong Ban has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12078531
    Abstract: An illustrative calibration member made from a material that scatters light may be used to perform a calibration operation with respect to an optical measurement device having a plurality of light sources and a plurality of detectors distributed among a plurality of modules. The calibration member may form an exterior surface configured to support the optical measurement device and scatter photons of light emitted by the optical measurement device. The calibration operation may be performed based on arrival times of the scattered photons detected by the optical measurement device.
    Type: Grant
    Filed: April 26, 2022
    Date of Patent: September 3, 2024
    Assignee: HI LLC
    Inventors: Michael Henninger, Isai Olvera, Han Yong Ban, Ryan Field
  • Publication number: 20240164646
    Abstract: An illustrative optical measurement system may include a module comprising a light source configured to emit light directed at a target, a plurality of detectors configured to detect target photon arrival times of target photons of the light after the light is scattered by the target, and a reference detector configured to detect reference photon arrival times of reference photons of the light after the light is reflected within the module. The system may further include a controller configured to determine, based on an output from the reference detector, an instrument response function (IRF) of the module.
    Type: Application
    Filed: November 16, 2023
    Publication date: May 23, 2024
    Inventors: Isai Olvera, Han Yong Ban, Dakota Blue Decker, Yaroslav Chekin, Joshua Schmidt, Ryan Field
  • Publication number: 20230035935
    Abstract: An illustrative calibration member made from a material that scatters light may be used to perform a calibration operation with respect to an optical measurement device having a plurality of light sources and a plurality of detectors distributed among a plurality of modules. The calibration member may form an exterior surface configured to support the optical measurement device and scatter photons of light emitted by the optical measurement device. The calibration operation may be performed based on arrival times of the scattered photons detected by the optical measurement device.
    Type: Application
    Filed: April 26, 2022
    Publication date: February 2, 2023
    Inventors: Michael Henninger, Isai Olvera, Han Yong Ban, Ryan Field
  • Publication number: 20220273212
    Abstract: An illustrative optical measurement system includes a light source configured to emit light directed at a target. The system further includes a detector configured to detect arrival times for photons of the light after the light is scattered by the target. The system further includes a temperature sensor configured to output a temperature signal representative of a temperature of the light source. The system further includes an optical sensor configured to output a power signal representative of an optical power level of the light emitted by the light source. The system further includes a driver circuit configured to output, based on the temperature signal and the power signal, an input current for the light source.
    Type: Application
    Filed: February 10, 2022
    Publication date: September 1, 2022
    Inventors: Alex Borisevich, Ryan Field, Han Yong Ban
  • Publication number: 20220265174
    Abstract: An illustrative optical measurement device includes a light source configured to emit light pulses directed at a target of a user. The optical measurement device further includes a detector configured to detect arrival times for photons of the light pulses after the photons are scattered by the target. The optical measurement device further includes a processing unit configured to determine, while the optical measurement device is being worn by the user, an instrument response function (IRF) associated with the optical measurement device. The processing unit is further configured to generate, based on the arrival times of the photons at the detector, histogram data associated with the target. The processing unit is further configured to determine, based on the IRF and the histogram data, a property of the target.
    Type: Application
    Filed: February 7, 2022
    Publication date: August 25, 2022
    Inventors: Michael Henninger, Ryan Field, Han Yong Ban