Abstract: An electronic system test method, comprising: (a)inputting a victim test pattern to a victim signal path of a target electronic system and simultaneously inputting at least one aggressor test pattern to at least one aggressor signal path of the target electronic system, according to a major set of test patterns comprising a plurality of minor set of test patterns; (b)acquiring a output response corresponding to the step (a); and (c)after changing the victim test pattern or the aggressor test pattern, and after repeating the step (a) and the step (b) until all of the major test patterns set are used thereby acquiring a plurality of the output responses, determining a combination level according to the output responses. The victim test pattern is an X bit pattern and the aggressor test pattern is a Y bit pattern, X and Y are positive integers larger than or equal to 3.

Abstract: A tunable filter includes a first circuit and a second circuit. In both of them, the first inductor and the second inductor are connected in serial, and further connected with the first capacitor in parallel. The first end of the second capacitor is connected between the first inductor and the second inductor, and the second end of the second capacitor is grounded. The first end of the first capacitor of the first circuit is coupled to the input end of the tunable filter through a first coupling capacitor. The second end of the first capacitor of the first circuit is coupled to the first end of the first capacitor of the second circuit through a second coupling capacitor. The second end of the first capacitor of the second circuit is coupled to the output end of the tunable filter through a third coupling capacitor.

Abstract: A tunable filter includes a first circuit and a second circuit. In both of them, the first inductor and the second inductor are connected in serial, and further connected with the first capacitor in parallel. The first end of the second capacitor is connected between the first inductor and the second inductor, and the second end of the second capacitor is grounded. The first end of the first capacitor of the first circuit is coupled to the input end of the tunable filter through a first coupling capacitor. The second end of the first capacitor of the first circuit is coupled to the first end of the first capacitor of the second circuit through a second coupling capacitor. The second end of the first capacitor of the second circuit is coupled to the output end of the tunable filter through a third coupling capacitor.

Abstract: A holder is devised for holding a workpiece to be electroplated. The holder includes a shell, a cover and a conducting element. The shell includes pins and least one holding region. The pins extend from the shell. The holding region includes upper and lower abutting elements for abutting upper and lower edges of the workpiece when the holding region receives the workpiece. The cover includes pin-receiving apertures and at least one pair of branch-receiving apertures. The pin-receiving apertures receive the pins to align the cover with the shell. The conducting element includes a stem and at least one pair of branches extending from the stem. The stem is attached to the cover. The pair of branches contacts the workpiece through the pair of branch-receiving apertures.