Patents by Inventor Hang-Dony Kuan

Hang-Dony Kuan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • IC testing apparatus and methods
    Publication number: 20050205865
    Abstract: Methods, devices, and systems of the invention provide improved semiconductor device testing with firm tester-to-device interface and increased contact area. A test probe (24, 58) associated with ATE (18) is configured to substantially correspond to a probe receptacle (38) of a test board (16) or semiconductor device (10). Upon insertion of the test probe (24, 58) into the probe receptacle (38), areas of staunch electrical contact (34) between the probe receptacle (38) and probe (24, 58) facilitate measuring an electrical signal.
    Type: Application
    Filed: March 19, 2004
    Publication date: September 22, 2005
    Inventors: Hang-Dony Kuan, Yingsheng Tung