Abstract: A coated aerogel, and corresponding method, includes an aerogel and a polymer coating on at least a portion of a surface of the aerogel. The coated aerogel further includes a second coating on at least a portion of a surface of the polymer coating. The second coating can be electrically conductive and/or patterned.

Abstract: Aerogel can be coated with a polymerizable resin, which cures to form a polymer-coated aerogel. The coated aerogels can be used structural or thermal insulating component, such as in analytical and scientific devices. Coated aerogels can be further coated with conductive material, a semi-conductive material, a non-conductive material, a resistive material, or a combination thereof.

Abstract: A sampling apparatus includes a wand extension coupled with a trace detection head and a bulk detection head. The trace detection head collects a maximum amount of a sample for a trace detection analysis. The bulk detection head collects a minimal amount of a substance for use in bulk sample identification.

Abstract: The present disclosure is directed to methods and systems for detecting a substance of interest. The methods and systems include collecting the substance of interest on a collection device comprising an inert fiber material and a siloxane resin. The systems and methods further include heating the collection device in a desorber, wherein heating the device releases the substance of interest from the device, performing an analysis of the substance of interest, and detecting the substance of interest.

Abstract: Aerogel can be coated with a polymerizable resin, which cures to form a polymer-coated aerogel. The coated aerogels can be used structural or thermal insulating component, such as in analytical and scientific devices. Coated aerogels can be further coated with conductive material, a semi-conductive material, a non-conductive material, a resistive material, or a combination thereof.

Abstract: The present disclosure is directed to methods and systems for detecting a substance of interest. The methods and systems include collecting the substance of interest on a collection device comprising an inert fiber material and a siloxane resin. The systems and methods further include heating the collection device in a desorber, wherein heating the device releases the substance of interest from the device, performing an analysis of the substance of interest, and detecting the substance of interest.

Abstract: The present disclosure is directed to methods and systems for detecting a substance of interest. The methods and systems include modifying a dopant precursor to release a dopant, and contacting the dopant with the substance of interest. The systems and methods further include performing an analysis of the substance of interest and detecting the substance of interest.

Abstract: The present disclosure is directed to methods and systems for creating a gas curtain inlet for a detector of a substance of interest. The methods and systems include introducing a carrier gas into an inlet to block out atmospheric air without having to make the inlet a sealed system.

Abstract: The present disclosure is directed to the ability to use dopant-assisted photoionization to detect substances of interest. Various dopants can be used through the disclosed methods and processes to detect substances such as, for example, explosives, narcotics, illicit substances and the like.

Abstract: The present disclosure is directed to methods and systems for creating a gas curtain inlet for a detector of a substance of interest. The methods and systems include introducing a carrier gas into an inlet to block out atmospheric air without having to make the inlet a sealed system.

Abstract: A method for testing memory devices under test (DUTs) using automated test equipment (ATE) is presented. The method comprises retrieving a portion of raw test data from a memory device under test (DUT). It also comprises comparing the portion of raw test data with expected test data to determine failure information, wherein the failure information comprises information regarding failing bits generated by the memory DUT. Next, the method comprises utilizing paging to transfer data comprising the failure information to a filtering module and filtering out the failure information from transferred data using the filtering module. Further, it comprises updating a fail list using the failure information, wherein the fail list comprises address information for respective failing bits within the memory DUT. Finally, it comprises repeating all the prior steps for the next block of raw test data.

Abstract: A method for testing memory devices under test (DUTs) using automated test equipment (ATE) is presented. The method comprises retrieving a portion of raw test data from a memory device under test (DUT). It also comprises comparing the portion of raw test data with expected test data to determine failure information, wherein the failure information comprises information regarding failing bits generated by the memory DUT. Next, the method comprises utilizing paging to transfer data comprising the failure information to a filtering module and filtering out the failure information from transferred data using the filtering module. Further, it comprises updating a fail list using the failure information, wherein the fail list comprises address information for respective failing bits within the memory DUT. Finally, it comprises repeating all the prior steps for the next block of raw test data.