Abstract: An exemplary system for generating an image(s) of a sample(s) can include, for example, an imaging arrangement that can include a superluminescent diode (SLD) configured to generate a radiation(s) to be provided to the sample(s), and a spectrometer configured to (i) sample an A-line sampling rate of at least about 200 kHz, (ii) receive a resultant radiation from the sample(s) based on the sampling rate, and (iii) generate information based on the resultant radiation, and a computer hardware arrangement configured to generate the image(s) of the sample(s) based on the information received from the spectrometer. The imaging arrangement can be an interferometric imaging arrangement, which can be an optical coherence tomography imaging (OCT) arrangement. The computer hardware arrangement can be further configured to facilitate a plurality of b-scan acquisitions of the sample(s) and facilitate the b-scan acquisitions in order to generate the image(s).

Abstract: An exemplary system for generating an image(s) of a sample(s) can include, for example, an imaging arrangement that can include a superluminescent diode (SLD) configured to generate a radiation(s) to be provided to the sample(s), and a spectrometer configured to (i) sample an A-line sampling rate of at least about 200kHz, (ii) receive a resultant radiation from the sample(s) based on the sampling rate, and (iii) generate information based on the resultant radiation, and a computer hardware arrangement configured to generate the image(s) of the sample(s) based on the information received from the spectrometer. The imaging arrangement can be an interferometric imaging arrangement, which can be an optical coherence tomography imaging (OCT) arrangement. The computer hardware arrangement can be further configured to facilitate a plurality of b-scan acquisitions of the sample(s) and facilitate the b-scan acquisitions in order to generate the image(s).